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Your search for Manufacturer: KLA Tencor
found:
  • 4 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
255041
KLA Tencor  

KLA Tencor  

2367 

List all items of this typeAutomatic Wafer Inspection Tools

in Microscope Inspection Tools

KLA 2367 "Escape" Bright Field Inspection Tool:

BrightField Inspektionstool
25 cassette HW 200mm
GEM/SECS and HSMS Model
Enable .12 , .62, .39 Picels

ORS Upgrade done 

 

Tool currently full installed at cleanroom (estimated time depending on areaneed)

 1   Regensburg, Bavaria
255557
KLA Tencor  

KLA Tencor  

Surfscan 6420 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

KLA Surfscan 6420 #420:

›Automatic Surface Inspection System

›Bare Wafer Surface Defect Inspection System

›Substrate/Sizes: 6" and 8" Wafer Capable

›Thickness: SEMI Standard Wafer Thickness

›Throughput: 100 wph (200 mm) at 0.12 mm

›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength

 1   Regensburg, Bavaria
255558
KLA Tencor  

KLA Tencor  

Surfscan 6420 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

KLA Surfscan 6420 (MET920-01):

›Automatic Surface Inspection System

›Bare Wafer Surface Defect Inspection System

›Substrate/Sizes: 6" and 8" Wafer Capable

›Thickness: SEMI Standard Wafer Thickness

›Throughput: 100 wph (200 mm) at 0.12 mm

›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength

 1   Regensburg, Bavaria
255559
KLA Tencor  

KLA Tencor  

Surfscan 6420 

List all items of this typeUnpatterned Wafer Inspection

in Surface Inspection

KLA Surfscan 6420 #419:

›Automatic Surface Inspection System

›Bare Wafer Surface Defect Inspection System

›Substrate/Sizes: 6" and 8" Wafer Capable

›Thickness: SEMI Standard Wafer Thickness

›Throughput: 100 wph (200 mm) at 0.12 mm

›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength

 1   Regensburg, Bavaria

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.