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Item IDItem DescriptionMakeModelDescription#PriceNotes Location
195987 Bruker, D8FABLINE, 300mm, X-Ray MetrologyBrukerD8FablineX-Ray Metrology 1 Singapore,
179749 MULTIPROBE APF II, Atomic Force Probe, 300mm MultiprobeAPF IIAFP 1 Dresden, SN
179748 MULTIPROBE MP1, Atomic Force Prober (AFP), 300mmMultiprobeMP1Atomic Force Prober (AFP) 1 F* Dresden, SN
182307 Suss Microtec BA300-MIT, 300mm Automated Inspection ToolSuss MicroTec BA300-MIT 1 F* Fishkill, New York
191172 VEECO (Bruker Nano), X-1D, AFM, 300mmVeecoX-1D ATOMIC FORCE MICROSCOPE (AFM) 1 Dresden, Saxony
191173 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-3D AFMAtomic Force Microscope (AFM) 1 Dresden, Saxony
191174 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-D3 AFMAtomic Force Microscope (AFM) 1 F* Dresden, Saxony

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Items from the following manufacturers are offered under Other Items:
Suss MicroTec