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Inspection Equipment


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Group Listings into sub-categories under Inspection EquipmentGroup Listings into sub-categories under Inspection Equipment

List all 3 product types under Inspection EquipmentList all 3 product types under Inspection Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
204039
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm:

Applied Materials, SEMVision G3, DR-SEM, 300mm

missing some of the PC's in the electronic rack

Bagged & Skidded in Warehouse

2006 Vintage

176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

 

192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
203119
JEOL  

JEOL  

ARM200CF Super X 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Malta, New York
JEOL, TEM, ARM200CF Super X, :

JEOL, TEM, ARM200CF Super X,

Atomic Resolution Electron Microscope

178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
203810
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

 

 

203811
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

203812
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

202838
Zeiss  

Zeiss  

LEA 1530 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
Zeiss, LEO1530, SEM, :

Zeiss, LEO1530, SEM, 

 

LEA1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE

 

Unhooked, in QRA Lab.

 

 

202852
Zeiss  

Zeiss  

Ultra 55 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
Zeiss, Ultra 55, LEO Gemini, SEM:

Zeiss, Ultra 55, LEO Gemini, SEM

LEO ULTRA HIGH RESOLUTION SEM/EDX SYSTEM

in QRA Lab

 

  1. Tool status: No working due to FE filament tip end of life 
  2. BSE detector: ESB Detector
  3. In-lens SE detector  
  4. EDAX : System type: Genesis 4000, Model No: PV9840/10P/G, S/No: HX3198/01
  5. Operating System: Microsoft Windows XP, Professional Version 2002, Service Pack 2
  6. SmartSEM version: 05.01.07
  7. Firmware stage: Controller 29.0.0  Axes 7.0.0, Firware EO: 3.0.0, Firmware Vac: Revision 500
  8. Ultra55 SEM - 100MM Airlock
  9. PAD600 Vibration Isolation System & MK4 Helmholtz cage


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment:
Applied Materials, Inc., FEI, Hitachi, JEOL, KLA-Tencor, SELA, Zeiss