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	Item ID	Item Description	Make	Model	Description	#		Price	Notes	Location
								$
	203074	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	AMAT	Elite M5 MC	e-Beam Inspeciton	1				Dresden, Saxony
	207935	Bruker, AFM, 300mm, InSight 3D-DR	Bruker	InSight 3D-DR	AFM	1				Burlington, Vermont
	204304	Bruker, D8 Discover, 300mm, X-Ray Metrology	Bruker	D8 Discover	X-Ray Metrology	1				Dresden, Saxony
	209828	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker	D8 Fabline	X-Ray Metrology	1				Malta, New York
	199447	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker	D8 Fabline	Xray Metrology	1				East Fishkill, New York
	210074	Dektak, V200SI, Surface Profilometer	Dektak	V200S	Surface Profile Measurement	1				East Fishkill, New York
	199446	HMI, EP3, 300mm, E-Beam Inspection System	Hermes Microvis	ep3	300mm, e-beam inspection system	1				East Fishkill, New York
	204305	HMI, eP4 320, 300mm, ebeam Inspection	Hermes Microvis	eP4	e-Beam Inspeciton	1				Malta, New York
	199986	HMI, eScan 320, 300mm, ebeam Inspection	Hermes Microvis	eScan 320	Ebeam Probe	1			F*	Malta, New York
	212703	HMI, eScan 500, 300mm, eBeam Inspection Tool	Hermes Microvis	eScan500	eBeam Inspection Tool	1				Malta, New York
	218934	HMI, ESCAN 500, 300mm, S/N NE07130	Hermes Microvis	ESCAN 500	EBeam Inspection	1				Malta, New York
	179748	MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm	Multiprobe	MP1	Atomic Force Prober (AFP)	1			F*	Dresden, SN
	219775	Qcept, ChemtriQ-5000, 300mm, S/N 09-0212-SP01091	Qcept	ChemtriQ-5000	Non visual defect inspection	1			F*	East Fishkill, New York
	203137	Suss Microtec XBC 300, 300mm, Automated Bonding Tool	Suss MicroTec	XBC300	Bonder	1				East Fishkill, New York
	191172	VEECO (Bruker Nano), X-1D, AFM, 300mm	Veeco	X-1D	ATOMIC FORCE MICROSCOPE (AFM)	1				Dresden, Saxony
	191173	VEECO (Bruker Nano), X-3D, AFM, 300mm	Veeco	X-3D AFM	Atomic Force Microscope (AFM)	1				Dresden, Saxony
	191174	VEECO (Bruker Nano), X-3D, AFM, 300mm	Veeco	X-D3 AFM	Atomic Force Microscope (AFM)	1				Dresden, Saxony

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.