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Automatic Test Equipment


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List all 16 product types under Automatic Test EquipmentList all 16 product types under Automatic Test Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
203132
Advantest  

Advantest  

HP83000 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   N* East Fishkill, New York
Advantest, HP83000, Tester:

Advantest,  HP83000, Tester, F330t , 128 pins

203134
Advantest  

Advantest  

HP83000 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   N* East Fishkill, New York
Advantest, HP83000, Tester, F330t , 256 pins:

Advantest, HP83000, Tester, F330t , 256 pins

203133
Advantest  

Advantest  

HP83000 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   N* East Fishkill, New York
Advantest, HP83000, Tester, F330t , 64 pins:

Advantest,  HP83000, Tester, F330t , 64pins

 

178236
Advantest  

Advantest  

T5771 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   F* Taichung, Taichung City
Advantest, Test, T5771 300mm:
Status: Bagged and Skidded
199548
Advantest  

Advantest  

V93000  

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   East Fishkill, New York
Advantest, Verigy 93000 PinScale Tester:
Advantest, Verigy 93000 PinScale Tester

Advantest 2002 V93000 Single Denisty Tester Manipulator Large Testhead Qty-544   P600 pins Qty-6     GPDPS Boards TIA -     Time Interval Anaylzer WDD -     1Ghz/320Msps 12-bit  WGD -     500Msps 12-bit AWGDigitizer AMC (E4425B)  - Qty-2 Alternate Master Clocks.TIA (DTS2077)  - WaveCrest Instrument.NP2500    Qty-1 Board.WGE -  30msps 16-bit AWG
185301
Agilent Tech  

Agilent Tech  

V3300 

List all items of this typeMemory Test Systems

in Device Testers

1   F* Singapore
Agilent V3300, Vera Tester:
Versa Tester for FZTAT (Memory portion)
202886
Cascade Microtech  

Cascade Microtech  

Alessi REL-6100 

List all items of this typeProbe Equipment - Other

in Wafer Probers

1   N* Singapore
Cascade Microtech, Alessi REL-6100, 200mm Wafer Probe:

Cascade Microtech, Alessi REL-6100, 200mm Wafer Probe

179384
LTX  

LTX  

PPS 

List all items of this typeAnalog Test Systems

in Device Testers

1   F* Regensburg, BY
179385
LTX  

LTX  

PPS 

List all items of this typeAnalog Test Systems

in Device Testers

1   F* Regensburg, BY
199610
Hewlett Packard  

Hewlett Packard  

HP 83000 Tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   East Fishkill, New York
HP,Hewlett Packard HP83000 F330t , 128 pins:
HP,Hewlett Packard HP83000 F330t , 128 pins
Qty-2 PDPS Boards
Cooling Unit
No Computer
ToolID:  W231-56G4270AH
Condition: Fair (operational up till 2008 until powered down)
199609
Hewlett Packard  

Hewlett Packard  

83000 Tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   East Fishkill, New York
HP,Hewlett Packard HP83000 F330t , 256 pins:

HP,Hewlett Packard HP83000 F330t , 256 pins
Qty-2 PDPS Boards
Cooling Unit
No Computer
ToolID:  MGNE-36F1094AA
Condition: Fair (operational up till 2006 until powered down; removed some  test head pogo blocks)
199611
Hewlett Packard  

Hewlett Packard  

83000 Tester 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   East Fishkill, New York
HP,Hewlett Packard HP83000 F330t , 64 pins:
HP,Hewlett Packard HP83000 F330t , 64 pins
Qty-2 PDPS Boards
Cooling Unit
No Computer
ToolID:  W321-56G4270AK
Condition: Poor (Acquired as spare parts in 2008)
202806
LTX  

LTX  

Synchro II Tester 

List all items of this typeDigital Test Systems

in Device Testers

1   N* Regensburg, Bavaria
178282
Micromanipulator  

Micromanipulator  

9000-VIT 

List all items of this typeMicropositioners

in Manual Probers

1   F* Singapore
Micro Manipulator, Probe, 300mm:
Status: Bagged and Skidded
179115
Mosaid  

Mosaid  

MS4205 

List all items of this typeMemory Test Systems

in Device Testers

1   F* Burlington, VT
Mosaid, MS4205 , Manual Memory Tester, 300mm 200mm:
Model MS4205 General memory testers
200/400MHz, 16x16y addressing, 36 data
Wafer probe manipulators available, and chillers
Multiple units avaialble
178718
Mosaid  

Mosaid  

MS 4205 

List all items of this typeMemory Test Systems

in Device Testers

1   F* Taichung, Taichung City
Mosaid, MS4205 , Manual Memory Tester, 300mm:
Mosaid, MS4205 , Manual Memory Tester,  300mm


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
147228
Multitest  

Multitest  

MT8502 

List all items of this typeDIP Handlers

in Device Handlers

1   F* Regensburg, BY
Multitest MT8502 TriTemp gravity Handler:
Multitest MT8502 TriTemp gravity Handler

Multitest MT8502 TriTemp gravity Handler
LOCATION: MchC
SERIAL NUMBER(S): na
196680
Rasco  

Rasco  

SO2000 

List all items of this typeSMD Handlers

in Device Handlers

1   F* El Segundo, California
Rasco SO2000:

Rasco SO2000

Specifications

  • Handling, Inspection, Packing System
  • Throughput up to 16,000 ICs/hour
  • Index time down to 0.45 s
  • Conversion kits for all SO and QFN devices down to 1.5 mm, incl. QFN thin
  • Full split kit capability
  • Ambient/hot/tri-temp -60°C ... +175°C
  • Large variety of contactors: Kelvin, RF, Pogo, ECT, Johnstech, Yamaichi, C-Type
  • MEMS applications for magnetic, optical, pressure and acoustic sensors
  • Multiple input and output modules:
    Tube, bowl (SOT and QFN), metal magazine, bulk, tape and reel
  • Rasco Vision System: Mark/3D-lead/intape inspection
179386
LTX  

LTX  

PVI 

List all items of this typeAnalog Test Systems

in Device Testers

1   F* Regensburg, BY
179387
LTX  

LTX  

PVI 

List all items of this typeAnalog Test Systems

in Device Testers

1   Regensburg, BY
178438
TCL  

TCL  

M5100 

List all items of this typeProbe Equipment - Other

in Wafer Probers

1   Singapore
TCL, M5100 Accessories/Others, 200mm:
Manufactured in 2008; Status: Cold shutdown
202893
Tel  

Tel  

P-12XL 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   N* Singapore
TEL P-12XL Auto Wafer Prober 300mm:

TEL P-12XL Auto Wafer Prober 300mm

 

MAJOR PARTS MISSING !!!

 

194737
Tokyo Electron Ltd  

Tokyo Electron Ltd  

P-12XL 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   East Fishkill, New York
TEL P-12XL Auto Wafer Prober 300mm:
TEL P-12XL Auto Wafer Prober 300mm

Single Port Loader
Non-Clean SACC
D250 Chiller

P-12XL Base with Single FOUP Loader (front)

350mm combo base headplate 

WAPP , 2-Zone

-20C to 200C Triax (GOLD; D250) Thermal Chuck

  NOTE: Useable range -20C -- 150C, D250 chiller provided.

Remote Mount Monitor with 15' cable

Ethernet

GPIB with cable

Rs232 with Cable

S/N: PH01606

178434
Tel  

Tel  

78S 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   Singapore
TEL, 78S Probe, 200mm:
Manufactured in 1998; Status: Bagged and Skidded
178433
Tel  

Tel  

78S 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   Singapore
TEL, Probe, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
202836
Tel  

Tel  

78S 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   N* Singapore
TEL, Probe, 200mm:

TEL, Probe, 200mm

TEL 78S AUTO PROBER

Bagged & Skidded in Warehouse

 

 

202601
Teradyne  

Teradyne  

J971-61 SML 256CH1TH 

List all items of this typeDigital Test Systems

in Device Testers

1   N* Regensburg, Bavaria
192478
FET/TEST,INC MADE IN  

FET/TEST,INC MADE IN  

3602E 

List all items of this typeAutomatic Test Equipment - Other

in Automatic Test Equipment

1   Regensburg, Bavaria
TESTER-FET_3602E:
TESTER-FET FROM RGB (LONG TC) (Recl fr Bx - 65010)
202807
TSK  

TSK  

A-PM-90A 

List all items of this typeDigital Test Systems

in Device Testers

1   N* Regensburg, Bavaria
178439
TSK  

TSK  

X1412 

List all items of this typeProbe Equipment - Other

in Wafer Probers

1   Singapore
TSK, Prober Inking System, 200mm:
Manufactured in 2008; Status: Cold shutdown
192689
Wentworth Labs  

Wentworth Labs  

MP-2300 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   Malta, New York
Wentworth, MP-2300, Prober:
Wentworth, MP-2300, Prober1
TIN9028
192690
Wentworth Labs  

Wentworth Labs  

MP-2300 

List all items of this typeAutomatic Wafer Probers

in Wafer Probers

1   F* Malta, New York
Wentworth, MP-2300, Prober:
Wentworth, MP-2300, Prober


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Automatic Test Equipment:
Advantest, Agilent Technologies, Cascade Microtech, FET/TEST,INC MADE IN, Hewlett Packard, LTX, Micromanipulator, Mosaid, Multitest , Rasco, Tel, Telemark Cryogenics Limited, Teradyne, Tokyo Electronics Limited, Tokyo Semitsu Kogaku, TSK, Wentworth Labs