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	View All Listings Under Automatic Test Equipment » Switch Major Category		Click an item's ID# below for its full specifications and source, or: Group Listings into sub-categories under Automatic Test Equipment List all 16 product types under Automatic Test Equipment

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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   256471 Accretech   Accretech   UF3000  Automatic Wafer Probers in Wafer Probers ACCRETCH UF3000 Prober: Prober modal UF3000 Manipulator Yes (For Advantest T5376  test head) Type of tester head plate Advantest T5376 Prober power supply rate 240V Chuck Type (Nickel, Gold, etc.) Nickel type Chuck Temperature  support  Room temp until 150 C Air Cool for chuck No Auto Probe Card (APC) Changer Yes Network / Connection  Yes Prober System  Version  3S14C0E1 Cleaning pad module Yes 1   N* Bayan Lepas, Penang 253002 Delta Design   Delta Design   MATRIX DM8880  SMD Handlers in Device Handlers 1   Regensburg, Bavaria 252923 Multitest   Multitest   MT8589  DIP Handlers in Device Handlers 1   Regensburg, Bavaria 252922 Multitest   Multitest   MT8589  DIP Handlers in Device Handlers 1   Regensburg, Bavaria 252926 Rasco   Rasco   SO1000T  DIP Handlers in Device Handlers 1   Regensburg, Bavaria 252925 Rasco   Rasco   SO1800T  DIP Handlers in Device Handlers 1   Regensburg, Bavaria 252924 Rasco   Rasco   SO1800T  DIP Handlers in Device Handlers 1   Regensburg, Bavaria 256501 Advantest   Advantest   T5376 Memory Tester  Memory Test Systems in Device Testers Penang Advantest T5376 Memory Tester (Wafer Level Sorting): Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN109 MF Date: APR, 2004 Location: KGD Penang Asset Number : ZNPG-103864-0 1   N* George Town, Penang 256546 Advantest   Advantest   T5376 Memory Tester  Memory Test Systems in Device Testers Penang Advantest T5376 Memory Tester (Wafer Level Sorting): Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN129 MF Date: Aug, 2004 Location: KGD Penang Asset Number : ZNPG-101412-0 1   N* George Town, Penang 256548 Advantest   Advantest   T5376 Memory Tester  Memory Test Systems in Device Testers Penang Advantest T5376 Memory Tester (Wafer Level Sorting): Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN130 MF Date: Aug, 2004 Location: KGD Penang Asset Number : ZNPG-101413-0 1   N* George Town, Penang 254225 SemiProbe   SemiProbe   PS4L SA12  Probe Equipment - Other in Wafer Probers SEMI PROBE PS4L SA12, 300mm, s/n: F081X5002462000: SEMIPROBE PS4L Maintool / TIS2301-T MENV UPGR - BENCH VERIFICATION SEMIPROBE STATION 1   Malta, New York 257237 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257244 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257240 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257241 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257242 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257249 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257238 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257247 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 254080 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers TEL P12XL, 300mm, s/n: PH01610: TEL P12XL Prober dual foup VIP3 1   Burlington, Vermont 257246 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257239 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257245 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257248 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 257243 Tel   Tel   P12XL  Probe Equipment - Other in Wafer Probers 1   N* Burlington, Vermont 254124 Tel   Tel   P8  Probe Equipment - Other in Wafer Probers 1   Singapore 254122 Tel   Tel   P8  Probe Equipment - Other in Wafer Probers 1   Singapore 254123 Tel   Tel   P8  Probe Equipment - Other in Wafer Probers 1   Singapore 254121 Tel   Tel   P8  Probe Equipment - Other in Wafer Probers 1   Singapore 254230 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254227 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254228 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254229 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254231 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254234 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254232 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254233 Tel   Tel   P8XL  Probe Equipment - Other in Wafer Probers 1   Burlington, Vermont 254373 Tel   Tel   Precio  Probe Equipment - Other in Wafer Probers 1   Malta, New York 254244 Tel   Tel   Precio  Probe Equipment - Other in Wafer Probers 1   Malta, New York 226733 Tel   Tel   CR385PH  Automatic Test Equipment - Other in Automatic Test Equipment TEL, CR385PH, S/N 067004: TEL, CR385PH, S/N 067004 1   Burlington, Vermont 226738 Tel   Tel   LTI unit  Automatic Test Equipment - Other in Automatic Test Equipment TEL, LTI unit, S/N 12007: TEL, LTI unit, S/N 12007 1   Burlington, Vermont 242652 Tel   Tel   P12XL Prober  Probe Equipment - Other in Wafer Probers TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A: TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A 1   Burlington, Vermont 242878 Tel   Tel   P12XLn  Probe Equipment - Other in Wafer Probers TEL, P12XLn, 300mm, S/N PN00453: TEL, P12XLn, 300mm, S/N PN00453 1   Singapore 250002 Tel   Tel   P12XLn  Probe Equipment - Other in Wafer Probers 1   Dresden, Saxony 250003 Tel   Tel   P12XLn  Probe Equipment - Other in Wafer Probers 1   Singapore 236302 Teradyne   Teradyne   Catalyst Mixed Signal  Mixed Signal Test Systems in Device Testers Teradyne Catalyst: TESTER ID           : CAT-004 Model  : CATALYST MIXED SIGNAL Manufacturer   : Teradyne Serial No.  : 0027H256  Date Released  : 15/09/00 COMPUTER HW/SW: Tester Computer  : Suns ULTRA60 / 256 MB RAM User Computer  : Suns ULTRA5 / 256 MB RAM HD  : 8.5 GB Software  : Solaris –OS rev. 5.5.1 IMAGE Rev.  : 7.0 D8 Tester DIG: Data rate  : 200 MHZ DP CH  : 256 CH Tester DC: DC SRC Matrix  : 4 CH DC DUT SRC  : 8 CH AAPU PIN  : 48 CH STORED DATA BITS  : 48 CH System PPMU  : 1 CH TESTER AC: PLFS/PLFD  : 4CH VHF AWG400  : 1CH VHF DIG  : 2CH PAC Card Cage  : 3 VREG  : 2 CH DOCKING/MANIPULATOR: Docking  : SNR DOCKING Manipulator  : UNIVERSAL Manipulator Input Power: Power Supply  : 380 VAC, / 48 Amp        50/60Hz, 3 phase Power Consumption Rate   : 31.6 KVA (Max) 1   Regensburg, Bavaria 249730 Teradyne   Teradyne   J750  Digital Test Systems in Device Testers Teradyne J750: Teradyne J750 Testequipment 1   Regensburg, Bavaria 249731 Teradyne   Teradyne   J750  Digital Test Systems in Device Testers Teradyne J750: Teradyne J750 Testequipment 1   Regensburg, Bavaria 249732 Teradyne J750  Teradyne J750  Digital Test Systems in Device Testers Teradyne J750: Teradyne J750 Tester 1   Regensburg, Bavaria 254116 FET/TEST,INC MADE IN   FET/TEST,INC MADE IN   FET 3602E  Digital Test Systems in Device Testers 1   Regensburg, Bavaria

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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Items from the following manufacturers are offered under Automatic Test Equipment: Accretech, Advantest, Delta Design, FET/TEST,INC MADE IN, Multitest , Rasco, SemiProbe, Tel, Teradyne