AFM-2 (METV44-1)
Atomic Force Microscope (AFM)An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.
1 unit @ Best Price
MAKE: Veeco
MODEL: AFM-2 (METV44-1)
CATEGORY: Other Wafer Manufacturing Metrology Equipment
SELLER: Infineon
Villach, Österreich
SPECS
| Manufacturer | Veeco |
| Model | AFM-2 (METV44-1) |
| Description | Atomic Force Microscope (AFM) |
| Wafer Size Range | |
| Minimum | 200 mm |
| Maximum | 300 mm |
| Set Size | 300 mm |
| Power Requirements | 6.0 A |
| Year of Manufacture | 2004 |
| Condition | Very Good |
S&H
All items are sold on condition `as is and where is`. Ex work from current location excluding de-installation, de-hook up, discharge, packaging, crating and delivery. We are not responsible for any damage incurred during shipment.
Payment
100% downpayment