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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	191718	2007 Kaiser RXN3 Raman 532 nm 2 Watt Laser	2007 Kaiser RXN3 Raman 532 nm 2 Watt Laser		Spectrophotometers in Pharmaceutical Laboratory and Scientific Equipment 2007 Kaiser RXN3 Raman 532 nm 2 Watt Laser: 2007 Kaiser RXN3 Raman 532nm 2 Watt Laser Model: Kaiser RXN3-532 S/N: 0001541 *Unit is in Excellent Condition - The laser has 650 hrs on it. *Operations Manual is available	1			F*	Wilmington, Delaware
	204302	Ancosys	Ancosys	P13010 Ancolyzer	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Ancosys, P13010 Ancolyzer, : Ancosys, P13010 Ancolyzer,  Cu Plating Bath Analyzer	1				Malta, New York
	203072	Anton PAAR	Anton PAAR	MCR301	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Anton Paar, Viscometer, MCR301, : Anton Paar, Viscometer, MCR301,	1				Dresden, Saxony
	203103	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM	1				East Fishkill, New York
	203104	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM	1				East Fishkill, New York
	203105	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM	1				East Fishkill, New York
	203106	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM	1				East Fishkill, New York
	203107	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM	1				East Fishkill, New York
	180474	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8	1			F*	East Fishkill, NY
	180514	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8   Tool ID: KA03	1			F*	East Fishkill, NY
	195983	Applied Materials	Applied Materials	Elite MS MC	Scanning Electron Microscopes in Inspection Equipment Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection: Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection iii Multiple Units Available.  Please inquire !!!	1				Dresden, Saxony
	203074	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.	1				Dresden, Saxony
	203075	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.	1				Dresden, Saxony
	204039	Applied Materials	Applied Materials	SEMVision G3	Scanning Electron Microscopes in Inspection Equipment Applied Materials, SEMVision G3, DR-SEM, 300mm: Applied Materials, SEMVision G3, DR-SEM, 300mm missing some of the PC's in the electronic rack Bagged & Skidded in Warehouse 2006 Vintage	1				Taichung, Taichung City
	200564	APRIL 2019 -PRICE REDUCED! 200HP MOTOR 1800 RPM	APRIL 2019 -PRICE REDUCED! 200HP MOTOR 1800 RPM		Electric Motors - Other in Other Motors APRIL 2019 -PRICE REDUCED! 200HP MOTOR 1800 RPM : 200HP 1800RPM 449T PHASE/HZ: 3/60 VOLTAGE: 2300/4000 ENCLOSURE: TEFC INS/S.F.: F/1.15 FRAME: 449T MFG: USEM TYPE: JC APPROX WT: 2500LBS PURCHASED NEW IN 2016 - NEVER USED** PICK UP IN DEER PARK, TX; BUYER IS REPSONSIBLE FOR LOGISTICS COSTS AND SCHEDULING	1		7,000.00	F*	Deer Park, Texas
	192588	Asymtek	Asymtek	S-800	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment ASYMTEK, S-800, Adhesive Dispense Tool, : NORDSON ASYMTEK, S-820B, Adhesive Dispense Tool,  S-820B Specification and Facility Requirements Motion System: Type: Brushless DC servo motors, closed-loop with encoder feedback Encoder Resolution: 10 micrometer Positional Accuracy: ±0.075 mm (0.003 in.), 3 sigma Placement Accuracy: ±0.100 mm (0.004 in.), 3 sigma X-Y Acceleration: 0.25 g peak with S-curve jerk control X-Y Velocity: 500 mm/s (20 in./s) Z-Axis Velocity: 500 mm/s (20 in./s) X-Y Repeatability: ±0.025 mm (0.001 in.) Z-Axis Repeatability: ±0.025 mm (0.001 in.) Dispense Area: Work Envelope: 350 x 350 mm (14 x 14 in.) Z-Travel: 75 mm Tool Payload: 3 kg Workpiece Payload: 2 kg Vision and Lighting: Vision: Vision system with Automatic Pattern Recognition Lighting: Programmable, on-axis, red/blue LED, 256 steps Computer: Computer: Windows-based PC User interface: Color LCD flat-panel display; ASCII keyboard & pointing device; Ethernet network port Software: User Environment: Fluidmove® Operating System: Windows® Dimensions: See dimensional drawings on next page. Facility Requirements: System Footprint: 866 mm wide X 1123 mm deep (34 x 44 in.) Display extends unit 610 mm (24 in.) Height including light beacon: 2045 mm Air Supply: 621 kPa (6.1 atm, 90 psi) 3 CFM @ 90 psi (28 liters/hr = 1 SCFM) (May be higher depending upon application) Power (Mains): 200/240 VAC, 8.5 Amps (max), 50/60 Hz, Single Phase Weight: 364 kg (800 lbs)	1				Malta, New York
	176719	SELA	SELA	EM2	Sample Preparation - Other in Sample Preparation Automated TEM and SEM sample preparation system - SELA EM2: A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework. Tool is completed. Used within FE & BE failure analysis	1			F*	Regensburg, BY
	183772	Axcelis Technologies	Axcelis Technologies	Compact II	Clean Room Ovens in Heat Treating Equipment Axcelis Compact II, 300mm, H2 Reflow Furnace, : Axcelis Compact II, 300mm, H2 Reflow Furnace, C4 Processing. Tool ID: OVN222 Serial Number :  H08046	1			F*	Dresden, SN
	198362	Barr Murphy Atomizers	Barr Murphy Atomizers		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Barr Murphy Atomizers: Barr Murphy Atomizers - Qty. 3 available -	3			F*	Newark, Delaware
	196448	Biological Safety Cabinet, 6’, Class II, Type A2	Biological Safety Cabinet, 6’, Class II, Type A2		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Biological Safety Cabinet, 6’, Class II, Type A2: Biological Safety Cabinet, 6’, Class II, Type A2 The Baker Company SterilGARD III Advance, Model SG603A S/N 83216 Condition is excellent Unit appears to be in good working order with no noted damage Certification report 1/17, shows cabinet passed the following measurements: Velocity Profile, Hepa Filter Leak Test, Airflow Patterns, Alarm Performance Test.  Uniform Average velocity- Passed = 53lfm.  Inflow velocity - Passed = 279 lfm.  Downflow Velocity - Passed.	1			F*	Wilmington, Delaware
	204174	Blue M	Blue M	DDC 206CY Oven	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded in Warehouse	1				Singapore
	202879	Blue M	Blue M	DCC 206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded	1				Singapore
	181816	Blue M	Blue M	DCC-1406CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC-1406CY: Blue M Electric Oven,  DCC-1406CY Tool ID: OVEN-01 (PEA106)	1				Singapore
	203139	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC-206-EV-ST350: Blue M Electric Oven, DCC-206-EV-ST350	1				East Fishkill, New York
	203140	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC-206-EV-ST350: Blue M Electric Oven, DCC-206-EV-ST350	1				East Fishkill, New York
	183762	Blue M	Blue M	DDC-206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC-206CY, 200mm, oven: Blue M Electric Oven,  DCC-206CY, 200mm, oven Tool ID : OVEN-01 (PEA052)	1				Singapore
	196206	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake: Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake S/N :DCC-832 MULTIPLE UNITS AVAILABLE!!  Please inquire	1				East Fishkill, New York
	192687	Blue M	Blue M	LO-90-P	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment BLUEM, TPS, LO-90-P, Atmospheric Oven: BLUEM, TPS, LO-90-P, Oven Atmospheric oven capable of 260°C 120V 1500W	1				Malta, New York
	178423	Branson	Branson	5210DTH	Ultrasonic Baths in Cleaning and Degreasing Equipment Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm: Status: Bagged and Skidded	1			F*	Taichung, Taichung City
	192696	Brookfield	Brookfield	DV2THCBCO	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Brookfield, DV2THCBCO, Viscometer: Brookfield, DV2THCBCO, Viscometer Viscometer measures fluid viscosity at given shear rates	1				Malta, New York
	204303	Bruker, AFM, 300mm, InSight,	Bruker, AFM, 300mm, InSight,		Other Items in Microscopes Bruker, AFM, 300mm, InSight, : Bruker, AFM, 300mm, InSight,    In Fab.  Warm Idle	1				Malta, New York
	204304	Bruker, D8 Discover, 300mm, X-Ray Metrology	Bruker, D8 Discover, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8 Discover, 300mm, X-Ray Metrology: Bruker, D8 Discover, 300mm, X-Ray Metrology   In Lab,  Cold idle	1			F*	Dresden, Saxony
	195987	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology	1				Singapore
	199447	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology S/N 204500 2009  The tool is an automated High resolution X-ray diffractometer, clean room (class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300 mm wafer mapping capabilities. The D8 FABLINE consists of two stainless steal cabinets attached to each other. The first one is an X-ray analytical module composed of: radiation safe enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated optical set-ups, and all required supplies. The second is a handling module Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP insert for 200mm..	1				East Fishkill, New York
	199780	BTU Engineering	BTU Engineering	TCAS 181-7-72-E-36	Clean Room Ovens in Heat Treating Equipment BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace: BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace S/N: IBVT-1	1			F*	Burlington, Vermont
	190126	C-Sun Hot Air Circulation Oven	C-Sun Hot Air Circulation Oven		Ovens - Other in Ovens C-Sun Hot Air Circulation Oven: C-Sun Hot Air Circulation Oven Serial Number:  mEMSZN05 Products Name:  QHMO-7S Internal Dimension:   W 1200 mm x D 920 mm x H 960 mm External Dimension:   W 2260 mm x D 1728 mm x H 1955 mm Temperature Range:  RT+30°C to 550°C (oven tag says max 600°C) Power Source: AC 240V 3Ph 60 Hz Heater:  3.8W x 12 paces = 45.6 KW Materials:  Inside SUS310#, outside SS41# Steel with paint Intake: N2 flow capacity gauge *User’s manual is available	1			F*	Towanda, Pennsylvania
	195984	Cameca	Cameca	LEXFAB300	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment CAMECA, LEXFAB300, 300mm, Diffusion Measurement: CAMECA, LEXFAB300, 300mm, Diffusion Measurement	1				Dresden, Saxony
	205918	Camtek	Camtek	X-ACT	Microscopes - Other in Optical Microscopes CAMTEK X-ACT System with EM3: CAMTEK X-ACT System with EM3   Idle.  Shut Down.	1			N*	East Fishkill, New York
	204314	Check Point Technolo	Check Point Technolo	InfraScanTDM 300 TDE	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson: CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson	1				Malta, New York
	203282	E.A. Fischione Instr	E.A. Fischione Instr	1030	Polishing & Grinding Sample Prep Equipment in Sample Preparation E.A. Fischione Instruments Inc., 1030, NanoMill: E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep. Automated Sample Preparation System	1				East Fishkill, New York
	203280	E.A. Fischione Instr	E.A. Fischione Instr	1060	Polishing & Grinding Sample Prep Equipment in Sample Preparation E.A. Fischione Instruments Inc., 1060, NanoMill: E.A. Fischione Instruments Inc., 1060, NanoMill   Ion MIll	1				East Fishkill, New York
	200230	E.A. Fischione Instr	E.A. Fischione Instr	2040	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder: E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder Still in Use S/N: 23492	1				East Fishkill, New York
	202880	FEI	FEI	PHILIPS XL30S, SEM	Microscopes - Other in Optical Microscopes FEI PHILIPS XL30S, SEM: FEI PHILIPS XL30S, SEM   PHILIPS XL 30S FEG SEM & DX4I SYSTEM	1				Singapore
	203116	FEI	FEI	CLM + Dual Beam	Microscopes - Other in Optical Microscopes FEI, CLM + Dual Beam FIB, TEM Sample Prep tool: FEI, CLM + Dual Beam FIB, TEM Sample Prep tool In Lab.  Idle	1				Malta, New York
	202148	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool   Cold Shutdown in the lab	1				East Fishkill, New York
	203115	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   Connected Idle.	1				Malta, New York
	195353	FEI	FEI	DA300	Microscopes - Other in Optical Microscopes FEI, DA300, 300mm, FIB, Defect Analysis: FEI, DA300, 300mm, FIB, Defect Analysis S/N : D253	1				Taichung, Taichung City
	202895	FEI	FEI	DA300	Microscopes - Other in Optical Microscopes FEI, DA300, FIB, TEM Sample Preparation: FEI, DA300, FIB, TEM Sample Preparation   In RQA Lab.  Unhooked	1				Singapore
	202147	FEI	FEI	Ex-Situ Plucker	Microscopes - Other in Optical Microscopes FEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage	1				East Fishkill, New York
	203114	FEI	FEI	TEMLINK - KY02, 14771-003	Microscopes - Other in Optical Microscopes FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool	1				East Fishkill, New York
	199704	FEI	FEI	EXPIDA	Scanning Electron Microscopes in Inspection Equipment FEI, EXPIDA, Dual Beam FIB, 300mm : FEI, EXPIDA, Dual Beam FIB, 300mm  COLD.  Off Line remarketing@surplusglobal.com	1			F*	Dresden, Saxony
	203117	FEI	FEI	ExSolve 2 WTP EFEM	Microscopes - Other in Optical Microscopes FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB: FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab.  Warm shutdown. remarketing@surplusglobal.com	1				Malta, New York
	202853	FEI	FEI	FIB 200	Microscopes - Other in Optical Microscopes FEI, FIB, 200, TEM Sample Preparation: FEI, FIB, 200, TEM Sample Preparation in QRA Lab	1				Singapore
	202496	FEI	FEI	Helios 600 NanoLab	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment FEI, Helios 600, NanoLab, Dual Beam FIB, : FEI, Helios 600 NanoLab, Dual Beam FIB   S/N : D404   Vintage : 2009	1				Dresden, Saxony
	202837	FEI	FEI	Strata FIB 205	Microscopes - Other in Optical Microscopes FEI, Strata FIB 205, TEM Sample Preparation: FEI, Strata FIB 205, TEM Sample Preparation   remarketing@surplusglobal.com	1				Singapore
	203118	FEI	FEI	TEM LINK	Microscopes - Other in Optical Microscopes FEI, TEM Link: FEI, TEM Link	1			F*	Malta, New York
	203120	FEI	FEI	Technia G2 F20 TEM	Microscopes - Other in Optical Microscopes FEI, TEM Tecnai G2 F20, TEM,: FEI, TEM Tecnai G2 F20, TEM remarketing@surplusglobal.com	1				Malta, New York
	203121	FEI	FEI	Tecnai G2 F20	Microscopes - Other in Optical Microscopes FEI, TEM Tecnai G2 F20, TEM,: FEI, TEM Tecnai G2 F20, TEM,   On line, operational remarketing@surplusglobal.com	1				Malta, New York
	205917	FEI	FEI	V600	Microscopes - Other in Optical Microscopes FEI, V600, 4022 262 70111, Single Beam FIB, : FEI, V600, 4022 262 70111, Single Beam FIB,    In Lab.  Idle	1			N*	East Fishkill, New York
	190524	Fisher Sci	Fisher Sci	FD400 Binder Oven	Clean Room Ovens in Heat Treating Equipment Fisher Scientific, FD400, Precision Binder, 200mm: Fisher Scientific, FD400, Precision Binder, 200mm	1			F*	Singapore
	194537	Fisher Sci	Fisher Sci	FD 720 Binder Precision Oven	Clean Room Ovens in Heat Treating Equipment FISHER Scientific, FD720, Oven, 200mm: FISHER Scientific, FD720, Oven, 200mm FISHER Scientific, FD720, Precision Oven, 200mm In the Fab	1			F*	Singapore
	194540	Fisher Sci	Fisher Sci	FED720	Clean Room Ovens in Heat Treating Equipment FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm Precision Binder Oven S/N : 00-08042	1			F*	Singapore
	189084	Fisher Sci	Fisher Sci	FED 720	Clean Room Ovens in Heat Treating Equipment FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm In the Fab	1			F*	Singapore
	205226	GE MOTOR 40HP 1800RPM - NEW NEVER USED	GE MOTOR 40HP 1800RPM - NEW NEVER USED		Electric Motors - Other in Other Motors GE MOTOR 40HP 1800RPM - NEW NEVER USED: Purchased in 2018 - New, never used Mfg: General Electric Model# 5KS324SAA218D9 Specs: 40HP, 1800 RPM, phase/HZ 3/60, Voltage 460, Enclosure TEFC-SD, Insulation F, Frame 324TS Condition: sold “AS IS” with no warranties or liabilities. Dow recommends viewing to make your own determination of condition HOURS OF OPERATION: 8am-3pm, Mon - Thurs Contact: Jill Holder @ jholder@dow.com to set up an appointment to view only the item being offered Bidding closes on 05/15/19 at 3PM (sealed bid) or on the acceptance of a qualifying bid Posting date 4/17/19 LOAD OUT: LOADED ON BUYERS TRANSPORT FREE OF CHARGE DOW RESERVES THE RIGHT TO REJECT ANY AND/OR ALL BIDS	1			F*	Deer Park, Texas
	183208	GEMETEC	GEMETEC	Elymat III	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool: GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length.  A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured.  The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode). In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers.  Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent.  Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material.  Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination.  Measuring at different laser intensities allows major contaminants such as iron to be identified.  This is known as Injection Level Spectroscopy (ILS). Measurement Precision -Diffusion length:  5% over 10 repeated measurements Measurement Accuracy -Diffusion length:  10% compared with similar techniques.	1			F*	East Fishkill, NY
	195858	GRETA Multifermentor System & Gas Sampling Valves	GRETA Multifermentor System & Gas Sampling Valves		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment GRETA Multifermentor System & Gas Sampling Valves : Belach Bioteknik GRETA Multifermentor System & Gas Sampling Valves 6 x 2L stainless steel, pressure rated, fed-batch, fermenters, thermally sterilizable in place, fermentation system, with monitored and controlled operational parameters Manufacturer: Belach Bioteknik Model: GRETA Serial #: BE0101 *This unit was purchased in 2015 and only in use for a year *used infrequently and in working condition when decomissioned	1				Wilmington, Delaware
	202146	Hitachi	Hitachi	HF-2000	Microscopes - Other in Optical Microscopes Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging: Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM   1995 Vintage S/N : 6214-3 Un-hooked in lab.	1				East Fishkill, New York
	206013	Hitachi	Hitachi	Hitachi S-4500	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Hitachi S-4500 Scanning Electron Microscope: Hitachi S-4500 Scanning Electron Microscope	1		5,000.00	N*	Sunnyvale, California
	178296	Hitachi	Hitachi	Microanalysis System	Scanning Electron Microscopes in Inspection Equipment Hitachi, Metrology, Microanalysis System 300mm: Status: Bagged and Skidded	1			F*	Taichung, Taichung City
	178294	Hitachi	Hitachi	AS5000	Scanning Electron Microscopes in Inspection Equipment Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm: Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server	1			F*	Singapore
	205915	Hitachi	Hitachi	S-5200	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-5200 SEM, : Hitachi, S-5200 SEM,    In the lab.  Idle.	1			N*	East Fishkill, New York
	205916	Hitachi	Hitachi	S-5200	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-5200 SEM, : Hitachi, S-5200 SEM,    In the lab.  Idle.	1			N*	East Fishkill, New York
	203281	Hitachi	Hitachi	S-5200	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-5200, SEM, Ultra High Resolution: Hitachi, S-5200, SEM, Ultra High Resolution	1				East Fishkill, New York
	192497	Hitachi	Hitachi	S-5500	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-5500- Schanning Electron Microscope, 300mm: Hitachi, S-5500- Schanning Electron Microscope, 300mm remarketing@surplusglobal.com	1			F*	Malta, New York
	178287	Hitachi	Hitachi	S-7800	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-7800 CD-SEM, 200mm: Manufactured in 2008	1				Singapore
	205920	Hitachi	Hitachi	S-4800	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-8500, SEM, Failure Analysis SEM: Hitachi, S-8500, SEM, Failure Analysis SEM In Lab.  Cold idle.	1			N*	East Fishkill, New York
	195362	Hitachi	Hitachi	S-9380	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380, CD SEM, 300mm: Hitachi, S-9380, CD SEM, 300mm Tool is Bagged & Skidded in Warehouse S/N : 2146-01 remarketing@surplusglobal.com	1			F*	Singapore
	205450	Hitachi	Hitachi	S-9380	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380, CD SEM, 300mm: Hitachi, S-9380, CD SEM, 300mm Refurbished S/N: 89638 sales@surplusglobal.com	1			F*	Seoul
	205382	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm Bagged & Skidded in Warehouse remarketing@surplusglobal.com	1			F*	Taichung, Taichung City
	205383	Hitachi	Hitachi	S-9380 II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm remarketing@surplusglobal.com	1				Singapore
	205384	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm remarketing@surplusglobal.com	1				Singapore
	205385	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm   Bagged & Skidded in Warehouse remarketing@surplusglobal.com	1				Taichung, Taichung City
	205386	Hitachi	Hitachi	S-9380 II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm   Bagged & Skidded in Warehouse. remarketing@surplusglobal.com	1				Taichung, Taichung City
	205387	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm   Bagged & Skidded in Warehouse remarketing@surplusglobal.com	1				Taichung, Taichung City
	205388	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm   Bagged & Skidded in Warehouse remarketing@surplusglobal.com	1				Taichung, Taichung City
	204498	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm   Bagged & Skidded in Warehouse remarketing@surplusglobal.com	1				Taichung, Taichung City
	204499	Hitachi	Hitachi	S9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm remarketing@surplusglobal.com	1				Taichung, Taichung City
	197918	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm remarketing@surplusglobal.com	1				Taichung, Taichung City
	201534	Hitachi	Hitachi	S-9380 II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm S/N : 2160-02 Completely Refurbished remarketing@surplusglobal.com	1				Taichung, Taichung City
	178288	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380II, CD-SEM, 300mm: Manufactured in 2007; Status: Bagged and Skidded   remarketing@surplusglobal.com	1				Taichung, Taichung City
	178299	Hitachi	Hitachi	Z-5700	Scanning Electron Microscopes in Inspection Equipment Hitachi, Z-5700 Spectroscopy, 300mm: Status: Bagged and Skidded	1			F*	Taichung, Taichung City
	199446	HMI, EP3, 300mm, E-Beam Inspection System	HMI, EP3, 300mm, E-Beam Inspection System		Other Items in Microscopes HMI, EP3, 300mm, E-Beam Inspection System: HMI, EP3, 300mm, E-Beam Inspection System	1				East Fishkill, New York
	204305	HMI, eP4 320, 300mm, ebeam Inspection	HMI, eP4 320, 300mm, ebeam Inspection		Other Items in Microscopes HMI, eP4 320, 300mm, ebeam Inspection: HMI, eP4 320, 300mm, ebeam Inspection   In the Fab.  Cold Idle	1				Malta, New York
	199986	HMI, eScan 320, 300mm, ebeam Inspection	HMI, eScan 320, 300mm, ebeam Inspection		Other Items in Microscopes HMI, eScan 320, 300mm, ebeam Inspection: HMI, eScan 320, 300mm, ebeam Inspection   remarketing@surplusglobal.com	1			F*	Malta, New York
	181188	HSEB	HSEB	Axiospect 300	Wafer Inspection Microscopes in Optical Microscopes HSEB Axiospect 300, 300mm Wafer inspection microscope: HSEB Axiospect 300, 300mm Wafer inspection microscope Stereo Microscope Tool ID: OPI905 Serial Number: 41302020182 !!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!	1				Dresden, Saxony
	204267	HSEB	HSEB	NMT 300	Wafer Inspection Microscopes in Optical Microscopes HSEB NMT300, 300mm Wafer inspection microscope: HSEB NMT300, 300mm Wafer inspection microscope	1				Dresden, Saxony
	199709	HSEB	HSEB	Axiospect300	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 300, Optical Microscope, 300mm: HSEB, Axiospect 300, Optical Microscope, 300mm	1			F*	Dresden, Saxony
	199710	HSEB	HSEB	Axiospect300	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 300, Optical Microscope, 300mm: HSEB, Axiospect 300, Optical Microscope, 300mm Cold Offline !!! Multiple Units Available !!! Please inquire.	1				Dresden, Saxony
	202816	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1				Malta, New York
	202817	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1				Malta, New York
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Pharmaceuticals Manufacturing Equipment: Ancosys, Anton PAAR, Applied Materials, Inc., Asymtek, Axcelis Technologies GmbH, Blue M, Branson, Brookfield Engineering Labs, BTU Engineering, Cameca, Camtek, Check Point Technologies, E.A. Fischione Instr, FEI, Fisher Scientific, GEMETEC, Hitachi, HSEB, JEOL, Keithley, KLA-Tencor, Lyncee, MASS-PCB, McGraw Edison, Metron, NCB Network, NSC, NuAire Inc, Olympus, Park Systems Inc, Physical Electronics, Prometrix, Quantum Focus Instruments, Rigaku, Scientek Technology Corp, SDI Diagnostics Inc, SELA, Semilab, Suss MicroTec, VWR Scientific Products, Waters, Zeiss