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	Item ID	Item Description	Make	Model	Description	#		Price	Notes	Location
								$
	195987	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker	D8Fabline	X-Ray Metrology	1				Singapore
	199447	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker	D8 Fabline	Xray Metrology	1				East Fishkill, New York
	199446	HMI, EP3, 300mm, E-Beam Inspection System	Hermes Microvis	ep3	300mm, e-beam inspection system	1				East Fishkill, New York
	199986	HMI, eScan 320, 300mm, ebeam Inspection	Hermes Microvis	eScan 320	Ebeam Probe	1			F*	Malta, New York
	179748	MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm	Multiprobe	MP1	Atomic Force Prober (AFP)	1			F*	Dresden, SN
	182307	Suss Microtec BA300-MIT, 300mm Automated Inspection Tool	Suss MicroTec	BA300-MIT		1			F*	Fishkill, New York
	191172	VEECO (Bruker Nano), X-1D, AFM, 300mm	Veeco	X-1D	ATOMIC FORCE MICROSCOPE (AFM)	1			F*	Dresden, Saxony
	191173	VEECO (Bruker Nano), X-3D, AFM, 300mm	Veeco	X-3D AFM	Atomic Force Microscope (AFM)	1				Dresden, Saxony
	191174	VEECO (Bruker Nano), X-3D, AFM, 300mm	Veeco	X-D3 AFM	Atomic Force Microscope (AFM)	1			F*	Dresden, Saxony

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.