Wafer Inspection Microscopes
NIKON MICROSCOPE WAFER INSPECTION
Wafer Inpection Microscope
Microscopes & Inspection Systems
Microscopes and inspection systems are essential for identifying defects and ensuring quality in semiconductor components. They enhance precision and reliability during manufacturing and testing processes.
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Wafer Inspection Microscopes
LEICA/REICHERT MICROSCOPE, MANUAL WAFER INSPECTION
Manual Wafer Inspection MicroscopeMicroVision MVT 1080 Wafer Loader
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Wafer Inspection Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE
Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system
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Wafer Inspection Microscopes
OLYMPUS SEMICONDUCTOR INSPECTION MICROSCOPE
Semiconductor Inspection MicroscopeReflected and Transmitted Light
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Wafer Inspection Microscopes
LEICA AUTOMATED WAFER INSPECTION MICROSCOPE
Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system
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Wafer Inspection Microscopes
Nikon Optiphot-150S Wafer Inspection Microscope
Nikon Optiphot-150S Wafer Inspection Microscope
- 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses
- Binocular Head with CFWN 10X/20 WF Eyepieces
- Wafer Stage for Use with Nikon NWL-641 Wafer Loader
- 12V/50W Lamphouse with Internal Illumination Transformer
- Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
- Macro Inspection Capability
- Also Available with Bright/Darkfield Objective Lenses
- Also Available with Ergo Trinocular Head and Color Camera
- Also Available without NWL-641 Wafer Loader
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Wafer Inspection Microscopes
Nikon Optiphot 200
NIKON Optiphot 200 Wafer Inspection Stand, Including
- Focus Mechanism
- Interference Contrast Polarizer/Analyzer
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Wafer Inspection Microscopes
LEICA/REICHERT WAFER INSPECTION MICROSCOPE
Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system
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Wafer Inspection Microscopes
Olympus BH-BHM Microscope
Wafer Inspection Microscope -
Wafer Inspection Microscopes
Nikon/Semprex Measuring Microscope
NIKON/SEMPREX Wafer Measuring Microscope
- 4 Position Turret
- NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
- NIKON Binocular Viewing Head with 10X Widefield Eyepieces
- NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
- Brightfield & Darkfield Channels
- Dual Iris Apertures
- NIKON Model UN Illumination Transformer
- SEMPREX Microscope Stand
- Specimen Stage 6” X 6.75”
- 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
- 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
- Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
- 0-1” in Z Axis; Resolution to 0.0001”
- Specimen Stage 6” X 6.75”
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Wafer Inspection Microscopes
Olympus MX80AF-F Wafer Inspection Microscope
Olympus MX80AF-F Wafer Inspection Microscope
- Autofocus Capability
- Ludl Motorized Stage for up to 300mm Wafers
- Bright/Darkfield Optics:
- Motorized Turret with 6ea Objective Lenses:
- 5X, 10X, 20X, 50X & 100X UMPlanFl BD P
- 150X LMPlan Apo BD
- Interference Contrast Optical System
- Trinocular Viewing Head with Color CCD Camera & Monitor
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Wafer Inspection Microscopes
Olympus MX50 Wafer Inspection Microscope
OLYMPUS MX50A-F Reflected Light Microscope
- Five Position Motorized Turret with the Following Objective Lenses:
- OLYMPUS MPlanFl N 5X/0.15 BD
- OLYMPUS UMPlanFl 10X/0.30 BD
- OLYMPUS LMPlanFl 20X/0.40 BD
- OLYMPUS LMPlanFl 50X /0.50 BD
- OLYMPUS Trinocular Head with 2ea OLYMPUS WH10X Eyepieces
- OLYMPUS DBX Extension Tube with DIAGNOSTIC INST. 1.0X C Mount Adapter
- PIXELINK PL-B777U Solid State Camera
- Specimen Stage with 150mm X 150mm XY Travel
- OLYMPUS MX-LSH Lamp House with 12V 100W Halogen Lamp
- 100/115VAC 50/60Hz Input Voltage
- Five Position Motorized Turret with the Following Objective Lenses:
Common Applications
defect analysis
wafer inspection
lithography alignment
submicron measurement
semiconductor quality control
surface topology assessment
Frequently Asked Questions
What types of microscopes are used in semiconductor inspection?
In semiconductor inspection, optical and electron microscopes are commonly used to evaluate fine details and defects.
How do inspection systems improve semiconductor manufacturing?
Inspection systems identify defects early, ensuring high-quality output and reducing waste in semiconductor manufacturing.
What is the role of electron microscopes in inspection?
Electron microscopes provide high-resolution images, crucial for examining minute details in semiconductor materials.
Can surplus microscopes be reliably used in semiconductor fabrication?
Yes, quality surplus microscopes can effectively support semiconductor fabrication when properly maintained.