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ALL CATEGORIES   Scientific & Lab Eq   Inspection Equipment   Optical Inspctn Eqpt    View    Search-by-Specs   
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Item IDItem DescriptionDescriptionAperture SizeFocal LengthCondition#PriceNotes Location
»in  cm(mm)$
191547 FSM FSM 128 1 Singapore
180206 KLA-Tencor AIT XUV300mm Pattern Wafer laser scanning defect inspect 1 Taichung, Taichung City
195493 KLA-Tencor SCDSpectroscopic Critical Dimension Metrology 1 Malta, New York
195494 KLA-Tencor SCDSpectroscopic Critical Dimension MetrologyExcellent 1 Malta, New York
185268 KLA-Tencor UV 1050Film thickness metrology 1 Singapore

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Items from the following manufacturers are offered under Interferometers:
FSM, KLA-Tencor