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List all 33 product types under MicroscopesList all 33 product types under Microscopes


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

180207
Applied Materials In  

Applied Materials In  

Semvision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Applied Materials Semvision G3 300mm :
Applied Materials Semvision G3 300mm
189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
178291
AMAT  

AMAT  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

178410
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Ecomet-3000 Polisher, 300mm:
Status: Bagged and Skidded
178407
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, Ecomet-3000 300mm:
Status: Bagged and Skidded
178409
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, 300mm:
Status: Bagged and Skidded
191594
FEI  

FEI  

Tecnial TF-20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Burlington, Vermont
FEI Tecnai F20 FE-TEM, :
FEI Tecnai F20 FE-TEM, 

S/N: D241

Main Instrument:  Tecnai F20 S-Twin 
 
FEI Accessories
 
STEM system for FEG
Tecnai Extended Workstation
HAADF Detector
TIA Software
Scanned Image Technique
EDX Spectroscopy Technique
EFTEM Technique
Tecnai Function with Digital Micrograph
EFTEM EELS Module
Tecnai Macro Facility
Compustage Rotation Holder
Compustage Low Background Double-Tilt Holder
Hingeable Mount, Binoculars
Tecnai Smart Tilt
Tecnai Compucentricity
 
Third-Party Accessories
 
NEC 20-inch LCD Monitor
EDAX Digital Pulse Processor, TEM
Gatan 794 MSC Camera, 1K (BROKEN)
Energy Filter, GIF 2001, Grade A, 1K (BROKEN)
Tecnai K Space Control
EDAX RTEM SUTW Detector
Gatan Single Tilt Rotation Holder, Low Background
Gatan Double Tilt Rotation Holder
 
Also, the Compustage has been upgraded to the newer Tecnai Osiris type.
191756
FEI  

FEI  

Tecnia G2 30 S-TWIN 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F* East Fishkill, New York
FEI Tecnia G2 30 S-TWIN, TEM, 300KeV with LaB6 filament :
FEI Tecnia G2 30 S-TWIN: 300KeV LaB6 transmission electron microscope, volume imaging tool for semiconductor applications.  Also, can be used for biological samples.


Configuration :
  • CompuStage Single-tilt Holder   1ea. 
  • CompuStage Low-background Double-tilt Holder  2ea.
  • Gatan US1000 P (2k x 2k) Digital Camera on the microscope
  • Alignments for 300Kev and 200KeV but no alignments for 120KeV
  • Magnification Calibration Package  
  • Support PC
  • TEM Scripting  
  • LaB6 emitter (Denka / Mitsui)  
  • TMP and TMP Vacuum Software  





Cold idle in Lab.

2010 

S/N: 30TN6S / D906


FP 5032/20            Tecnai G2 30 S-TWIN

The Tecnai G2 30 S-TWIN is a 300 kV Transmission Electron Microscope. It is a high-resolution microscope, optimized for complete material characterization by combining analytical and imaging capabilities, and optimized tilt performance with ease of operation in all modes (TEM / STEM and analytical modes).

 

The Tecnai G2 TEM’s are equipped with the most advanced operating system currently available in the market of TEM systems, i.e. the Windows XP operating system. In the unique Tecnai concept, all microscope components, like the electron gun, the optical elements, the vacuum system and the stage, are completely digitally controlled. The task-oriented user interface allows users to automatically recall all optimized operating conditions including lens settings, gun parameters, optical alignments, aperture alignments (optional) for all the different techniques such as TEM, STEM, CBED, Diffraction and Analysis. Likewise, all detectors, such as CCD cameras, STEM detectors, EDS detectors and EELS detectors are computer controlled. Data acquisition, using these detectors, is embedded in the Tecnai G2 user interface and can be automated for acquisition processes, like tomography and spectrum imaging. Because of this sophisticated computer system, Tecnai G2 is especially suited for multi-user and multi-discipline environments.

In addition, the Tecnai G2 systems are equipped with the industry standard, reliable and fast FireWire data transfer technology. The system can be equipped with a single or dual monitor set-up depending on the number of detectors on the system.

Tecnai G2 can easily be connected to a network for exporting data and is ready for remote operation capabilities allowing for operation from an adjacent room and remote viewing during data acquisition.



195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




178710
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
178297
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
191596
Hitachi  

Hitachi  

S-4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM:
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Cold Shutdown
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Singapore,
KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

178327
KLA-Tencor  

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
KLA-Tencor, INS3300 , Microscopes, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
194720
Leica  

Leica  

INS-3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
Leica, INS-3300, 300mm, Inspection Microscope:
Leica, INS-3300, 300mm, Inspection Microscope
192694
MASS-PCB  

MASS-PCB  

SV200WV 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Malta, New York
MASS-PCB, SV200WV, Abrasive Planarizations System:
MASS-PCB, SV200WV, Abrasive Planarizations System
192695
MASS-PCB  

MASS-PCB  

VHF300 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Malta, New York
MASS-PCB, VHF300, Vacuum Paste Applicator:
MASS-PCB, VHF300, Vacuum Paste Applicator
179749
MULTIPROBE APF II, Atomic Force Probe, 300mm  
MULTIPROBE APF II, Atomic Force Probe, 300mm  

List all items of this typeOther Items

in Microscopes

1   Dresden, SN
MULTIPROBE APF II, Atomic Force Probe, 300mm :
Multiprobe APF II, Atomic Force Probe
S/N: 012-062-012-022-014-048
5 Probe Heads,
3060 MPIII AFP Core 05/06/09 - 1ea
3020 MPII Head Group04/27/09  - 5ea
2715 MPIII Digital Control and Power Box04/27/09 - 1ea
218 AEK Enclosure Group04/27/09 - 1ea
1790 Scanning Capacitance04/27/09 - 1ea
3015 SemiAuto,Smpl/Optc04/27/09 - 1ea



179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, SN
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
tool for micro probing of transistors at contact level
3 Probe heads,
MP1-system with semiauto stage/optics
Comes with : 
electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads
Upgrades Include:
semiautomatic stage, optics & probe head control, 4th probe head




178325
Semicaps  

Semicaps  

SOM 3000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F* Taichung, Taichung City
Semicaps, SOM 3000 Scanning Optical Microscope, 300mm:
Status: Bagged and Skidded
192342
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
SEMVision G3, Applied Materials, 300mm, Defect Review System:
SEMVision G3, Applied Materials, 300mm, Defect Review System

Known Parts Missing:
qty. 1 MINIMODULE DENKA,TFE ( TIP)



S/N: W-3009

DOM : 5/1/2007
182307
Suss Microtec  

Suss Microtec  

 

List all items of this typeOther Items

in Microscopes

1   F* Fishkill, New York
Suss Microtec BA300-MIT, 300mm Automated Inspection Tool:
Suss Microtec 300mm Automated Inspection Tool, BA300-MIT

Automated inspection tool inspects glass plates 13" x 14" molds do determine filling

Tool ID: MIT01
191172
VEECO (Bruker Nano), X-1D, AFM, 300mm 
VEECO (Bruker Nano), X-1D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
VEECO (Bruker Nano), X-1D, AFM, 300mm:
VEECO (Bruker Nano), X-1D, AFM, 300mm

Warm idle, installed.

S/N: 122
191173
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Warm Idle

S/N: 146
191174
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Unhooked Park Position 

S/N: 123
195518
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Bagged & Skidded in warehouse.

S/N : 741361
185245
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
185288
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
191630
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741472
191631
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741567
186714
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Microscopes:
Applied Materials Inc., Applied Materials, Inc., Buehler, FEI, Hitachi, JEOL, KLA-Tencor, Leica, MASS-PCB, SELA, Semicaps, Suss MicroTec, Zeiss