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Item IDItem DescriptionMakeModelDescription#PriceNotes Location
$
189211 HMI, eScan 320, 300mm, ebeam InspectionHermes MicroviseScan 320e-beam defect inspection and review system1 F*Malta, New York
179749 MULTIPROBE APF II, Atomic Force Probe, 300mm MultiprobeAPF IIAFP1 Dresden, SN
179748 MULTIPROBE MP1, Atomic Force Prober (AFP), 300mmMultiprobeMP1Atomic Force Prober (AFP)1 F*Dresden, SN
182307 Suss Microtec BA300-MIT, 300mm Automated Inspection ToolSuss MicroTec BA300-MIT1 F*Fishkill, New York
191172 VEECO (Bruker Nano), X-1D, AFM, 300mmVeecoX-1D ATOMIC FORCE MICROSCOPE (AFM)1 Dresden, Saxony
191173 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-3D AFMAtomic Force Microscope (AFM)1 Dresden, Saxony
191174 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-D3 AFMAtomic Force Microscope (AFM)1 F*N*Dresden, Saxony

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  F* if the item is specially featured
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Items from the following manufacturers are offered under Other Items:
Suss MicroTec