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Laboratory and Scientific Equipment


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Group Listings into sub-categories under Laboratory and Scientific EquipmentGroup Listings into sub-categories under Laboratory and Scientific Equipment

List all 22 product types under Laboratory and Scientific EquipmentList all 22 product types under Laboratory and Scientific Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

183772
Axcelis Technologies  

Axcelis Technologies  

Compact II  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Dresden, SN
Axcelis Compact II, 300mm, H2 Reflow Furnace, :
Axcelis Compact II, 300mm, H2 Reflow Furnace,

C4 Processing.

Tool ID: OVN222

Serial Number :  H08046
182308
BTU  

BTU  

TCAS 181-8-81E36 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Fishkill, NY
BTU, Ovens / Furnaces, 300mm, Controlled Atmosphere Furnace:

BTU, Ovens / Furnaces, 300mm, Controlled Atmosphere Furnace

Status: Removed

Controlled Atmosphere Furnace

Precision controlled belt furnace for Flux-free Hydrogen wafer bump reflow with automated wafer handling for 300mm wafers

Controlled atmosphere belt furnace with temperature range up to 400°C and with various process atmospheres including hydrogen and nitrogen. Inline controlled atmosphere furnace the following applications:

  • Flux-free Hydrogen wafer bump reflow
  • Heat-treating
 
Standard Features
• 400°C maximum
temperature rating
• Air/Nitrogen/Hydrogen
capable
• FEC (fully enclosed coil)
heaters
formed into ceramic
insulation panels
• Water cooling
• Gas tight muffle
• Cross belt temperature of
±2°C for belt 
• Independent overtemperature
control in each zone
• WINCON™ Multi-Language
Control Software
• Closed loop belt speed control
• Atmosphere safety NFPA
86C compliant

Tool ID:  RFL01
190524
Fisher Sci  

Fisher Sci  

FD400 Binder Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore,
Fisher Scientific, FD400, Precision Binder, 200mm:
Fisher Scientific, FD400, Precision Binder, 200mm
194537
Fisher Sci  

Fisher Sci  

FD 720 Binder Precision Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   Singapore,
FISHER Scientific, FD720, Oven, 200mm:

FISHER Scientific, FD720, Oven, 200mm

FISHER Scientific, FD720, Precision Oven, 200mm

In the Fab
194540
Fisher Sci  

Fisher Sci  

FED720  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   Singapore,
FISHER Scientific, FED720, Oven, 200mm:

FISHER Scientific, FED720, Oven, 200mm

Precision Binder Oven

S/N : 00-08042

189084
Fisher Sci  

Fisher Sci  

FED 720 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   Singapore,
FISHER Scientific, FED720, Oven, 200mm:
FISHER Scientific, FED720, Oven, 200mm

In the Fab
178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




178710
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
178297
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
191596
Hitachi  

Hitachi  

S-4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM:
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F*N* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Cold Shutdown
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore,
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Laboratory and Scientific Equipment:
Axcelis Technologies GmbH, BTU, Fisher Scientific, Hitachi, JEOL, KLA-Tencor, SELA