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Laboratory and Scientific Equipment


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Group Listings into sub-categories under Laboratory and Scientific EquipmentGroup Listings into sub-categories under Laboratory and Scientific Equipment

List all 22 product types under Laboratory and Scientific EquipmentList all 22 product types under Laboratory and Scientific Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
204039
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm:

Applied Materials, SEMVision G3, DR-SEM, 300mm

missing some of the PC's in the electronic rack

Bagged & Skidded in Warehouse

2006 Vintage

176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

183772
Axcelis Technologies  

Axcelis Technologies  

Compact II  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Dresden, SN
Axcelis Compact II, 300mm, H2 Reflow Furnace, :
Axcelis Compact II, 300mm, H2 Reflow Furnace,

C4 Processing.

Tool ID: OVN222

Serial Number :  H08046
199780
BTU Engineering  

BTU Engineering  

TCAS 181-7-72-E-36 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Burlington, Vermont
BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace:

BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace

S/N: IBVT-1

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


190524
Fisher Sci  

Fisher Sci  

FD400 Binder Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
Fisher Scientific, FD400, Precision Binder, 200mm:
Fisher Scientific, FD400, Precision Binder, 200mm
194537
Fisher Sci  

Fisher Sci  

FD 720 Binder Precision Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
FISHER Scientific, FD720, Oven, 200mm:

FISHER Scientific, FD720, Oven, 200mm

FISHER Scientific, FD720, Precision Oven, 200mm

In the Fab
194540
Fisher Sci  

Fisher Sci  

FED720  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
FISHER Scientific, FED720, Oven, 200mm:

FISHER Scientific, FED720, Oven, 200mm

Precision Binder Oven

S/N : 00-08042

189084
Fisher Sci  

Fisher Sci  

FED 720 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
FISHER Scientific, FED720, Oven, 200mm:
FISHER Scientific, FED720, Oven, 200mm

In the Fab
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

 

192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
203119
JEOL  

JEOL  

ARM200CF Super X 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Malta, New York
JEOL, TEM, ARM200CF Super X, :

JEOL, TEM, ARM200CF Super X,

Atomic Resolution Electron Microscope

178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
203810
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

 

 

203811
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

203812
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

202838
Zeiss  

Zeiss  

LEA 1530 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
Zeiss, LEO1530, SEM, :

Zeiss, LEO1530, SEM, 

 

LEA1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE

 

Unhooked, in QRA Lab.

 

 

202852
Zeiss  

Zeiss  

Ultra 55 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
Zeiss, Ultra 55, LEO Gemini, SEM:

Zeiss, Ultra 55, LEO Gemini, SEM

LEO ULTRA HIGH RESOLUTION SEM/EDX SYSTEM

in QRA Lab

 

  1. Tool status: No working due to FE filament tip end of life 
  2. BSE detector: ESB Detector
  3. In-lens SE detector  
  4. EDAX : System type: Genesis 4000, Model No: PV9840/10P/G, S/No: HX3198/01
  5. Operating System: Microsoft Windows XP, Professional Version 2002, Service Pack 2
  6. SmartSEM version: 05.01.07
  7. Firmware stage: Controller 29.0.0  Axes 7.0.0, Firware EO: 3.0.0, Firmware Vac: Revision 500
  8. Ultra55 SEM - 100MM Airlock
  9. PAD600 Vibration Isolation System & MK4 Helmholtz cage


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Laboratory and Scientific Equipment:
Applied Materials, Inc., Axcelis Technologies GmbH, BTU Engineering, FEI, Fisher Scientific, Hitachi, JEOL, KLA-Tencor, SELA, Zeiss