Unpatterned Wafer Inspection

Unpatterned wafer inspection equipment is critical for detecting defects in semiconductor wafers before patterning. This ensures high yield and quality in semiconductor manufacturing processes.

  1. Tencor Surfscan 4500

    Unpatterned Wafer Inspection

    Tencor Surfscan 4500

    TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool

    • Cassette to Cassette Handling of 3” – 6” Wafers
    • New HeNe 2mW Laser, 632.8 nm Wavelength
    • New HeNe Laser Power Supply
    • 2 µ Particle Size Sensitivity
    • Automatic Calibration
    • Flatscreen Monitor
    • System Calibrated & Demonstrated
    • Calibration Standard Wafer Included
  2. Takano WM-7S Unpatterned Wafer Surface Inspection Tool

    Unpatterned Wafer Inspection

    Takano WM-7S Unpatterned Wafer Surface Inspection Tool

    Takano WM-7S Unpatterned Wafer Surface Inspection Tool

    • 405 nm Laser Source
    • Particle Detection Down to 79 nm 
    • Configured for 200mm Wafers
    • Manufactured in 2023
    • Unused Since Installation/Qualification  
  3. KLA-TENCOR Puma 9130 Darkfield Inspection Tool

    Unpatterned Wafer Inspection

    KLA-TENCOR Puma 9130 Darkfield Inspection Tool

    KLA-TENCOR Puma 9130 Darkfield Inspection Tool

    • Parts Tool
    • Please Inquire for Additional Details
  4. KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

    Unpatterned Wafer Inspection

    KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

    KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

    • For 200mm or 300mm Wafers
    • 2ea Cameras
    • Please Inquire for Additional Details
  5. Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool

    Unpatterned Wafer Inspection

    Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool

    Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool

  6. GCA/TROPEL 9000

    Unpatterned Wafer Inspection

    GCA/TROPEL 9000

    Surface Flatness Analyzer

Common Applications

semiconductor manufacturing

yield improvement

quality control

research and development

defect analysis

fabrication process monitoring

Buying Guide

Unpatterned Wafer Inspection Buying Considerations

  • Evaluate the resolution and detection capabilities required for your wafer sizes and defect types.
  • Consider system compatibility with existing process lines to ensure smooth integration.
  • Assess whether the equipment can handle the throughput demands of your production volume.
  • Review maintenance and calibration requirements to minimize downtime.
  • Verify that the technology used aligns with your defect detection methodologies, such as optical or laser-based systems.

Frequently Asked Questions

What is unpatterned wafer inspection?
Unpatterned wafer inspection involves examining semiconductor wafers for defects or irregularities before any pattern is applied.
Why is unpatterned wafer inspection important?
It helps in identifying defects early in the manufacturing process, ensuring high yield and quality control.
What tools are used for unpatterned wafer inspection?
Tools such as optical inspection systems and laser-based technologies are commonly used.
Can surplus equipment be effective for unpatterned wafer inspection?
Yes, surplus equipment can provide cost-effective solutions without compromising on quality and accuracy.