About Us Contact Us Terms & Conditions
Serving  Our Guest Log in    Register View prices in  or ...    
ALL CATEGORIES   Semiconductor Mfg   View   Search-by-Specs   
View All Listings Under

Automatic Test Equipment


» Switch Major Category
Click an item's ID# below for its full specifications and source, or:

Group Listings into sub-categories under Automatic Test EquipmentGroup Listings into sub-categories under Automatic Test Equipment

List all 16 product types under Automatic Test EquipmentList all 16 product types under Automatic Test Equipment


  • To sort on a column, click the column head; click it again to reverse the sort.
  • Click the links under the Product Type column head to see other like items of that type.
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
203088
2 set of inline tester 
2 set of inline tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

2 set of inline tester:

2 set of inline tester

asset no:10005027 & 10005029


LOCATION: Wuxi
2 66,534.41 Regensburg, Bavaria
203132
Advantest  

Advantest  

HP83000 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

Advantest, HP83000, Tester:

Advantest,  HP83000, Tester, F330t , 128 pins

1   East Fishkill, New York
203134
Advantest  

Advantest  

HP83000 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

Advantest, HP83000, Tester, F330t , 256 pins:

Advantest, HP83000, Tester, F330t , 256 pins

1   East Fishkill, New York
203133
Advantest  

Advantest  

HP83000 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

Advantest, HP83000, Tester, F330t , 64 pins:

Advantest,  HP83000, Tester, F330t , 64pins

 

1   East Fishkill, New York
178236
Advantest  

Advantest  

T5771 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

Advantest, Test, T5771 300mm:
Status: Bagged and Skidded
1   F* Taichung, Taichung City
205908
Advantest  

Advantest  

V93k  

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

Advantest, Verigy 93000 PinScale Tester:

Advantest, Verigy 93000 PinScale Tester

 

- Qty-4 PS800 PinScale Boards (128 pins)
- Qty-4 MSDPS Boards.
- Small Testhead
1   East Fishkill, New York
185301
Agilent Tech  

Agilent Tech  

V3300 

List all items of this typeMemory Test Systems

in Device Testers

Agilent V3300, Vera Tester:
Versa Tester for FZTAT (Memory portion)
1   F* Singapore
199610
Hewlett Packard  

Hewlett Packard  

HP 83000 Tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

HP,Hewlett Packard HP83000 F330t , 128 pins:
HP,Hewlett Packard HP83000 F330t , 128 pins
Qty-2 PDPS Boards
Cooling Unit
No Computer
ToolID:  W231-56G4270AH
Condition: Fair (operational up till 2008 until powered down)
1   East Fishkill, New York
199609
Hewlett Packard  

Hewlett Packard  

83000 Tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

HP,Hewlett Packard HP83000 F330t , 256 pins:

HP,Hewlett Packard HP83000 F330t , 256 pins
Qty-2 PDPS Boards
Cooling Unit
No Computer
ToolID:  MGNE-36F1094AA
Condition: Fair (operational up till 2006 until powered down; removed some  test head pogo blocks)
1   East Fishkill, New York
199611
Hewlett Packard  

Hewlett Packard  

83000 Tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

HP,Hewlett Packard HP83000 F330t , 64 pins:
HP,Hewlett Packard HP83000 F330t , 64 pins
Qty-2 PDPS Boards
Cooling Unit
No Computer
ToolID:  W321-56G4270AK
Condition: Poor (Acquired as spare parts in 2008)
1   East Fishkill, New York
203171
LTX  

LTX  

Fusion HT 

List all items of this typeDigital Test Systems

in Device Testers

1   Regensburg, Bavaria
203172
LTX  

LTX  

Fusion HT 

List all items of this typeDigital Test Systems

in Device Testers

1   Regensburg, Bavaria
202806
LTX  

LTX  

Synchro II Tester 

List all items of this typeDigital Test Systems

in Device Testers

1   Regensburg, Bavaria
178282
Micromanipulator  

Micromanipulator  

9000-VIT 

List all items of this typeMicropositioners

in Manual Probers

Micro Manipulator, Probe, 300mm:
Status: Bagged and Skidded
1   F* Singapore
179115
Mosaid  

Mosaid  

MS4205 

List all items of this typeMemory Test Systems

in Device Testers

Mosaid, MS4205 , Manual Memory Tester, 300mm 200mm:
Model MS4205 General memory testers
200/400MHz, 16x16y addressing, 36 data
Wafer probe manipulators available, and chillers
Multiple units avaialble
1   F* Burlington, VT
178718
Mosaid  

Mosaid  

MS 4205 

List all items of this typeMemory Test Systems

in Device Testers

Mosaid, MS4205 , Manual Memory Tester, 300mm:
Mosaid, MS4205 , Manual Memory Tester,  300mm


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
1   F* Taichung, Taichung City
147228
Multitest  

Multitest  

MT8502 

List all items of this typeDIP Handlers

in Device Handlers

Multitest MT8502 TriTemp gravity Handler:
Multitest MT8502 TriTemp gravity Handler

Multitest MT8502 TriTemp gravity Handler
LOCATION: MchC
SERIAL NUMBER(S): na
1   F* Regensburg, BY
203189
NexGen Technologies  

NexGen Technologies  

Nexgen Prober 2013 Model 

List all items of this typeProbe Equipment - Other

in Wafer Probers

NEXGEN SEMI AUTOMATIC PROBER:

NexGen semi-automatic prober

for 3,4,5,6 & 8 inches wafer with hot chuck PCB to 130°.

More information available below and on the enclosed flyer :

Accuracy within 6 Microns and Maximum X/Y Speed 250 mm (10") sec

ZStage/Chuck 

- Range : 0.200" (other configurations available)

- Speed : 11 ms

Loader (Wafer Handler)

- Cassette capacity : 2 Standard; 1 sender, 1 receiver

- Wafer handling : Belt and vacuum arm

- Fine alignment : CCD Image Processing

- Hard Disk Drive : 60 -250 gig

- Disk Drives : USB, CD/RW, DVD Writer

- Display : 22" Color Screen Monitor

- Power consumption (included) : 1.5 KVA

Facilities Required

- Air : 75 PSI @ 3 CFM

- Vacuum : 25in/hg

- Dimensions 

InchesCm
48"w x 32"d x  60"h115 (L) x 80 (l) x 140 (h)

 - Weight 

LbKg
700317
1   Le Puy-Sainte-Réparade, Provence-Alpes-Côte d'Azur
196680
Rasco  

Rasco  

SO2000 

List all items of this typeSMD Handlers

in Device Handlers

Rasco SO2000:

Rasco SO2000

Specifications

  • Handling, Inspection, Packing System
  • Throughput up to 16,000 ICs/hour
  • Index time down to 0.45 s
  • Conversion kits for all SO and QFN devices down to 1.5 mm, incl. QFN thin
  • Full split kit capability
  • Ambient/hot/tri-temp -60°C ... +175°C
  • Large variety of contactors: Kelvin, RF, Pogo, ECT, Johnstech, Yamaichi, C-Type
  • MEMS applications for magnetic, optical, pressure and acoustic sensors
  • Multiple input and output modules:
    Tube, bowl (SOT and QFN), metal magazine, bulk, tape and reel
  • Rasco Vision System: Mark/3D-lead/intape inspection
1   F* El Segundo, California
204293
Rudolph Research  

Rudolph Research  

PCI 

List all items of this typeProbe Equipment - Other

in Wafer Probers

Rudolph, Probe Card Interface, Teradyne UltraFlex Motherboard:

Rudolph, Probe Card Interface, Teradyne UltraFlex Motherboard

1   Malta, New York
178434
Tel  

Tel  

78S 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

TEL, 78S Probe, 200mm:
Manufactured in 1998; Status: Bagged and Skidded
1   Singapore
204920
Tel  

Tel  

Precio  

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

TEL, PRECIO, 300mm Wafer Prober:

TEL, PRECIO, 300mm Wafer Prober

S/N: PP01650

remarketing@surplusglobal.com

 

 

1   F* Malta, New York
178433
Tel  

Tel  

78S 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

TEL, Probe, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
1   Singapore
202836
Tel  

Tel  

78S 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

TEL, Probe, 200mm:

TEL, Probe, 200mm

TEL 78S AUTO PROBER

Bagged & Skidded in Warehouse

 

 

1   Singapore
202601
Teradyne  

Teradyne  

J971-61 SML 256CH1TH 

List all items of this typeDigital Test Systems

in Device Testers

Teradyne J971:

Tool in good condition. Still in running production. Tool will be released from production beginning of July 2019

 

 

1   Regensburg, Bavaria
192689
Wentworth Labs  

Wentworth Labs  

MP-2300 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

Wentworth, MP-2300, Prober:
Wentworth, MP-2300, Prober1
TIN9028
1   Malta, New York
192690
Wentworth Labs  

Wentworth Labs  

MP-2300 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

Wentworth, MP-2300, Prober:
Wentworth, MP-2300, Prober
1   F* Malta, New York


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Automatic Test Equipment:
Advantest, Agilent Technologies, Hewlett Packard, LTX, Micromanipulator, Mosaid, Multitest , NexGen Technologies, Rasco, Rudolph Research, Tel, Teradyne, Wentworth Labs