Item ID Item Description Make Model Description # Price Notes Location $
203074
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection AMAT Elite M5 MC e-Beam Inspeciton
1
Dresden, Saxony
207935
Bruker, AFM, 300mm, InSight 3D-DR Bruker InSight 3D-DR AFM
1
Burlington, Vermont
204304
Bruker, D8 Discover, 300mm, X-Ray Metrology Bruker D8 Discover X-Ray Metrology
1
Dresden, Saxony
209828
Bruker, D8FABLINE, 300mm, X-Ray Metrology Bruker D8 Fabline X-Ray Metrology
1
Malta, New York
199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology Bruker D8 Fabline Xray Metrology
1
East Fishkill, New York
210074
Dektak, V200SI, Surface Profilometer Dektak V200S Surface Profile Measurement
1
East Fishkill, New York
199446
HMI, EP3, 300mm, E-Beam Inspection System Hermes Microvis ep3 300mm, e-beam inspection system
1
East Fishkill, New York
204305
HMI, eP4 320, 300mm, ebeam Inspection Hermes Microvis eP4 e-Beam Inspeciton
1
Malta, New York
199986
HMI, eScan 320, 300mm, ebeam Inspection Hermes Microvis eScan 320 Ebeam Probe
1
F*
Malta, New York
212703
HMI, eScan 500, 300mm, eBeam Inspection Tool Hermes Microvis eScan500 eBeam Inspection Tool
1
Malta, New York
218934
HMI, ESCAN 500, 300mm, S/N NE07130 Hermes Microvis ESCAN 500 EBeam Inspection
1
Malta, New York
179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm Multiprobe MP1 Atomic Force Prober (AFP)
1
F*
Dresden, SN
219775
Qcept, ChemtriQ-5000, 300mm, S/N 09-0212-SP01091 Qcept ChemtriQ-5000 Non visual defect inspection
1
F*
East Fishkill, New York
203137
Suss Microtec XBC 300, 300mm, Automated Bonding Tool Suss MicroTec XBC300 Bonder
1
East Fishkill, New York
191172
VEECO (Bruker Nano), X-1D, AFM, 300mm Veeco X-1D ATOMIC FORCE MICROSCOPE (AFM)
1
Dresden, Saxony
191173
VEECO (Bruker Nano), X-3D, AFM, 300mm Veeco X-3D AFM Atomic Force Microscope (AFM)
1
Dresden, Saxony
191174
VEECO (Bruker Nano), X-3D, AFM, 300mm Veeco X-D3 AFM Atomic Force Microscope (AFM)
1
Dresden, Saxony
NOTE:
photo available
reference document attached
F* if the item is specially featured
N* if the item is newly added, and/or
R* if the item's price is recently reduced.