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Item IDPhotoItem DescriptionMakeModelDescription#PriceNotes Location
195987 Bruker, D8FABLINE, 300mm, X-Ray MetrologyBrukerD8FablineX-Ray Metrology 1 Singapore
199447 Bruker, D8FABLINE, 300mm, X-Ray MetrologyBrukerD8 FablineXray Metrology 1 East Fishkill, New York
199446 HMI, EP3, 300mm, E-Beam Inspection SystemHermes Microvisep3300mm, e-beam inspection system 1 East Fishkill, New York
199986 HMI, eScan 320, 300mm, ebeam InspectionHermes MicroviseScan 320Ebeam Probe 1 F* Malta, New York
179748 MULTIPROBE MP1, Atomic Force Prober (AFP), 300mmMultiprobeMP1Atomic Force Prober (AFP) 1 F* Dresden, SN
182307 Suss Microtec BA300-MIT, 300mm Automated Inspection ToolSuss MicroTec BA300-MIT 1 F* Fishkill, New York
191172 VEECO (Bruker Nano), X-1D, AFM, 300mmVeecoX-1D ATOMIC FORCE MICROSCOPE (AFM) 1 F* Dresden, Saxony
191173 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-3D AFMAtomic Force Microscope (AFM) 1 Dresden, Saxony
191174 VEECO (Bruker Nano), X-3D, AFM, 300mmVeecoX-D3 AFMAtomic Force Microscope (AFM) 1 F* Dresden, Saxony

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Items from the following manufacturers are offered under Other Items:
Suss MicroTec