Other Test & Measurement
POLYTEC LASER VIBROMETER UP TO 2.5MHZ
Non-Contact Vibration Analysis
Measurement and weighing equipment are essential tools for ensuring accuracy and consistency in industrial settings. These devices provide precise readings that are crucial for quality control and compliance.
Other Test & Measurement
Non-Contact Vibration Analysis
Other Test & Measurement
Impedance Gain Phase Analyzer
Other Test & Measurement
Precision Shunt
Other Test & Measurement
Dielectric Interface
Other Test & Measurement
200mm THIN WAFER Loader NSX
“NIDEC SANKYO Corporation” , Model: “SR8220-019”, SN. „FR00891253“
Other Test & Measurement
Universal Battery Tester
Other Test & Measurement
Universal Battery TesterRepresentative Photo
Other Test & Measurement
eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This system provides comprehensive, high-resolution inspection of both masks and wafers with unparalleled accuracy. The unit uses a proprietary optical probe to scan masks and wafers to detect defects and irregularities with a resolution reaching down to 1 micron. This high-precision scanning allows for comprehensive inspection of the entire surface of both the mask and wafer. The machine also includes powerful image processing and analysis algorithms which automatically detect defects, categorize them, and track their locations. KLA eS32 also includes a suite of automated defect correction tools which can rapidly repair standard and complex defects. In addition to its exhaustive defect detection capabilities, this tool also allows for statistical process control (SPC) analysis to ensure production processes maintain consistent quality and accuracy over time. TENCOR ES 32 also includes a user-friendly interface that makes it easy to operate and manage the asset. This user interface is highly customizable, allowing users to quickly change model settings, view detailed inspection reports, and receive real-time notifications of detected defects. In summary, KLA ES 32 is a high-performance mask and wafer inspection equipment that offers superior detection accuracy, automated defect correction, comprehensive statistical process control (SPC) analysis, and an easy-to-use user interface. This system can be used to monitor production lines, resulting in improved manufacturing quality, increased yield, and cost savings.
Other Test & Measurement
Battery Tester
Other Test & Measurement
Other Test & Measurement
Other Test & Measurement
Bolometer