Wafer Inspection Microscopes

Wafer inspection microscopes are essential tools for examining semiconductor wafers at various stages of production. They ensure precision and reliability in defect detection, improving overall yield and manufacturing efficiency.

  3. LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Wafer Inspection Microscopes

    LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Automated Wafer Inspection Microscope Brightfield/Darkfield/DIC With LEP motorized wafer transport system

  5. LEICA AUTOMATED WAFER INSPECTION MICROSCOPE

    Wafer Inspection Microscopes

    LEICA AUTOMATED WAFER INSPECTION MICROSCOPE

    Automated Wafer Inspection Microscope Brightfield/Darkfield, DIC, With LEP motorized wafer transport system

  6. Nikon Optiphot-150S Wafer Inspection Microscope

    Wafer Inspection Microscopes

    Nikon Optiphot-150S Wafer Inspection Microscope

    Nikon Optiphot-150S Wafer Inspection Microscope

    • 2.5X, 5X, 10X, 20X & 50X CF Plan Bright/Darkfield Objective Lenses
    • Binocular Head with CFWN 10X/20 WF Eyepieces
    • Wafer Stage for Use with Nikon NWL-641 Wafer Loader
    • 12V/50W Lamphouse with Internal Illumination Transformer
    • Nikon NWL-641M Wafer Loader & Wafer Transfer XYO Stage
    • Macro Inspection Capability
    • Also Available with Bright/Darkfield Objective Lenses 
    • Also Available with Ergo Trinocular Head and Color Camera
    • Also Available without NWL-641 Wafer Loader
  8. LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Wafer Inspection Microscopes

    LEICA/REICHERT WAFER INSPECTION MICROSCOPE

    Automated Wafer Inspection Microscope Brightfield/Darkfield With LEP motorized wafer transport system

  10. Nikon/Semprex Measuring Microscope

    Wafer Inspection Microscopes

    Nikon/Semprex Measuring Microscope

     NIKON/SEMPREX Wafer Measuring Microscope

    • 4 Position Turret
    • NIKON MPlan 2.5X, BDPlan 10X, 20X & 40X Objective Lenses
    • NIKON Binocular Viewing Head with 10X Widefield Eyepieces
    • NIKON Vertical Illuminator with 12V/50W Halogen Lamp Housing
      • Brightfield & Darkfield Channels
      • Dual Iris Apertures
      • NIKON Model UN Illumination Transformer
      • SEMPREX Microscope Stand
        • Specimen Stage 6” X 6.75”
          • 2ea Mitutoyo 164-136 Digital Micrometers for XY Measurement
          • 0-2” in X Axis & 0-1.5” in Y Axis; Resolution to 0.0001”
          • Mitutoyo 534-223-1 Digital Micrometer for Height Measurement
          • 0-1” in Z Axis; Resolution to 0.0001”
  11. Olympus MX80AF-F Wafer Inspection Microscope

    Wafer Inspection Microscopes

    Olympus MX80AF-F Wafer Inspection Microscope

    Olympus MX80AF-F Wafer Inspection Microscope

    • Autofocus Capability
    • Ludl Motorized Stage for up to 300mm Wafers
    • Bright/Darkfield Optics:
    • Motorized Turret with 6ea Objective Lenses:
      • 5X, 10X, 20X, 50X & 100X UMPlanFl BD P 
      • 150X LMPlan Apo BD  
      • Interference Contrast Optical System
      • Trinocular Viewing Head with Color CCD Camera & Monitor
  12. Olympus MX50 Wafer Inspection Microscope

    Wafer Inspection Microscopes

    Olympus MX50 Wafer Inspection Microscope

    OLYMPUS MX50A-F  Reflected Light Microscope

    • Five Position Motorized Turret with the Following Objective Lenses:
      • OLYMPUS MPlanFl N 5X/0.15 BD
      • OLYMPUS UMPlanFl 10X/0.30 BD
      • OLYMPUS LMPlanFl 20X/0.40 BD
      • OLYMPUS LMPlanFl 50X /0.50 BD
      • OLYMPUS Trinocular Head with 2ea OLYMPUS WH10X Eyepieces
        • OLYMPUS DBX Extension Tube with DIAGNOSTIC INST. 1.0X C Mount Adapter
        • PIXELINK PL-B777U Solid State Camera
        • Specimen Stage with 150mm X 150mm XY Travel
        • OLYMPUS MX-LSH Lamp House with 12V 100W Halogen Lamp
        • 100/115VAC 50/60Hz Input Voltage

Common Applications

defect detection

quality control

wafer surface inspection

semiconductor manufacturing

research and development

process monitoring

Buying Guide

Wafer Inspection Microscopes Buying Considerations

  • Consider the resolution requirements for your specific inspection tasks.
  • Evaluate the automation level needed for efficient operation.
  • Ensure compatibility with your existing semiconductor production line.
  • Assess the microscope's adaptability to different wafer sizes and materials.
  • Check for software capabilities that enhance imaging and data analysis.

Frequently Asked Questions

What is the primary function of a wafer inspection microscope?
It is used to detect defects and perform detailed inspections of semiconductor wafers during production.
How do wafer inspection microscopes improve manufacturing?
They enhance quality control by providing precise imaging and defect analysis, leading to higher yields.
What features are important in wafer inspection microscopes?
Key features include high-resolution imaging, automated scanning capabilities, and advanced defect detection algorithms.
Are there different types of wafer inspection microscopes?
Yes, they vary in specifications like magnification level, imaging technology, and automation features, tailored to different inspection needs.