Manufacturer: Nanometrics

  1. NANOMETRICS CRITICAL DIMENSION COMPUTER

    Optical CD Measurement

    NANOMETRICS CRITICAL DIMENSION COMPUTER

    Critical Dimension Computer Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.

  2. Nanometrics ECV Pro UV Electrochemical CV Profiler

    Other Metrology Equipment

    Nanometrics ECV Pro UV Electrochemical CV Profiler

    Nanometrics ECVPro Carrier Concentration Profiler

    • For Si, SiC, II-VI, III-V & III-Nitrides 
    • Hamamatsu LC8 UV Light Source
    • ECVision In-Situ Camera System
    • Dual Frequency Measurement
    • Carrier Frequency: 0.3kHz to 50kHz
    • Depth Range: 0.05μm to 50μm
    • Depth Resolution: 1nm 
    • Dell PC, Windows 8 OS, ECV Pro SW Version 2.4.6.0

           Installation & Training Available

  3. Nanometrics 8300XSE Film Thickness Analyzer

    Ellipsometers

    Nanometrics 8300XSE Film Thickness Analyzer

    Nanometrics 8300XSE Film Thickness Analyzer

    • J.A. Woollam M-44 Spectroscopic Ellipsometer
    • J.A. Woollam EC-270 Ellipsometer Controller
    • J.A. Woollam LPS-420 Xenon Light Source
    • Manual Loading of up to 300mm Wafers
    • Yaskawa ERCR-NS01-B004 Motion Controller
    • Please Inquire for Additional Details