 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
| Make |
Model |
| |
|
$ |
|
 |
257112
|
Tesec
|
Tesec |
4330IH |
in Wafer Testers
4330IH TESEC HOT & COLD TEST:4330IH TESEC HOT & COLD TEST
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
257113
|
Tesec
|
Tesec |
4330IH |
in Wafer Testers
4330IH TESEC HOT & COLD TEST:4330IH TESEC HOT & COLD TEST
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
254741
|
Veeco
|
Veeco |
AFM-2 (METV44-1) |
in Wafer Manufacturing Metrology Equipment
AFM-2 (METV44-1) :Atomic Force Microscope (AFM) An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.
|
1
|
|
|
 |
Villach, Kärnten |
|
 |
255422
|
Hewlett Packard
|
Hewlett Packard |
AOT |
in Wafer Testers
AOT3 Bundle :-Tester AOT, Bundle sale preferred | AOT3-06 | AOT3-07 | AOT3-08 | AOT3-20 | | 3444A40234 | 3607A40332 | 3527A40287 | 30451 |
| AOT3-29 | AOT3-33 | AOT3-36 | AOT3-38 | | 30705 | 37978 | 40117 | 40128 |
|
8
|
lot
|
|
 |
Villach, Carinthia |
|
 |
254657
|
Nikon
|
Nikon |
Nikon 23 Optiphot 200 |
in Wafer Manufacturing Metrology Equipment
Nikon 23 Optiphot 200:Microscope with Handler for 5" or 6" Wafer.
|
1
|
|
|
 |
Villach, Kärnten |
|
 |
254656
|
Nikon
|
Nikon |
Nikon 7 Optiphot 200 |
in Wafer Manufacturing Metrology Equipment
|
1
|
|
|
 |
Villach, Kärnten |
|
 |
260355
|
PVA SPA Waferscale WS200 (MET902-01)
|
PVA SPA Waferscale WS200 (MET902-01) |
in Wafer Manufacturing Metrology Equipment
PVA SPA Waferscale WS200 (MET902-01):Waferscale for 8" Wafer STD + Taiko
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
260356
|
PVA SPA Waferscale WS200 (MET902-02)
|
PVA SPA Waferscale WS200 (MET902-02) |
in Wafer Manufacturing Metrology Equipment
PVA SPA Waferscale WS200 (MET902-02):Waferscale for 8" Wafer STD
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
260357
|
PVA SPA Waferscale WS300 (MET902-03)
|
PVA SPA Waferscale WS300 (MET902-03) |
in Wafer Manufacturing Metrology Equipment
PVA SPA Waferscale WS300 (MET902-03):Waferscale for 8" STD / 8" Taiko / 12" STD/ 12" Taiko
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
257111
|
SRM
|
SRM |
TD16 |
in Wafer Testers
TD16 SRM Electrical Test:TD16 SRM Electrical Test
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
256864
|
SRM
|
SRM |
TD16 |
in Wafer Testers
TD16 SRM Electrical Test:TD16 SRM Electrical Test
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
256867
|
SRM
|
SRM |
SRM |
in Wafer Testers
TD20 SRM Electrical Test:TD20 SRM Electrical Test
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
256871
|
SRM
|
SRM |
TD20 |
in Wafer Testers
TD20 SRM Electrical Test:TD20 SRM Electrical Test
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
257581
|
Tesec
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
257582
|
Tesec
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
257583
|
Tesec
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
257584
|
Tesec
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
|
|
|
 |
Tijuana, Baja California |
|
 |
257585
|
Tesec
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
|
|
|
 |
Tijuana, Baja California |
|