|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
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248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Inspection Equipment
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
|
N* |
Singapore |
|
|
204578
|
Orbotech
|
Orbotech |
Ultra Discovery VM |
in Metrology Equipment
AOI Orbotech Ultra Discovery VM:Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits - High throughput and superior detection with minimal number of false calls
- Especially designed for inspection of the finest lines down to 10μm
- Quick set-up even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
SIP TechnologyTM Push-to-Scan®: - A ‘no set-up’ process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full ‘Step and Repeat’ functions
Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: - Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
|
1
|
|
24,906.67 |
|
Regensburg, Bavaria |
|
|
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
|
|
Malta, New York |
|
|
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Optical Microscopes
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
|
|
Malta, New York |
|
|
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Optical Microscopes
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
|
|
Malta, New York |
|
|
248238
|
Hitachi
|
Hitachi |
CG4100 |
in Optical Microscopes
|
1
|
|
|
N* |
East Fishkill, New York |
|
|
237745
|
HMI
|
HMI |
eScan 500 |
in Inspection Equipment
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
|
|
Malta, New York |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
|
|
Malta, New York |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
|
|
Malta, New York |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Optical Microscopes
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
|
|
Malta, New York |
|
|
205912
|
Matrix Corp
|
Matrix Corp |
Matrix X3 |
in Metrology Equipment
Matrix X3 X-Ray System:high speed X-Ray system
|
1
|
|
|
|
Regensburg, Bavaria |
|
|
238960
|
Rudolph Technologies
|
Rudolph Technologies |
MPC 200XCu |
in Film Thickness Testers
MP200:Rudolph MetaPulse 200 non copper / double delay stage with 5" Chuck. 2 Loadports for 6/8 inch Laser is broken!
|
1
|
|
|
|
Villach, Carinthia |
|
|
244540
|
Rudolph Technologies
|
Rudolph Technologies |
MP200 |
in Film Thickness Testers
MP200 double path tool :non copper tool; double path tool delay stage; 6 inch chuck
|
1
|
|
|
|
Villach, Carinthia |
|
|
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
|
|
Malta, New York |
|
|
245895
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa |
in Microscopes
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa:RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER
|
1
|
|
|
|
Burlington, Vermont |
|
|
245894
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra |
in Microscopes
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra:RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner
|
1
|
|
|
|
Burlington, Vermont |
|
|
244539
|
KLA Tencor
|
KLA Tencor |
UV1250SE |
in Spectrophotometers
|
1
|
|
|
|
Villach, Carinthia |
|
|
244284
|
Zeiss
|
Zeiss |
Merlin |
in Inspection Equipment
ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope:ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope
|
1
|
|
|
|
Malta, New York |
|
|
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