4 & 6 Point Probes
CDE ResMap 463-FOUP Resistivity Mapping Tool
CDE ResMap 463-FOUP Resistivity Mapping Tool
- For 300mm & 200mm Wafers
- Automatic Probe Head Selection
- Please Inquire for Additional Details
Wafer testing equipment is vital for evaluating the electrical properties of semiconductor wafers. It ensures high performance and reliability in semiconductor manufacturing.