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Item ID |
Photo |
Short Description |
Product Type / Details |
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Price |
Notes |
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Make |
Model |
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206534
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ABB Engineering
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ABB Engineering |
IRB120 |
in Sample Preparation
ABB, IRB120, Sample Polishing Robot. :ABB, IRB120, Sample Polishing Robot.
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1
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F* |
Singapore |
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204302
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Ancosys
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Ancosys |
P13010 Ancolyzer |
in Pharmaceutical Laboratory and Scientific Equipment
Ancosys, P13010 Ancolyzer, :Ancosys, P13010 Ancolyzer, Cu Plating Bath Analyzer
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1
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Malta, New York |
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213282
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Applied Materials
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Applied Materials |
NanoSEM 3D |
in Microscopes
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:Applied Materials NanoSEM 3D, 300mm wafers, CD SEM Installed. Operational. Vintage : 2004 S/N : U-667
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1
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Singapore |
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210024
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Applied Materials
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Applied Materials |
NanoSEM 3D |
in Microscopes
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
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1
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Burlington, Vermont |
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180474
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Applied Materials
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Applied Materials |
NanoSEM 3D |
in Microscopes
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:MULTIPLE UNITS AVAILBLE. PLEASE INQUIRE.
SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8
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1
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East Fishkill, New York |
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180514
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Applied Materials
|
Applied Materials |
NanoSEM 3D |
in Microscopes
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
MULTIPLE UNITS AVAILABLE. PLEASE INQUIRE.
SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8 Tool ID: KA03
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1
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East Fishkill, New York |
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195983
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Applied Materials
|
Applied Materials |
Elite MS MC |
in Inspection Equipment
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection
iii Multiple Units Available. Please inquire !!!
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1
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Dresden, Saxony |
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203074
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Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection
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Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection |
in Microscopes
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab. Idle.
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1
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Dresden, Saxony |
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201207
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Applied Materials
|
Applied Materials |
SemVision CX |
in Microscopes
Applied Materials, SEMVision CX, 200mm,:Applied Materials, SEMVision CX, 200mm,
S/N : W790
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1
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Burlington, Vermont |
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183772
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Axcelis Technologies
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Axcelis Technologies |
Compact II |
in Heat Treating Equipment
Axcelis Compact II, 300mm, H2 Reflow Furnace, :Axcelis Compact II, 300mm, H2 Reflow Furnace, C4 Processing. Tool ID: OVN222 Serial Number : H08046
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1
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F* |
Dresden, SN |
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202879
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Blue M
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Blue M |
DCC 206CY |
in Pharmaceutical Laboratory and Scientific Equipment
Blue M Electric Oven, DCC 206CY:Blue M Electric Oven, DCC 206CY Bagged & Skidded
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1
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Singapore |
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204174
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Blue M
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Blue M |
DDC 206CY Oven |
in Pharmaceutical Laboratory and Scientific Equipment
Blue M Electric Oven, DCC 206CY:Blue M Electric Oven, DCC 206CY Bagged & Skidded in Warehouse
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1
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Singapore |
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181816
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Blue M
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Blue M |
DCC-1406CY |
in Pharmaceutical Laboratory and Scientific Equipment
Blue M Electric Oven, DCC-1406CY:Blue M Electric Oven, DCC-1406CY Tool ID: OVEN-01 (PEA106)
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1
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Singapore |
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183762
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Blue M
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Blue M |
DDC-206CY |
in Pharmaceutical Laboratory and Scientific Equipment
Blue M Electric Oven, DCC-206CY, 200mm, oven:Blue M Electric Oven, DCC-206CY, 200mm, oven
Tool ID : OVEN-01 (PEA052)
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1
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Singapore |
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196206
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Blue M
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Blue M |
DCC-206-EV-ST350 |
in Pharmaceutical Laboratory and Scientific Equipment
Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake:Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake
S/N :DCC-832
MULTIPLE UNITS AVAILABLE!! Please inquire
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1
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East Fishkill, New York |
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210050
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Blue M
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Blue M |
RG-3010F-2 |
in Pharmaceutical Laboratory and Scientific Equipment
BlueM, Oven, RG-3010F-2, :BlueM, Oven, RG-3010F-2, Disconnected in Storage Non-Operational - Known Electrical Faults/Issues
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1
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Burlington, Vermont |
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210051
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Blue M
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Blue M |
RG-3010F-2 |
in Pharmaceutical Laboratory and Scientific Equipment
BlueM, Oven, RG-3010F-2, :BlueM, Oven, RG-3010F-2, In Storage - Known Electrical Faults/Issues
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1
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Burlington, Vermont |
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178423
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Branson
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Branson |
5210DTH |
in Cleaning and Degreasing Equipment
Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm:Status: Bagged and Skidded
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1
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Taichung, Taichung City |
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207935
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Bruker, AFM, 300mm, InSight 3D-DR
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Bruker, AFM, 300mm, InSight 3D-DR |
in Microscopes
Bruker, AFM, 300mm, InSight 3D-DR:Bruker, AFM, 300mm, InSight 3D-DR DOM : 2017 S/N : 112
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1
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Burlington, Vermont |
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204304
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Bruker, D8 Discover, 300mm, X-Ray Metrology
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Bruker, D8 Discover, 300mm, X-Ray Metrology |
in Microscopes
Bruker, D8 Discover, 300mm, X-Ray Metrology:Bruker, D8 Discover, 300mm, X-Ray Metrology In Lab, Cold idle
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1
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Dresden, Saxony |
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209828
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Bruker, D8FABLINE, 300mm, X-Ray Metrology
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Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
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1
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Malta, New York |
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199447
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Bruker, D8FABLINE, 300mm, X-Ray Metrology
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Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
S/N 204500
2009
The tool is an automated High resolution X-ray diffractometer, clean room (class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300 mm wafer mapping capabilities. The D8 FABLINE consists of two stainless steal cabinets attached to each other. The first one is an X-ray analytical module composed of: radiation safe enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated optical set-ups, and all required supplies. The second is a handling module Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP [INVALID] for 200mm..
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1
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East Fishkill, New York |
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199780
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BTU Engineering
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BTU Engineering |
TCAS 181-7-72-E-36 |
in Heat Treating Equipment
BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace:BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace
S/N: IBVT-1
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1
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F* |
Burlington, Vermont |
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205918
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Camtek
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Camtek |
X-ACT |
in Optical Microscopes
CAMTEK X-ACT System with EM3:CAMTEK X-ACT System with EM3 Idle. Shut Down.
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1
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East Fishkill, New York |
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204314
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Check Point Technolo
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Check Point Technolo |
InfraScanTDM 300 TDE |
in Pharmaceutical Laboratory and Scientific Equipment
CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson:CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson The system is comprised of the following: 1 InfraScan 300 TDE Laser Probing / Emission System Includes the following assemblies: * LSM 300 scanner with integrated emission camera port; * CCD camera for sample navigation with separate display; * 5-position motorized turret; * X, Y, Z motorized movement of LSM assembly; * PC with digitizer, Windows XP, Proscan 2000 Acquisition Software; * Moveable Operator Console, with flat panel displays, Semi S8 compliant; * SLS-1000 1064 nm 300 mW * SLS-1000 1319 nm 350 mW * ASP-1000 3A Amplifier source package * Laser power adjustment, 0 to 100%, with incident power monitoring for all objectives; * Dark chamber with laser safety interlock, Class I (with service override), vibration isolation * User’s manual. Emission Camera Options InGaAs LN2 cooled 640 x 640 array 18 ?m pixels. LN2 Auto-fill system with two (2) 160 L Dewars InfraScan™ LTM 9Hz laser timing module. Includes the following: 9 GHz laser timing module Digital Oscilloscope 12.5 GHz Bandwidth Electronic Spectrum Analyzer APD and electronic amplifier High power/ high stability laser for timing stimulus Objective Options 5X NIR, Mitutoyo 378-822 20X IR Plan Apo, NA 0.5, Seiwa 50X IR Plan Apo, NA 0.6, Seiwa 100X NIR HR Mitutoyo 378-864-5 1X Macro Lens Specifications and Features: LSM 300/Optics- Optimized for high transmission at 1064nm and 1340nm. * T => 100mW at 1064nm 5X objective; T =>300mW at 1340nm 5X objective Image distortion <2%, 2X slow scan. Spot size 0.61?/NA of objective. * Scan rate 310 lines/sec to 2 sec/line. Field of view with 5X objective at 1X zoom: 3.2mm. Optical zoom range 1X to 8X (scanned field). * Image registration better than 2% for various wavelengths. * 5-position motorized turret, non-winding, Software settable crash protection limits for all objective lenses. Software controlled, par-centered and parfocal objectives. Built-in CCD camera for sample navigation with color monitor. External sync circuit. Computer and Inputs - PC with 3-channel digitizer input, one for LSM imaging and two for laser stimulation methods. Signal inputs are synchronized with LSM scan rate. Independent Gain and Offset control for input 1 and input 2. Scan rates adjustable from 310 lines/sec to 2048X slow to match response of DUT. 2-way communication with Knights CAD link. SLS 1000 RD – 300mW 1064 nm linearly polarized laser * Continuously adjustable Laser Power, from near 0% to full maximum. Real-time, incident laser power monitoring. Power limit feature to prevent overexposure of DUT. FC fiber optical coupler with 3 meter PM patchcord. ASP 1000 Amplifier-Source Package - Source Selections: Constant Current Programmable Range: 0.5nA – 1A; (3A optional) Minimum Program Step: .5nA Constant Voltage Programmable Range: 1uV – 10V (20V if protection diode removed) Minimum Program Step: 1uV Amplifier Selections: AC Voltage Amplifier Bias Current: .5nA - 1A; (3A optional) Maximum Input: 10V Input impedance: >4.7M Ohm Maximum Gain: 120 dB Detectability: 1 nV at full gain Bandwidth: 0.3 to 400K Hz High Pass Filter: .3, 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ, Low Pass Filter: 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ Output Offset Voltage: +/- 5V DC Current Amplifier (OBIC mode) Bias Voltage Range: 1uV - 10V Maximum Input: 20 mA Maximum Gain: 80 V/nA Detectability: 1 pA at full gain Bandwidth: DC to 400K Hz
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1
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Malta, New York |
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208158
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Chemical Safety Tech
|
Chemical Safety Tech |
Dual Drum Waste Cabinet |
in Pharmaceutical Laboratory and Scientific Equipment
Chemical Safety Technology, Inc., Dual drum waste Cabinet:Chemical Safety Technology, Inc., Dual drum waste Cabinet
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1
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Malta, New York |
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210074
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Dektak, V200SI, Surface Profilometer
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Dektak, V200SI, Surface Profilometer |
in Microscopes
Dektak, V200SI, Surface Profilometer:Dektak, V200SI, Surface Profilometer Powered Down. Installed
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1
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East Fishkill, New York |
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210386
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Denton
|
Denton |
Infinity 18 |
in Pharmaceutical Laboratory and Scientific Equipment
Denton Vacuum, Infinity 18, Sputter Coating System :Denton Vacuum, Infinity 18, Sputter Coating System One Cathode. Installed. Idle. S/N : 40013
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1
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Burlington, Vermont |
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195189
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Drilling machine bernhard steinel
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Drilling machine bernhard steinel |
in Laboratory and Scientific Equipment
Drilling machine bernhard steinel:Already damaged loses function, was unable to repair. LOCATION: Wuxi
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1
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0.00 |
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Regensburg, Bavaria |
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203282
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E.A. Fischione Instr
|
E.A. Fischione Instr |
1030 |
in Sample Preparation
E.A. Fischione Instruments Inc., 1030, NanoMill:E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep. Automated Sample Preparation System
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1
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East Fishkill, New York |
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200230
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E.A. Fischione Instr
|
E.A. Fischione Instr |
2040 |
in Pharmaceutical Laboratory and Scientific Equipment
E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder:E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder Still in Use S/N: 23492
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1
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East Fishkill, New York |
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209075
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Esco
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Esco |
EHWS 8C |
in Pharmaceutical Laboratory and Scientific Equipment
ESCO Horizontal Work Station :ESCO Horizontal Work Station, Bagged & Skidded in Warehouse
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1
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Singapore |
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215848
|
Estion
|
Estion |
E-RETICLE V 4M |
in Pharmaceutical Laboratory and Scientific Equipment
Estion, E-RETICLE V 4M, Electrostatic Charge Measurement:Estion, E-RETICLE V 4M, Electrostatic Charge Measurement Reticle Electrostatic Charge Measurement System Installed, Idle. Vintage : 2010
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1
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Burlington, Vermont |
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211894
|
FEI
|
FEI |
CLM 3D |
in Optical Microscopes
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:FEI, CLM + Dual Beam FIB, TEM Sample Prep tool Installed. Idle.
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1
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East Fishkill, New York |
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202148
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FEI
|
FEI |
CLM |
in Optical Microscopes
FEI, CLM, TEM Sample Prep tool:FEI, CLM, TEM Sample Prep tool FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool Cold Shutdown in the lab
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1
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East Fishkill, New York |
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219851
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FEI
|
FEI |
EX SITU PLUCKER |
in Pharmaceutical Laboratory and Scientific Equipment
FEI, EX SITU PLUCKER, 300mm, S/N 4471-03-06, Chip edit:FEI, EX SITU PLUCKER, 300mm, S/N 4471-03-06, Chip edit
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1
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N* |
East Fishkill, New York |
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202147
|
FEI
|
FEI |
Ex-Situ Plucker |
in Optical Microscopes
FEI, Ex-Situ Plucker, TEM Prep Tool:FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage
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1
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East Fishkill, New York |
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203114
|
FEI
|
FEI |
TEMLINK - KY02, 14771-003 |
in Optical Microscopes
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:FEI, Ex-Situ Plucker, TEM Prep Tool
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1
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East Fishkill, New York |
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211546
|
FEI
|
FEI |
Meridian-IV |
in Pharmaceutical Laboratory and Scientific Equipment
FEI, Meridian-IV, Fault localization and analysis:FEI, Meridian-IV, Fault localization and analysis
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1
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Singapore |
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211893
|
FEI
|
FEI |
TEMLINK 14771-003 |
in Optical Microscopes
FEI, TEM Link, 14771-003, :FEI, TEM Link, 14771-003, S/N : 4471-03-06
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1
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East Fishkill, New York |
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190524
|
Fisher Sci
|
Fisher Sci |
FD400 Binder Oven |
in Heat Treating Equipment
Fisher Scientific, FD400, Precision Binder, 200mm:Fisher Scientific, FD400, Precision Binder, 200mm
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1
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Singapore |
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194537
|
Fisher Sci
|
Fisher Sci |
FD 720 Binder Precision Oven |
in Heat Treating Equipment
FISHER Scientific, FD720, Oven, 200mm:FISHER Scientific, FD720, Oven, 200mmFISHER Scientific, FD720, Precision Oven, 200mm
In the Fab
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1
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Singapore |
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194540
|
Fisher Sci
|
Fisher Sci |
FED720 |
in Heat Treating Equipment
FISHER Scientific, FED720, Oven, 200mm:FISHER Scientific, FED720, Oven, 200mm
Precision Binder Oven
S/N : 00-08042
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1
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Singapore |
|
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189084
|
Fisher Sci
|
Fisher Sci |
FED 720 |
in Heat Treating Equipment
FISHER Scientific, FED720, Oven, 200mm:FISHER Scientific, FED720, Oven, 200mm
In the Fab
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1
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Singapore |
|
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179078
|
General Electric
|
General Electric |
GE MS6001B DLN-1 |
in Gas Plant Equipment
Gas Turbine:Turbine includes the following: Air Cooled Generator 336X482 GE Gas Turbine 296624 Air Filter Housing GTG 51 Controls GTG 51 Spare parts Auxillaries: Lube Oil Skid, Starting Motor, Starting Motor Gearbox, Exciter and Exciter to Gen Gearbox.
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1
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F* |
Texas City, Texas |
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183208
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GEMETEC
|
GEMETEC |
Elymat III |
in Pharmaceutical Laboratory and Scientific Equipment
GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool:GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length. A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured. The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode).
In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers. Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent. Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material. Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination. Measuring at different laser intensities allows major contaminants such as iron to be identified. This is known as Injection Level Spectroscopy (ILS).
Measurement Precision -Diffusion length: 5% over 10 repeated measurements Measurement Accuracy -Diffusion length: 10% compared with similar techniques.
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1
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F* |
East Fishkill, New York |
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215016
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Hologenix
|
Hologenix |
MTX 2000/2/MIS SLIPBAY |
in Pharmaceutical Laboratory and Scientific Equipment
Halogenix, MTX 2000/2/MIS SLIPBAY, Slip Finder Inspection Tool:Halogenix, MTX 2000/2/MIS SLIPBAY, Slip Finder Inspection Tool Installed Vintage 2001 S/N : 252601
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1
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F* |
East Fishkill, New York |
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202146
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Hitachi
|
Hitachi |
HF-2000 |
in Optical Microscopes
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM 1995 Vintage S/N : 6214-3 Un-hooked in lab.
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1
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East Fishkill, New York |
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178296
|
Hitachi
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Hitachi |
Microanalysis System |
in Inspection Equipment
Hitachi, Metrology, Microanalysis System 300mm:Status: Bagged and Skidded
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1
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Taichung, Taichung City |
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178294
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Hitachi
|
Hitachi |
AS5000 |
in Inspection Equipment
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server
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1
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F* |
Singapore |
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219072
|
Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03
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1
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Singapore |
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219057
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Hitachi
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Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03
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1
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Singapore |
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219058
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Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01
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1
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Singapore |
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219056
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Hitachi
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Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02
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1
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Singapore |
|
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219055
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Hitachi
|
Hitachi |
RS4000 |
in Inspection Equipment
Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01:Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01
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1
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Singapore |
|
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210389
|
Hitachi
|
Hitachi |
S-4500 |
in Inspection Equipment
Hitachi, S-4500, SEM:Hitachi, S-4500, SEM Installed. Idle S/N: 7953-02
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1
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Burlington, Vermont |
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203281
|
Hitachi
|
Hitachi |
S-5200 |
in Inspection Equipment
Hitachi, S-5200, SEM, Ultra High Resolution:Hitachi, S-5200, SEM, Ultra High Resolution
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1
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East Fishkill, New York |
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205450
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Hitachi
|
Hitachi |
S-9380 |
in Microscopes
Hitachi, S-9380, CD SEM, 300mm:Hitachi, S-9380, CD SEM, 300mm Refurbished S/N: 89638
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1
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Seoul |
|
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213283
|
Applied Materials
|
Applied Materials |
NanoSEM 3D |
in Microscopes
Hitachi, S-9380, CD-SEM, 300mm:Hitachi, S-9380, CD-SEM, 300mm Installed Operational. S/N : U-664 Vintage : 2004
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1
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|
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Singapore |
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 |
213284
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Applied Materials
|
Applied Materials |
NanoSEM 3D |
in Microscopes
Hitachi, S-9380, CD-SEM, 300mm:Hitachi, S-9380, CD-SEM, 300mm Installed. Operational. Vintage : 2004 S'N : U-666
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1
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Singapore |
|
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178299
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Hitachi
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Hitachi |
Z-5700 |
in Inspection Equipment
Hitachi, Z-5700 Spectroscopy, 300mm:Status: Bagged and Skidded
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1
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Taichung, Taichung City |
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199446
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HMI, EP3, 300mm, E-Beam Inspection System
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HMI, EP3, 300mm, E-Beam Inspection System |
in Microscopes
HMI, EP3, 300mm, E-Beam Inspection System:HMI, EP3, 300mm, E-Beam Inspection System
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1
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|
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East Fishkill, New York |
|
 |
204305
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HMI, eP4 320, 300mm, ebeam Inspection
|
HMI, eP4 320, 300mm, ebeam Inspection |
in Microscopes
HMI, eP4 320, 300mm, ebeam Inspection:HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle
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1
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|
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Malta, New York |
|
 |
199986
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HMI, eScan 320, 300mm, ebeam Inspection
|
HMI, eScan 320, 300mm, ebeam Inspection |
in Microscopes
HMI, eScan 320, 300mm, ebeam Inspection:HMI, eScan 320, 300mm, ebeam Inspection
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1
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F* |
Malta, New York |
|
 |
212703
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HMI, eScan 500, 300mm, eBeam Inspection Tool
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HMI, eScan 500, 300mm, eBeam Inspection Tool |
in Microscopes
HMI, eScan 500, 300mm, eBeam Inspection Tool:HMI, eScan 500, 300mm, eBeam Inspection Tool
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1
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|
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Malta, New York |
|
 |
218934
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HMI, ESCAN 500, 300mm, S/N NE07130
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HMI, ESCAN 500, 300mm, S/N NE07130 |
in Microscopes
HMI, ESCAN 500, 300mm, S/N NE07130:HMI, ESCAN 500, 300mm, S/N NE07130, EBeam Inspection
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1
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Malta, New York |
|
 |
181188
|
HSEB
|
HSEB |
Axiospect 300 |
in Optical Microscopes
HSEB Axiospect 300, 300mm Wafer inspection microscope:HSEB Axiospect 300, 300mm Wafer inspection microscope Stereo Microscope Tool ID: OPI905 Serial Number: 41302020182
!!! MULTIPLE UNITS AVAILABLE. PLEASE INQUIRE !!!
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1
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|
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Dresden, Saxony |
|
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202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
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|
 |
Malta, New York |
|
 |
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
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|
|
 |
Malta, New York |
|
 |
178300
|
JEOL
|
JEOL |
7555 |
in Inspection Equipment
JEOL, Defect Review, 200mm:Status: Bagged & Skidded in warehouse
Parts tool. Listed as major parts missing.
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1
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|
|
|
Singapore |
|
 |
178302
|
JEOL
|
JEOL |
JEM-2500SE |
in Inspection Equipment
JEOL, JEM-2500SE Microscopes, 300mm:Status: Bagged and Skidded
|
1
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|
|
|
Taichung, Taichung City |
|
 |
178303
|
JEOL
|
JEOL |
JEM-2500SE |
in Inspection Equipment
JEOL, JEM-2500SE Microscopes, 300mm:Status: Bagged and Skidded
|
1
|
|
|
|
Taichung, Taichung City |
|
 |
187765
|
JEOL
|
JEOL |
JWS 7555S |
in Inspection Equipment
JEOL, JWS 7555S, Defect Review, 200mm:JEOL, JWS 7555S, Defect Review, 200mm
|
1
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|
|
 |
Singapore |
|
 |
189689
|
JEOL
|
JEOL |
JWS-7515 |
in Inspection Equipment
JEOL, JWS-7515, 200mm, SEM:JEOL, JWS-7515, 200mm, SEM
S/N: WS179028-108
|
1
|
|
|
 |
Singapore |
|
 |
203119
|
JEOL
|
JEOL |
ARM200CF Super X |
in Inspection Equipment
JEOL, TEM, ARM200CF Super X, :JEOL, TEM, ARM200CF Super X, Atomic Resolution Electron Microscope
|
1
|
|
|
 |
Malta, New York |
|
 |
219300
|
Jordan Valley
|
Jordan Valley |
JVX5200T |
in Pharmaceutical Laboratory and Scientific Equipment
Jordan Valley, JVX5200T, 300mm, S/N 763:Jordan Valley, JVX5200T, 300mm, S/N 763, Layer Thickness, Density, and Roughness. Missing parts
|
1
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|
|
 |
Dresden, Saxony |
|
 |
178270
|
KEITHLEY Insturments, 590 C-V Analyzer, 300mm
|
KEITHLEY Insturments, 590 C-V Analyzer, 300mm |
in Pharmaceutical Laboratory and Scientific Equipment
KEITHLEY Insturments, 590 C-V Analyzer, 300mm:Status: Bagged and Skidded
|
1
|
|
|
|
Taichung, Taichung City |
|
 |
219460
|
KLA-Tencor
|
KLA-Tencor |
Archer AIM+ |
in Pharmaceutical Laboratory and Scientific Equipment
KLA, Archer Overlay AIM+, 300mm, S/N 3637:KLA, Archer Overlay AIM+, 300mm, S/N 3637
|
1
|
|
|
 |
Singapore |
|
 |
215849
|
KLA-Tencor
|
KLA-Tencor |
P2 Data Prep Station, |
in Pharmaceutical Laboratory and Scientific Equipment
KLA-Tencor, DP2 Data Prep Station, IPRO Data Prep:KLA-Tencor, DP2 Data Prep Station, IPRO Data Prep Deinstalled Vintage : 2012
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
178304
|
KLA-Tencor
|
KLA-Tencor |
ES31 |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
178305
|
KLA-Tencor
|
KLA-Tencor |
ES32 |
in Inspection Equipment
KLA-Tencor, ES32, E-beam Inspection, 300mm:Manufactured in 2007; Status: Bagged and Skidded
!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
|
1
|
|
|
|
Taichung, Taichung City |
|
 |
209076
|
Leica
|
Leica |
POLYLITE 88 METALLURGICAL SCOPE |
in Optical Microscopes
Leica, POLYLITE 88 METALLURGICAL SCOPE:Leica, POLYLITE 88 METALLURGICAL SCOPE REICHERT INCIDENT LIGHT MICROSCOPE Idle in the fab.
|
1
|
|
|
|
Singapore |
|
 |
217502
|
Lenze Vertical Lift Machine Frequency Drive
|
Lenze Vertical Lift Machine Frequency Drive |
in Other Motors
Lenze Vertical Lift Machine Frequency Drive:Lenze Vertical Lift Machine Frequency Drive
|
1
|
|
|
F* |
Newark, Delaware |
|
 |
204285
|
Lyncee
|
Lyncee |
Holographic Microscope |
in Optical Microscopes
LYNCEE TEC, Holographic Microscope, :LYNCEE TEC, Holographic Microscope, In Lab
|
1
|
|
|
F* |
Malta, New York |
|
 |
190437
|
Marshall/Williams Stretch Bonding Machine & Equipment
|
Marshall/Williams Stretch Bonding Machine & Equipment |
in Pharmaceutical Laboratory and Scientific Equipment
Marshall/Williams Stretch Bonding Machine & Equipment :Bonding Equipment-includes the following elements: - Parkinson Turret Unwind designed to unwind rolls of 22 to 36 in dia.
- Four Coated Steel Bonding Rolls – 65” Length
- Five closely coupled stretching/bonding rolls, 65” Length, Rolls are made of coated steel
- Two Cooling Rolls
- Lepel Corona Treater
- Two pairs of embossing rolls/rubber back-up rolls – 70” Length
- Spreader Rolls
- Parkinson Turret Winder designed to wind rolls up to 36 in diameter.
*This unit is fully operational
|
1
|
|
|
 |
Richmond, Virginia |
|
 |
191526
|
Metron
|
Metron |
Extraction, Amine |
in Pharmaceutical Laboratory and Scientific Equipment
Metron, Amine Extraction, :Metron, Amine Extraction,
|
1
|
|
|
 |
Singapore |
|
 |
210398
|
Micro Control Co.
|
Micro Control Co. |
WRP256 Oven |
in Pharmaceutical Laboratory and Scientific Equipment
Micro Control Company, WRP256 Oven:Micro Control Company, WRP256 Oven Connected. Idle. Chambers - 8 slots each S/N : 301
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
155055
|
Hitachi
|
Hitachi |
VP-1500 |
in Pharmaceutical Laboratory and Scientific Equipment
MONOCHROME COPIER:MONOCHROME COPIERMONOCHROME COPIERLOCATION: Malacca SERIAL NUMBER(S): TA0101513
|
1
|
|
3,204.00 |
 |
Regensburg, BY |
|
 |
179748
|
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
|
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm |
in Microscopes
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm tool for micro probing of transistors at contact level 3 Probe heads, MP1-system with semiauto stage/optics Comes with : electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads Upgrades Include: semiautomatic stage, optics & probe head control, 4th probe head
|
1
|
|
|
F* |
Dresden, SN |
|
 |
178730
|
NCB Network
|
NCB Network |
NF200 |
in Pharmaceutical Laboratory and Scientific Equipment
NCB Network NF200 200mm Furnace:NCB Network NF200 200mm Furnace
|
1
|
|
|
|
Singapore |
|
 |
206572
|
New (Never Installed) 2018 Hirayama Autoclave Model# PTU-507H
|
New (Never Installed) 2018 Hirayama Autoclave Model# PTU-507H |
in Pharmaceutical Manufacturing Equipment
New (Never Installed) 2018 Hirayama Autoclave Model# PTU-507H:New (Never Installed) 2018 Hirayama Autoclave Model# PTU-507H Includes the following: Stainless Steel Sliding Trays Stackable Rack (Three Tiered Tray) Chart Recorder Cabinet Accepting offers until July 5, 2019 9 AM EST.
|
1
|
|
|
|
Sunnyvale, California |
|
 |
202839
|
NSC
|
NSC |
PS102W |
in Pharmaceutical Laboratory and Scientific Equipment
NSC, PS102W, Jet Etcher, :NSC, PS102W, Jet Etcher, Nippon Plastic Mold Decapsulation System (Jet Etcher) Unhooked, in QRA Lab.
|
1
|
|
|
|
Singapore |
|
 |
190343
|
NUMATICS Pneumatic Cylinders
|
NUMATICS Pneumatic Cylinders |
in Pharmaceutical Laboratory and Scientific Equipment
NUMATICS Pneumatic Cylinders:NUMATICS INCORPORATED Pneumatic Cylinders
Model: AA-942449-5/N19367 BORE: 4" STROKE: 10,000 SIZE: 4x10"
24 pneumatic cylinders available
|
24
|
|
|
 |
Sayreville, New Jersey |
|
 |
205919
|
Olympus
|
Olympus |
PMG3 |
in Optical Microscopes
Olympus Metallurgical Microscope, PMG3, :Olympus Metallurgical Microscope, PMG3, Idle.
|
1
|
|
|
F* |
East Fishkill, New York |
|
 |
212158
|
Memmert Gmbh+Co
|
Memmert Gmbh+Co |
ULP800 |
in Ovens
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
212159
|
Memmert Gmbh+Co
|
Memmert Gmbh+Co |
ULP800 |
in Ovens
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
195384
|
Prometrix
|
Prometrix |
RS50/e |
in Pharmaceutical Laboratory and Scientific Equipment
Prometrix RS50/e, Four Point Probe, 200mm, Resistivity Measurement:Prometrix RS50/e, Four Point Probe, 200mm, Resistivity MeasurementMissing the power supply. Head is non-functional. Needs replaced. S/N : 910T1
|
1
|
|
|
 |
East Fishkill, New York |
|
 |
219775
|
Qcept, ChemtriQ-5000, 300mm, S/N 09-0212-SP01091
|
Qcept, ChemtriQ-5000, 300mm, S/N 09-0212-SP01091 |
in Microscopes
Qcept, ChemtriQ-5000, 300mm, S/N 09-0212-SP01091:Qcept, ChemtriQ-5000, 300mm, S/N 09-0212-SP01091
|
1
|
|
|
F* |
East Fishkill, New York |
|
 |
204252
|
Quantum Focus Instru
|
Quantum Focus Instru |
Laser Signal Injection Microscope |
in Pharmaceutical Laboratory and Scientific Equipment
Quantum Focus Instruments, Laser Signal Injection Microscope:Quantum Focus Instruments, Laser Signal Injection Microscope
|
1
|
|
|
 |
East Fishkill, New York |
|
 |
208160
|
Revco
|
Revco |
ULT 2140-5- D30 -40C |
in Pharmaceutical Laboratory and Scientific Equipment
Revco, ULT 2140-5- D30 -40C, Elite Series Freezer:Revco, ULT2140-5- D30 -40C, Elite Series Freezer Bagged & Skidded in Warehouse
|
1
|
|
|
|
Malta, New York |
|
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