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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   248208 Applied Materials   Applied Materials   G3 Lite  Scanning Electron Microscopes in Inspection Equipment AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041 1   Singapore 204578 Orbotech   Orbotech   Ultra Discovery VM  Metrology Equipment - Other in Metrology Equipment AOI Orbotech Ultra Discovery VM: Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits High throughput and superior detection with minimal number of false calls Especially designed for inspection of the finest lines down to 10μm Quick set-up even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP TechnologyTM Push-to-Scan®: A ‘no set-up’ process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full ‘Step and Repeat’ functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed     1 24,906.67 Regensburg, Bavaria 209828 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology   1   Malta, New York 230317 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Optical Microscopes FEI, ExSolve CLM next Gen, 300mm, S/N 9923535: FEI, ExSolve CLM next Gen, 300mm, S/N 9923535 1   Malta, New York 230318 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Optical Microscopes FEI, ExSolve CLM next Gen, 300mm, S/N 9923609: FEI, ExSolve CLM next Gen, 300mm, S/N 9923609 1   Malta, New York 237745 HMI   HMI   eScan 500  Scanning Electron Microscopes in Inspection Equipment HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm 1   Malta, New York 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1   Malta, New York 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1   Malta, New York 237748 KLA-Tencor   KLA-Tencor   AMI2900  Wafer Inspection Microscopes in Optical Microscopes KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module   1   Malta, New York 205912 Matrix Corp   Matrix Corp   Matrix X3  Metrology Equipment - Other in Metrology Equipment Matrix X3 X-Ray System: high speed X-Ray system  1   Regensburg, Bavaria 238960 Rudolph Technologies   Rudolph Technologies   MPC 200XCu  Film Thickness Testers - Other in Film Thickness Testers MP200: Rudolph MetaPulse 200 non copper / double delay stage with 5" Chuck.  2 Loadports for 6/8 inch Laser is broken! 1   Villach, Carinthia 244540 Rudolph Technologies   Rudolph Technologies   MP200  Film Thickness Testers - Other in Film Thickness Testers MP200 double path tool : non copper tool; double path tool delay stage; 6 inch chuck 1   Villach, Carinthia 241510 NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  Other Items in Microscopes NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 1   Malta, New York 245895 RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa  RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa  Other Items in Microscopes RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa: RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER 1   Burlington, Vermont 245894 RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra  RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra  Other Items in Microscopes RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra: RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner 1   Burlington, Vermont 244539 KLA Tencor   KLA Tencor   UV1250SE  UV-Visible Spectrophotometers in Spectrophotometers 1   Villach, Carinthia 244284 Zeiss   Zeiss   Merlin  Scanning Electron Microscopes in Inspection Equipment ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope: ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope   1   Malta, New York

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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Items from the following manufacturers are offered under Metrology Equipment: Applied Materials, Inc., FEI, HMI, HSEB, KLA Tencor, KLA-Tencor, Matrix Corp, Orbotech, Rudolph Technologies, Inc., Zeiss