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Metrology Equipment


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List all 58 product types under Metrology EquipmentList all 58 product types under Metrology Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
192337
Leica  

Leica  

E3610 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Advantest, E3610, MASK CD SEM,:
Advantest, E3610, MASK CD SEM,
Leica E3610 CD SEM

WAFER MASK CD SEM

S/N : 710005324

2006 Vintage

For Post 64nm Technology node

Front End Module
Fan filter unit (FFU)
SMIF Versa Port 
InSPEQ Bench module
Electric Frame
Vacuum pump unit 
Ozonizer Unit
Custom TMC active isolation pad for 24" raised floor
179175
Applied Materials  

Applied Materials  

Compass 200mm 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT Compass 200mm:

COMPASS PRO* – INCREASING SENSITIVITY AND THROUGHPUT

FOR 100NM CHALLENGES

Addressing the increasing need for higher sensitivity at

higher throughputs, the CompassPro introduces new features

targeted at grainy layers, complex devices such as combined

logic and memory, and more accurate die-to-die precision,

resolution and defect reporting. Additionally, CompassPro

optimizes performance on copper and low-k with predefined

recipes. CompassPro patterned wafer inspection

technology helps our customers to actively engineer high

yield in the shortest possible time. The “Pro-active”

approach provides an un-rivaled solution set for patterned

wafer inspection in the nanometer era.

163973
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL
163974
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL
163975
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   F* Regensburg, BY
AMAT COMPASS PRO 300mm:
Darkfield Defect Inspection
2x 300mm Load Ports Asyst SMIF-300FL
Tool already disassembled.
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

178410
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   Taichung, Taichung City
Buehler, Ecomet-3000 Polisher, 300mm:
Status: Bagged and Skidded
178407
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, Ecomet-3000 300mm:
Status: Bagged and Skidded
178409
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, 300mm:
Status: Bagged and Skidded
166465
Oxford Instruments  

Oxford Instruments  

CMI 950 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1   F* Regensburg, BY
CMI 950 - Xray fluorescence spectrometer:
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).

System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
191756
FEI  

FEI  

T30 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F*N* East Fishkill, New York
FEI T30, TEM, with LaB6 filament operating at 300KeV:
FEI T30, TEM, with LaB6 filament operating at 300KeV

Cold idle in Lab.

2010 

S/N: 30TN6S / D906


191594
FEI  

FEI  

Tecnial TF-20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Burlington, Vermont
FEI Tecnai F20 FE-TEM, :
FEI Tecnai F20 FE-TEM, 

S/N: D241

Main Instrument:  Tecnai F20 S-Twin 
 
FEI Accessories
 
STEM system for FEG
Tecnai Extended Workstation
HAADF Detector
TIA Software
Scanned Image Technique
EDX Spectroscopy Technique
EFTEM Technique
Tecnai Function with Digital Micrograph
EFTEM EELS Module
Tecnai Macro Facility
Compustage Rotation Holder
Compustage Low Background Double-Tilt Holder
Hingeable Mount, Binoculars
Tecnai Smart Tilt
Tecnai Compucentricity
 
Third-Party Accessories
 
NEC 20-inch LCD Monitor
EDAX Digital Pulse Processor, TEM
Gatan 794 MSC Camera, 1K (BROKEN)
Energy Filter, GIF 2001, Grade A, 1K (BROKEN)
Tecnai K Space Control
EDAX RTEM SUTW Detector
Gatan Single Tilt Rotation Holder, Low Background
Gatan Double Tilt Rotation Holder
 
Also, the Compustage has been upgraded to the newer Tecnai Osiris type.
178414
GEMETEC  

GEMETEC  

WSPS53 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F* Taichung, Taichung City
GEMETEC, Gas Analyzer, 300mm:
Status: Bagged and Skidded
178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




178710
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
178297
Hitachi  

Hitachi  

RS4000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Hitachi, RS4000 , Defect Review, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
191596
Hitachi  

Hitachi  

S-4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Burlington, Vermont
Hitachi, S-4500, SEM, Failure Analysis SEM:
Hitachi, S-4500, SEM, Failure Analysis SEM
Quartz PCI USB V9.5 (for Image Capture)
System is powered up and under vacuum.
Was under service contract through April 2017.


S/N: 7926-02


191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   N* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F*N* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
189211
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

1   F* Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection:
HMI, eScan 320, 300mm, ebeam Inspection
eScan 320 eBeam defect inspection and review system
Integrated front-end, Dual Pod 300mm FOUP 
2- High quality flat panel displays
GUI/Image computer XEON Dual CPU 3.2GHZ, 2GB Memory
Host computer Pentium IV 3.2 GHZ, 2GB Memory
DBDB (Detection, baseon Design Base) function
E-chuck wafer holder
Active Damping
TFE electron beam emission source sub-system
Electron=optice column sub-system
HV power sub-system
Programmable wafer biasing & charge balance control.
SE and BSE high speed detection 







Tool is still in the fab.
181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Dresden, SN
HSEB Axiospect 300, 300mm Wafer inspection microscope:
HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Cold Shutdown
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore,
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
137458
KLA-Tencor  

KLA-Tencor  

KLA AIT2 for 12" / 300 mm 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1   Regensburg, Bavaria
KLA AIT2/XP:
KLA AIT2
Equipment Code: MES313-02
Darkfield-Defectinspection AIT Fusion, 2Loadport, upgrad. 2004 to AIT XP


KLA AIT2
Serial Number: 9332
178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Singapore,
KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

178327
KLA-Tencor  

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
KLA-Tencor, INS3300 , Microscopes, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
189332
KLA-Tencor  

KLA-Tencor  

 

List all items of this typeOther Items

in Microscopes

1   Burlington, Vermont
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm:
KLA-Tencor, Ultrapointe CRS 1010-S

Serial Number: 20


194720
Leica  

Leica  

INS-3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   N* Taichung, Taichung City
Leica, INS-3300, 300mm, Inspection Microscope:
Leica, INS-3300, 300mm, Inspection Microscope
192694
MASS-PCB  

MASS-PCB  

SV200WV 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   N* Malta, New York
MASS-PCB, SV200WV, Abrasive Planarizations System:
MASS-PCB, SV200WV, Abrasive Planarizations System
192695
MASS-PCB  

MASS-PCB  

VHF300 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   N* Malta, New York
MASS-PCB, VHF300, Vacuum Paste Applicator:
MASS-PCB, VHF300, Vacuum Paste Applicator
179749
MULTIPROBE APF II, Atomic Force Probe, 300mm  
MULTIPROBE APF II, Atomic Force Probe, 300mm  

List all items of this typeOther Items

in Microscopes

1   Dresden, SN
MULTIPROBE APF II, Atomic Force Probe, 300mm :
Multiprobe APF II, Atomic Force Probe
S/N: 012-062-012-022-014-048
5 Probe Heads,
3060 MPIII AFP Core 05/06/09 - 1ea
3020 MPII Head Group04/27/09  - 5ea
2715 MPIII Digital Control and Power Box04/27/09 - 1ea
218 AEK Enclosure Group04/27/09 - 1ea
1790 Scanning Capacitance04/27/09 - 1ea
3015 SemiAuto,Smpl/Optc04/27/09 - 1ea



179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, SN
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
tool for micro probing of transistors at contact level
3 Probe heads,
MP1-system with semiauto stage/optics
Comes with : 
electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads
Upgrades Include:
semiautomatic stage, optics & probe head control, 4th probe head




192498
Perkin Elmer  

Perkin Elmer  

AANALYST 600 

List all items of this typeSpectrometers - Other

in Spectrometers

1   N* Malta, New York
Perkin Elmer, AANALYST 600, Atomic Absorption Spectrometer:
Perkin Elmer, AANALYST 600, Atomic Absorption Spectrometer
178325
Semicaps  

Semicaps  

SOM 3000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
Semicaps, SOM 3000 Scanning Optical Microscope, 300mm:
Status: Bagged and Skidded
190839
Semilab  

Semilab  

IR3100s 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F* Malta, New York
Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm:
Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm

Complete IR3100 small spot Model-Based IR to Near-IR
semiconductor metrology tool configured with a unique
all-optical method. The measurement is both non-contact
and non-destructive with rapid analysis of deep trenches
and other high aspect ratio structures on product wafers.

S/N: 3039s

178737
Sopra  

Sopra  

EP12 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F* East Fishkill, NY
Sopra EP12, 300mm, optical porosity measurement :
Dielectric Porosity measurment system.
182307
Suss Microtec  

Suss Microtec  

 

List all items of this typeOther Items

in Microscopes

1   F* Fishkill, New York
Suss Microtec BA300-MIT, 300mm Automated Inspection Tool:
Suss Microtec 300mm Automated Inspection Tool, BA300-MIT

Automated inspection tool inspects glass plates 13" x 14" molds do determine filling

Tool ID: MIT01
147760
Used Bruker Cryomagnet BZH 200/52 Magnet 
Used Bruker Cryomagnet BZH 200/52 Magnet 

List all items of this typeNuclear Magnetic Resonance Spectrometers

in Pharmaceutical Laboratory and Scientific Equipment

1   F* Dayton, OH
Used Bruker Cryomagnet BZH 200/52 Magnet:
Bruker Cryomagnet BZH 200/52 Magnet, dewar# D101/52/512, Field 4,70 Tesla, Coil# 782080E, Current 52.20.A
191172
VEECO (Bruker Nano), X-1D, AFM, 300mm 
VEECO (Bruker Nano), X-1D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   N* Dresden, Saxony
VEECO (Bruker Nano), X-1D, AFM, 300mm:
VEECO (Bruker Nano), X-1D, AFM, 300mm

Warm idle, installed.

S/N: 122
191173
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Warm Idle

S/N: 146
191174
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   F*N* Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Unhooked Park Position 

S/N: 123
191630
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741472
191631
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741567


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Metrology Equipment:
Applied Materials, Inc., Buehler, FEI, GEMETEC, Hitachi, HSEB, JEOL, KLA-Tencor, Leica, Leica, MASS-PCB, Oxford Instruments, Perkin Elmer, SELA, Semicaps, Semilab, Sopra, Suss MicroTec, Zeiss