Nanometrics 8300XSE Film Thickness Analyzer
Nanometrics 8300XSE Film Thickness Analyzer
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- Manual Loading of up to 300mm Wafers
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- Please Inquire for Additional Details
1 unit @ Best Price
MAKE: Nanometrics
MODEL: 8300XSE
CATEGORY: Ellipsometers
SELLER: Catalyst Equipmt Co
Austin, TX US
SPECS
| Manufacturer | Nanometrics |
| Model | 8300XSE |
| Wafer Size Range | |
| Minimum | 200 mm |
| Maximum | 300 mm |
| Set Size | 300 mm |
| Illumination Source Type | Multi-wavelength Source |
| Multi-Layer Film Capacity | YES |
| Micro Spot Optics | YES |
| Scanning Stage | YES |
| Wafer Mapping | YES |
| Controller Type | PC Controller Type |
| Condition | Excellent |
| Power Requirements | 115 V 15.0 A 50/60 Hz 1 Phase |
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