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Critical Dimension Scanning Electron Microscopes

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Item IDItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNotes Location
MakeModelSet SizeMinMax
207937 Advantest E3630 1 Burlington, Vermont
210024 Applied Materials NanoSEM 3D 1 Burlington, Vermont
180474 Applied Materials NanoSEM 3D300 mm 1 F* East Fishkill, New York
180514 Applied Materials NanoSEM 3D300 mm 1 F* East Fishkill, New York
213282 Applied Materials NanoSEM 3D 1 Singapore
213283 Applied Materials NanoSEM 3D 1 Singapore
213284 Applied Materials NanoSEM 3D 1 Singapore
201207 Applied Materials SemVision CX 1 Burlington, Vermont
210234 Hitachi 9380 1 Singapore
210256 Hitachi S-9380 1 Singapore
210257 Hitachi S-9380 1 Singapore
210258 Hitachi S-9380 1 Singapore
210259 Hitachi S-9380 1 Singapore
213185 Hitachi S-9380 1 Singapore
213286 Hitachi S-9380 1 Singapore
213351 Hitachi S-9380 1 Singapore
213352 Hitachi S-9380 1 Singapore
213353 Hitachi S-9380 1 Singapore
201534 Hitachi S-9380 II 1 Taichung, Taichung City
213300 Hitachi S-9380II 1 Singapore

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  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Critical Dimension Scanning Electron Microscopes:
Advantest, Applied Materials, Inc., Hitachi