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Inspection Equipment


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Group Listings into sub-categories under Inspection EquipmentGroup Listings into sub-categories under Inspection Equipment

List all 3 product types under Inspection EquipmentList all 3 product types under Inspection Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

199706
Zeiss  

Zeiss  

Ultra 55, LEO Gemini 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM:
Zeiss, Ultra 55, LEO Gemini, 300mm, SEM



*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment:
Applied Materials, Inc., FEI, Hitachi, JEOL, KLA-Tencor, SELA, Zeiss