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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   209845 200mm THIN WAFER Loader NSX  200mm THIN WAFER Loader NSX  Test & Measurement - Other in Test & Measurement Equipment 200mm THIN WAFER Loader NSX: 200mm THIN WAFER Loader NSX “NIDEC SANKYO Corporation” , Model: “SR8220-019”, SN. „FR00891253“ 1   Dresden, Saxony 256665 Mitutoyo   Mitutoyo     Test & Measurement - Other in Test & Measurement Equipment Dial gauge: Measure wafer/tape thickness. Location is at Infineon Penang. 2   N* George Town, Penang 253754 FILMETRICS   FILMETRICS   F50  Test & Measurement - Other in Test & Measurement Equipment 1   Dresden, Saxony 221743 Mitutoyo   Mitutoyo   QVT1-X606P1L-D  Optical Test & Measurement Equipment - Other in Optical Test & Measurement Equipment For Sale! Mitutoyo CNC Vision Measuring Machine : In use until October 2020, when it was phased out from production. Since then, it's stored in a dry and heated environment. Besides minor marks and scratches caused by trolleys, it's in an excellent condition. It was maintained regularly by site maintenance, and went through yearly inspection by OEM, including calibration. Standard machine, with special adapter plates used at Infineon. It's with software for series production, able to measure multiple modules in row. Saves date to local CSV file format and writing measurement data to Orbit system., Possibility to upgrade tactile measuring function! 1 62,174.74 Warstein, North Rhine-Westphalia 254068 Keithley Instruments   Keithley Instruments   S425  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S425, s/n: QMO2572: Keithley standard matrix kerf tester 1   Burlington, Vermont 254069 Keithley Instruments   Keithley Instruments   S425  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S425, s/n: QMO2573: Kerf Parametric Tester 1   Burlington, Vermont 254076 Keithley Instruments   Keithley Instruments   S425  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S425, s/n: QMO2591: Kerf Parametric Tester 1   Burlington, Vermont 254070 Keithley Instruments   Keithley Instruments   S425  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S425, s/n: QMO2593: Kerf Parametric Tester 1   Burlington, Vermont 254071 Keithley Instruments   Keithley Instruments   S475  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S475, s/n: QMO2733: 25 pin kerf tester 1   Burlington, Vermont 254072 Keithley Instruments   Keithley Instruments   S475  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S475, s/n: QMO2734: 1x25 Kerf Tester 1   Burlington, Vermont 254073 Keithley Instruments   Keithley Instruments   S475  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S475, s/n: QMO2738: 1x25 pin kerf tester 1   Burlington, Vermont 254074 Keithley Instruments   Keithley Instruments   S475  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S475, s/n: QMO2739: 1x25 Kerf Tester 1   Burlington, Vermont 254075 Keithley Instruments   Keithley Instruments   S475  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S475, s/n: QMO2792: Keithley 475 Kerf Tester 1   Burlington, Vermont 254077 Keithley Instruments   Keithley Instruments   S600  Test & Measurement - Other in Test & Measurement Equipment KEITHLEY S600, s/n: QMO4104: 25 pin kerf tester 1   Burlington, Vermont 254235 Keithley Instruments   Keithley Instruments   S630  Test & Measurement - Other in Test & Measurement Equipment 1   Burlington, Vermont 242857 KLA   KLA   eS32  Test & Measurement - Other in Test & Measurement Equipment KLA eS32 E-beam Wafer Inspection 200mm: eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This system provides comprehensive, high-resolution inspection of both masks and wafers with unparalleled accuracy. The unit uses a proprietary optical probe to scan masks and wafers to detect defects and irregularities with a resolution reaching down to 1 micron. This high-precision scanning allows for comprehensive inspection of the entire surface of both the mask and wafer. The machine also includes powerful image processing and analysis algorithms which automatically detect defects, categorize them, and track their locations. KLA eS32 also includes a suite of automated defect correction tools which can rapidly repair standard and complex defects. In addition to its exhaustive defect detection capabilities, this tool also allows for statistical process control (SPC) analysis to ensure production processes maintain consistent quality and accuracy over time. TENCOR ES 32 also includes a user-friendly interface that makes it easy to operate and manage the asset. This user interface is highly customizable, allowing users to quickly change model settings, view detailed inspection reports, and receive real-time notifications of detected defects. In summary, KLA ES 32 is a high-performance mask and wafer inspection equipment that offers superior detection accuracy, automated defect correction, comprehensive statistical process control (SPC) analysis, and an easy-to-use user interface. This system can be used to monitor production lines, resulting in improved manufacturing quality, increased yield, and cost savings. 1   Austin, Texas 256628 Mecmesin   Mecmesin   MultiTest 2.5-dV  Test & Measurement - Other in Test & Measurement Equipment Mecmesin MultiTest 2.5-dV : Mecmesin MultiTest 2.5-dV Messdosen mit je 500N (Kal.-Nr.: 1266M und Kal.-Nr.: 1270M) inklusive Koffer Einhausung mit Plexiglas, magnetischer Schiebtür Dokumentation 1   N* Regensburg, Bavaria 241426 Rudolph Research   Rudolph Research   Scale  Test & Measurement - Other in Test & Measurement Equipment 1   Regensburg, Bavaria 247183 Nova   Nova   2040 dry  Test & Measurement - Other in Test & Measurement Equipment 1 lot   Dresden, Saxony 256662 The Scatter Work   The Scatter Work   uScan 670  Test & Measurement - Other in Test & Measurement Equipment Surface roughness tester: Measure the surface roughness of pre & post grind wafer backside. Location is at Infineon Penang. 1   N* George Town, Penang

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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Items from the following manufacturers are offered under Test & Measurement Equipment: FILMETRICS, Keithley Instruments, KLA, Mecmesin, Mitutoyo, Nova, Rudolph Research, The Scatter Work