Metrology & Inspection Tools

Metrology and inspection tools are essential for accurate measurement and quality control in various industries. They support high precision and reliability, ensuring product specifications and compliance are met.

  6. DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Other Metrology Equipment

    DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Atomic Force Microscope AFMScanning Probe Microscope SPM

    Stage size: 300mm

    Accessories:

    • Stage Controller: NanoScope Model 5000C-1
    • Scanning Probe Microscope Controller: NanoScope IIIA
    • Vibration Isolation Table and Acoustic Enclosure

    Make: Digital Instruments

    Model: Nanoscope IIIA

    1 unit @ Best Price

    Scotia, NY US

    Item 106265

  9. AOI Orbotech Ultra Discovery VM

    Other Metrology Equipment

    AOI Orbotech Ultra Discovery VM

    Simple, Intelligent, Powerful

    Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production.

    Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time.

    Benefits

    • High throughput and superior detection with minimal number of false calls
    • Especially designed for inspection of the finest lines down to 10μm
    • Quick set-up even for the most complicated jobs for higher productivity
    • Automation ready
    • Very high uptime

    • SIP TechnologyTM

      Push-to-Scan®:

      • A ‘no set-up’ process
      • Top AOI results with minimal effort or training
      • The easiest, user-friendly interface (GUI)
      • Full ‘Step and Repeat’ functions

        Visual Intelligence:

        Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want.

        Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects.

        Visual Intelligence:

        • Full panel understanding, context-based detection engine
        • Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
  11. KLA-Tencor ASET-F5x Thin Film Measurement System

    Other Film Thickness Testers

    KLA-Tencor ASET-F5x Thin Film Measurement System

    KLA-TENCOR ASET-F5x Thin Film Measurement System

    • Serial Number 0202802R
    • Manufactured in June, 2002
    • Inspection Modes Include:
      • Dual Beam Spectrometry
      • Spectroscopic Ellipsometry
      • Film Stress Analysis
      • SUMMIT™ Application Software Version 3.21.16
      • FTML Version 3.46.06
      • Model 300DFF1P Wafer Loading Platform
        • Dual Loadports for 300mm Wafers
        • Three Axis Wafer Handling Robot
        • GEM / SECS Communication
        • Inquire for Additional Details

Common Applications

quality control

product inspection

dimensional analysis

calibration

surface measurement

reverse engineering

Buying Guide

Metrology & Inspection Tools Buying Considerations

  • Evaluate the measurement range and resolution required for your application.
  • Consider the environmental conditions where the tools will be used to ensure durability and accuracy.
  • Review the calibration process and frequency to maintain precision.
  • Look for product reviews and third-party endorsements for reliability insights.
  • Consider the compatibility of software and interfaces for data integration and analysis.

Frequently Asked Questions

What are common types of metrology tools?
Common types include calipers, micrometers, coordinate measuring machines (CMM), laser scanners, and profilometers.
Which industries rely on metrology and inspection tools?
Industries such as aerospace, automotive, manufacturing, and electronics heavily rely on these tools for quality assurance.
How do I maintain precision measurement tools?
Regular calibration, cleaning, and proper storage are crucial for maintaining the accuracy of these tools.
Why is corporate surplus a good option for acquiring metrology tools?
Corporate surplus offers high-quality metrology tools at reduced costs, ideal for budget-conscious operations without compromising on precision.
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