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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	199994	3" BALL VALVE 316 S/S	3" BALL VALVE 316 S/S		Valves - Other in Valves	1		1,500.00	F*	Deer Park, Texas
3" BALL VALVE 316 S/S : 3" XOMOX PLUG VALVE, 2067-6-6--2-N 150" FLANGED, BODY, A351-CF8M, PLUG A351-CF8M SLEEVE 15% GF PTFE, BARE STEM, FULL PORT VALVE TAG: 2067-6-6-P2-N ORIG PURCHASED IN 2013 - NEVER PUT INTO PRODUCTION LOCATED @ DEER PARK, TX
	200564	9/13-PRICE REDUCED! 200HP MOTOR 1800 RPM	9/13-PRICE REDUCED! 200HP MOTOR 1800 RPM		Electric Motors - Other in Other Motors	1		10,000.00	F*	Deer Park, Texas
9/13-PRICE REDUCED! 200HP MOTOR 1800 RPM : 200HP 1800RPM 449T PHASE/HZ: 3/60 VOLTAGE: 2300/4000 ENCLOSURE: TEFC INS/S.F.: F/1.15 FRAME: 449T MFG: USEM TYPE: JC APPROX WT: 2500LBS PURCHASED NEW IN 2016 - NEVER USED** PICK UP IN DEER PARK, TX; BUYER IS REPSONSIBLE FOR LOGISTICS COSTS AND SCHEDULING
	190444	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment	1			F*	Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00101DA-01 2006 DOM Still in the fab, warm idle
	190445	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment	1				Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00103CB-01 DOM: 2006
	190446	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment	1			F*	Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00101GB-01 DOM: 2007
	178308	Accretech	Accretech	Win-Win 50	Optical Inspection - Other in Optical Inspection Equipment	1			F*	Taichung, Taichung City
Accretech, Win-Win 50,Bright Field Inspection, 300mm: Manufactured in 2005; Status: Bagged and Skidded !!!MULTIPLE UNITS AVAILABLE!!! Please inquire
	203072	Anton PAAR	Anton PAAR	MCR301	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			N*	Dresden, Saxony
Anton Paar, Viscometer, MCR301, : Anton Paar, Viscometer, MCR301,
	180474	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8
	180514	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8   Tool ID: KA03
	203103	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203104	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203105	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203106	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203107	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	178309	AMAT	AMAT	Complus	Optical Inspection - Other in Optical Inspection Equipment	1				Singapore
Applied Materials, Complus, Particle Measurement, 300mm: Manufactured in 2007; Status: Bagged and Skidded MULTIPLE UNITS AVAILALBE!!! Please inquire.
	195983	Applied Materials	Applied Materials	Elite MS MC	Scanning Electron Microscopes in Inspection Equipment	1				Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection: Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection iii Multiple Units Available.  Please inquire !!!
	203074	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes	1			N*	Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.
	203075	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes	1			N*	Santa Clara, California
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.
	178310	AMAT	AMAT	Uvision 200	Optical Inspection - Other in Optical Inspection Equipment	1				Taichung, Taichung City
Applied Materials, Uvision 200, Bright Field Inspection, 300mm: Manufactured in 2005; Status: Bagged and Skidded
	196827	ASML	ASML	AT 850	Optical Inspection - Other in Optical Inspection Equipment	1				East Fishkill, New York
ASML AT-850, 300mm, KrF 248nm Scanner:   ASML AT-850D, 300mm, KrF 248nm Scanner,  S/N : m5946 Known Tool Issues: Currently power off with Lens gas flowing, tool had issue with illumination rack that will require replacement.  The tool currently has all of the parts present, but they have not necessarily been calibrated or setup with the tool being off.  Laser has 104.5 Billion pulses on it.  Components were good when shutdown. The Beam steering hardware in not functional, and the ACC needs an heat exchanger installed   Tool ID: GB03
	192588	Asymtek	Asymtek	S-800	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
ASYMTEK, S-800, Adhesive Dispense Tool, : NORDSON ASYMTEK, S-820B, Adhesive Dispense Tool,  S-820B Specification and Facility Requirements Motion System: Type: Brushless DC servo motors, closed-loop with encoder feedback Encoder Resolution: 10 micrometer Positional Accuracy: ±0.075 mm (0.003 in.), 3 sigma Placement Accuracy: ±0.100 mm (0.004 in.), 3 sigma X-Y Acceleration: 0.25 g peak with S-curve jerk control X-Y Velocity: 500 mm/s (20 in./s) Z-Axis Velocity: 500 mm/s (20 in./s) X-Y Repeatability: ±0.025 mm (0.001 in.) Z-Axis Repeatability: ±0.025 mm (0.001 in.) Dispense Area: Work Envelope: 350 x 350 mm (14 x 14 in.) Z-Travel: 75 mm Tool Payload: 3 kg Workpiece Payload: 2 kg Vision and Lighting: Vision: Vision system with Automatic Pattern Recognition Lighting: Programmable, on-axis, red/blue LED, 256 steps Computer: Computer: Windows-based PC User interface: Color LCD flat-panel display; ASCII keyboard & pointing device; Ethernet network port Software: User Environment: Fluidmove® Operating System: Windows® Dimensions: See dimensional drawings on next page. Facility Requirements: System Footprint: 866 mm wide X 1123 mm deep (34 x 44 in.) Display extends unit 610 mm (24 in.) Height including light beacon: 2045 mm Air Supply: 621 kPa (6.1 atm, 90 psi) 3 CFM @ 90 psi (28 liters/hr = 1 SCFM) (May be higher depending upon application) Power (Mains): 200/240 VAC, 8.5 Amps (max), 50/60 Hz, Single Phase Weight: 364 kg (800 lbs)
	176719	SELA	SELA	EM2	Sample Preparation - Other in Sample Preparation	1			F*	Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2: A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework. Tool is completed. Used within FE & BE failure analysis
	183772	Axcelis Technologies	Axcelis Technologies	Compact II	Clean Room Ovens in Heat Treating Equipment	1			F*	Dresden, SN
Axcelis Compact II, 300mm, H2 Reflow Furnace, : Axcelis Compact II, 300mm, H2 Reflow Furnace, C4 Processing. Tool ID: OVN222 Serial Number :  H08046
	202477	Balzers	Balzers	BAP800	Physical Vapor Deposition Equipment in Deposition Equipment	1			N*	Villach, Carinthia
Balzers BAP 800: Batch Evaporation tool Tool is until 1.2019 in production.
	202478	Balzers	Balzers	BAP800	Physical Vapor Deposition Equipment in Deposition Equipment	1			N*	Villach, Carinthia
Balzers BAP 800: Batch Evaporation Tool Tool is until 01.2019 in production.
	198362	Barr Murphy Atomizers	Barr Murphy Atomizers		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	3			F*	Newark, Delaware
Barr Murphy Atomizers: Barr Murphy Atomizers - Qty. 3 available -
	196448	Biological Safety Cabinet, 6’, Class II, Type A2	Biological Safety Cabinet, 6’, Class II, Type A2		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Wilmington, Delaware
Biological Safety Cabinet, 6’, Class II, Type A2: Biological Safety Cabinet, 6’, Class II, Type A2 The Baker Company SterilGARD III Advance, Model SG603A S/N 83216 Condition is excellent Unit appears to be in good working order with no noted damage Certification report 1/17, shows cabinet passed the following measurements: Velocity Profile, Hepa Filter Leak Test, Airflow Patterns, Alarm Performance Test.  Uniform Average velocity- Passed = 53lfm.  Inflow velocity - Passed = 279 lfm.  Downflow Velocity - Passed.
	202879	Blue M	Blue M	DCC 206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			N*	Singapore
Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded
	181816	Blue M	Blue M	DCC-1406CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Blue M Electric Oven, DCC-1406CY: Blue M Electric Oven,  DCC-1406CY Tool ID: OVEN-01 (PEA106)
	203139	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			N*	East Fishkill, New York
Blue M Electric Oven, DCC-206-EV-ST350: Blue M Electric Oven, DCC-206-EV-ST350
	203140	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			N*	East Fishkill, New York
Blue M Electric Oven, DCC-206-EV-ST350: Blue M Electric Oven, DCC-206-EV-ST350
	183762	Blue M	Blue M	DDC-206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Blue M Electric Oven, DCC-206CY, 200mm, oven: Blue M Electric Oven,  DCC-206CY, 200mm, oven Tool ID : OVEN-01 (PEA052)
	196206	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Santa Clara, California
Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake: Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake S/N :DCC-832 MULTIPLE UNITS AVAILABLE!!  Please inquire
	192687	Blue M	Blue M	LO-90-P	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
BLUEM, TPS, LO-90-P, Atmospheric Oven: BLUEM, TPS, LO-90-P, Oven Atmospheric oven capable of 260°C 120V 1500W
	178423	Branson	Branson	5210DTH	Ultrasonic Baths in Cleaning and Degreasing Equipment	1			F*	Taichung, Taichung City
Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm: Status: Bagged and Skidded
	192696	Brookfield	Brookfield	DV2THCBCO	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
Brookfield, DV2THCBCO, Viscometer: Brookfield, DV2THCBCO, Viscometer Viscometer measures fluid viscosity at given shear rates
	199447	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes	1				East Fishkill, New York
Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology S/N 204500 2009  The tool is an automated High resolution X-ray diffractometer, clean room (class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300 mm wafer mapping capabilities. The D8 FABLINE consists of two stainless steal cabinets attached to each other. The first one is an X-ray analytical module composed of: radiation safe enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated optical set-ups, and all required supplies. The second is a handling module Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP insert for 200mm..
	195987	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes	1				Singapore
Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology
	199780	BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace	BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace		Clean Room Ovens in Heat Treating Equipment	1			F*	Burlington, Vermont
BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace: BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace S/N: IBVT-1
	198106	Budzar Chiller	Budzar Chiller		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Wilmington, Delaware
Budzar Chiller : Budzar Chiller (Portable Equipment)  *SN 201102-18003-1
	190126	C-Sun Hot Air Circulation Oven	C-Sun Hot Air Circulation Oven		Ovens - Other in Ovens	1			F*	Towanda, Pennsylvania
C-Sun Hot Air Circulation Oven: C-Sun Hot Air Circulation Oven Serial Number:  mEMSZN05 Products Name:  QHMO-7S Internal Dimension:   W 1200 mm x D 920 mm x H 960 mm External Dimension:   W 2260 mm x D 1728 mm x H 1955 mm Temperature Range:  RT+30°C to 550°C (oven tag says max 600°C) Power Source: AC 240V 3Ph 60 Hz Heater:  3.8W x 12 paces = 45.6 KW Materials:  Inside SUS310#, outside SS41# Steel with paint Intake: N2 flow capacity gauge *User’s manual is available
	151284	LEICA CAMBRIDGE LTD	LEICA CAMBRIDGE LTD	Cambridge S260	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Regensburg, BY
Cambridge S260 Scanning Electron Microscope: Cambridge S260 Accelerating voltage: High (4KV-30KV) ; Low (0.3KV-3KV) Stage movement: X,Y Z direction Tilt (-10 to 90 degrees) R (360 degrees) Resolution Capability: 5nm (Accelerating voltage=30KV, WD=3mm) LOCATION: Malacca SERIAL NUMBER(S): 260-74-02
	195984	Cameca	Cameca	LEXFAB300	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Dresden, Saxony
CAMECA, LEXFAB300, 300mm, Diffusion Measurement: CAMECA, LEXFAB300, 300mm, Diffusion Measurement
	166465	Oxford Instruments	Oxford Instruments	CMI 950	Xray Fluorescence Spectrometers in Spectrometers	1			F*	Regensburg, BY
CMI 950 - Xray fluorescence spectrometer: X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc. Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag). System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
	155054	Hitachi	Hitachi	EPL-8541HK8R	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1		12,719.63	F*	Regensburg, BY
COLOR COPIER: EPL 8541 COLOR COPIER-EPL 8541 LOCATION: Malacca SERIAL NUMBER(S): 1N0058
	185296	Daitron	Daitron	EMTEC CVP-80	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Daitron / EMTEC, CVP - 80, Edge Grinder, : Daitron / EMTEC, CVP - 80, Edge Grinder,
	199703	DCS Systems	DCS Systems	nProbe	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Dresden, Saxony
DCS Systems, nProbe, Zeiss Supra 55, SEM: DCS Systems, nProbe, Zeiss Supra 55, SEM In the Fab. Cold Off-Line High Resolution, Low Voltage Zeiss Supra 55 SEM Fully Encoded 8 Positioner Nanomanipulator Fully Encoded XYZ Sample Stage
	200230	E.A. Fischione Instr	E.A. Fischione Instr	2040	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			F*	East Fishkill, New York
E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder: E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder Still in Use S/N: 23492
	192502	ECI Technology	ECI Technology	QL-10EZ	Test & Measurement - Other in Test & Measurement Equipment	1			F*	Malta, New York
ECI TECHNOLOGY, QL-10EZ, Plating Bath CVS : ECI TECHNOLOGY, QL-10EZ, Plating Bath CVS  Cyclic Voltammetric Stripping tool used for plating bath analysis Specifications: • ECI's proprietary and patented analysis techniques • Inorganic component analysis using titration and spectroscopy • Analytical methods include CVS, CPVS, PT, Spectroscopy, pH • Analytical procedures include LAT, MLAT, DT, DCA, DPT, RDT, QC, RC Typical Applications Electroplating Organic additives and inorganic components in baths for Cu, Ni, Sn, Sn/Pb, Pd, Zn, Co/Ni Electro-less Metals, reducing agents, complexing agents, buffering agents, background ions in electro-less deposition for Co, Cu, Ni, Pd and related auxiliary solutions Features: • CVS and CVS Express techniques for the analysis of organic bath components • Potentiometric titration for the analysis of inorganic components • RDT analytical technique for Nickel • Analysis of breakdown products and contaminants • Best accuracy and reproducibility on the market • The largest applications library in the industry • Automatic syringe delivery system • New CVS II head offers greater rotation speed range for analyzing novel chemistries • New user-friendly software offers: - Greater flexibility - Embedded online help - “Get Me Expert”: Easily accessible, user-friendly factory support • Advanced reporting and data handling including statistics, trend analysis and history management • State of the art hardware and OS for faster operation and low power consumption • Communication - TCP/IP networking, LIMS
	202880	FEI	FEI	PHILIPS XL30S, SEM	Microscopes - Other in Optical Microscopes	1			N*	Singapore
FEI PHILIPS XL30S, SEM: FEI PHILIPS XL30S, SEM   PHILIPS XL 30S FEG SEM & DX4I SYSTEM
	202837	FEI	FEI	Tecnia F20S	Microscopes - Other in Optical Microscopes	1			N*	Singapore
FEI TECNAI F20S-TWIN TEM FIB 205: FEI TECNAI F20S-TWIN TEM FIB 205
	203116	FEI	FEI	CLM + Dual Beam	Microscopes - Other in Optical Microscopes	1			N*	Malta, New York
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool: FEI, CLM + Dual Beam FIB, TEM Sample Prep tool In Lab.  Idle
	202148	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool   Cold Shutdown in the lab
	203115	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes	1			N*	Malta, New York
FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   Connected Idle.
	195353	FEI	FEI	DA300	Microscopes - Other in Optical Microscopes	1				Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis: FEI, DA300, 300mm, FIB, Defect Analysis S/N : D253
	202895	FEI	FEI	DA300	Microscopes - Other in Optical Microscopes	1			N*	Singapore
FEI, DA300, FIB, TEM Sample Preparation: FEI, DA300, FIB, TEM Sample Preparation   In RQA Lab.  Unhooked
	202147	FEI	FEI	Ex-Situ Plucker	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage
	203114	FEI	FEI	TEMLINK - KY02, 14771-003	Microscopes - Other in Optical Microscopes	1			N*	East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool
	199704	FEI	FEI	EXPIDA	Scanning Electron Microscopes in Inspection Equipment	1			F*	Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm : FEI, EXPIDA, Dual Beam FIB, 300mm  COLD.  Off Line
	203117	FEI	FEI	ExSolve 2 WTP EFEM	Microscopes - Other in Optical Microscopes	1			N*	Malta, New York
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB: FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab.  Warm shutdown.
	202853	FEI	FEI	FIB 200	Microscopes - Other in Optical Microscopes	1			N*	Singapore
FEI, FIB, 200, TEM Sample Preparation: FEI, FIB, 200, TEM Sample Preparation in QRA Lab
	203122	FEI	FEI	Helios 400	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			N*	Malta, New York
FEI, Helios 400, NanoLab Dual Beam FIB : FEI, Helios 400, NanoLab Dual Beam FIB
	202496	FEI	FEI	Helios 600 NanoLab	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Dresden, Saxony
FEI, Helios 600, NanoLab, Dual Beam FIB, : FEI, Helios 600 NanoLab, Dual Beam FIB   S/N : D404   Vintage : 2009
	202881	FEI	FEI	Sirion XL30	Microscopes - Other in Optical Microscopes	1			N*	Singapore
FEI, Sirion XL30, SEM: FEI, Sirion XL30, SEM SFEG Scanning Electron microscope with energy dispersive X-ray analys In RQA Lab
	202891	FEI	FEI	Sirion XL30	Microscopes - Other in Optical Microscopes	1			N*	Singapore
FEI, Sirion XL30, SEM: FEI, Sirion XL30, SEM
	203118	FEI	FEI	TEM LINK	Microscopes - Other in Optical Microscopes	1			N*	Malta, New York
FEI, TEM Link: FEI, TEM Link
	203120	FEI	FEI	Technia G2 F20 TEM	Microscopes - Other in Optical Microscopes	1			N*	Malta, New York
FEI, TEM Tecnai G2 F20, TEM,: FEI, TEM Tecnai G2 F20, TEM ,
	203121	FEI	FEI	Tecnai G2 F20	Microscopes - Other in Optical Microscopes	1			N*	Malta, New York
FEI, TEM Tecnai G2 F20, TEM,: FEI, TEM Tecnai G2 F20, TEM,   On line, operational
	190524	Fisher Sci	Fisher Sci	FD400 Binder Oven	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
Fisher Scientific, FD400, Precision Binder, 200mm: Fisher Scientific, FD400, Precision Binder, 200mm
	194537	Fisher Sci	Fisher Sci	FD 720 Binder Precision Oven	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
FISHER Scientific, FD720, Oven, 200mm: FISHER Scientific, FD720, Oven, 200mm FISHER Scientific, FD720, Precision Oven, 200mm In the Fab
	194540	Fisher Sci	Fisher Sci	FED720	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm Precision Binder Oven S/N : 00-08042
	189084	Fisher Sci	Fisher Sci	FED 720	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm In the Fab
	179078	General Electric	General Electric	GE MS6001B DLN-1	Industrial Gas Turbines (<50MW) in Gas Plant Equipment	1			F*	Texas City, Texas
Gas Turbine: Turbine includes the following: Air Cooled Generator 336X482 GE Gas Turbine 296624 Air Filter Housing  GTG 51 Controls GTG 51 Spare parts Auxillaries: Lube Oil Skid, Starting Motor, Starting Motor Gearbox, Exciter and Exciter to Gen Gearbox.
	183208	GEMETEC	GEMETEC	Elymat III	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			F*	East Fishkill, NY
GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool: GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length.  A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured.  The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode). In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers.  Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent.  Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material.  Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination.  Measuring at different laser intensities allows major contaminants such as iron to be identified.  This is known as Injection Level Spectroscopy (ILS). Measurement Precision -Diffusion length:  5% over 10 repeated measurements Measurement Accuracy -Diffusion length:  10% compared with similar techniques.
	178414	GEMETEC	GEMETEC	WSPS53	Spectrometers - Other in Spectrometers	1			F*	Taichung, Taichung City
GEMETEC, Gas Analyzer, 300mm: Status: Bagged and Skidded
	195858	GRETA Multifermentor System & Gas Sampling Valves	GRETA Multifermentor System & Gas Sampling Valves		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Wilmington, Delaware
GRETA Multifermentor System & Gas Sampling Valves : Belach Bioteknik GRETA Multifermentor System & Gas Sampling Valves 6 x 2L stainless steel, pressure rated, fed-batch, fermenters, thermally sterilizable in place, fermentation system, with monitored and controlled operational parameters Manufacturer: Belach Bioteknik Model: GRETA Serial #: BE0101 *This unit was purchased in 2015 and only in use for a year *used infrequently and in working condition when decomissioned
	202146	Hitachi	Hitachi	HF-2000	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging: Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM   1995 Vintage S/N : 6214-3 Un-hooked in lab.
	187651	Hitachi	Hitachi	8820 CD SEM	Critical Dimension Scanning Electron Microscopes in Microscopes	1				Singapore
Hitachi, 8820, CD SEM, 200mm: Hitachi, 8820, CD SEM, 200mm Still in the fab,  NOTE  MOVE OUT 2017 Q3.  S/N: 9109-038820
	202854	Hitachi	Hitachi	S-8820	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	Santa Clara, California
Hitachi, 8820, CD SEM, 200mm: Hitachi, 8820, CD SEM, 200mm Still in the Fab
	178288	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes	1				Taichung, Taichung City
Hitachi, CD-SEM, 300mm: Manufactured in 2007; Status: Bagged and Skidded
	178296	Hitachi	Hitachi	Microanalysis System	Scanning Electron Microscopes in Inspection Equipment	1			F*	Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm: Status: Bagged and Skidded
	178294	Hitachi	Hitachi	AS5000	Scanning Electron Microscopes in Inspection Equipment	1			F*	Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm: Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server
	192497	Hitachi	Hitachi	S-5500	Scanning Electron Microscopes in Inspection Equipment	1			F*	Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm: Hitachi, S-5500- Schanning Electron Microscope, 300mm
	195362	Hitachi	Hitachi	S-9380	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	Singapore
Hitachi, S-9380, CD SEM, 300mm: Hitachi, S-9380, CD SEM, 300mm Tool is Bagged & Skidded in Warehouse S/N : 2146-01
	197918	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm !!! Multiple Units Available!!!  Please Inquire
	178299	Hitachi	Hitachi	Z-5700	Scanning Electron Microscopes in Inspection Equipment	1			F*	Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm: Status: Bagged and Skidded
	201150	Hitachi	Hitachi	CG5000	Critical Dimension Scanning Electron Microscopes in Microscopes	1				Dresden, Saxony
Hitachi. CG5000, 300mm CD SEM: Hitachi. CG5000, 300mm CD SEM S/N : 61C3-01
	199986	HMI, eScan 320, 300mm, ebeam Inspection	HMI, eScan 320, 300mm, ebeam Inspection		Other Items in Microscopes	1			F*	Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection: HMI, eScan 320, 300mm, ebeam Inspection
	202885	Horiba Ltd	Horiba Ltd	Ramen T-64	Interferometers in Optical Inspection Equipment	1			N*	Singapore
Horiba, Ramen, T64000, Spectrosope: Horiba, Ramen, T64000, Spectrosope In QRA Lab.
	199709	HSEB	HSEB	Axiospect300	Wafer Inspection Microscopes in Optical Microscopes	1			F*	Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm: HSEB, Axiospect 300, Optical Microscope, 300mm
	199710	HSEB	HSEB	Axiospect300	Wafer Inspection Microscopes in Optical Microscopes	1				Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm: HSEB, Axiospect 300, Optical Microscope, 300mm Cold Offline !!! Multiple Units Available !!! Please inquire.
	202816	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes	1			N*	Malta, New York
HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm
	202817	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes	1			N*	Malta, New York
HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm
	195392	Idler Rolls	Idler Rolls		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Richmond, Virginia
Idler Rolls: Idler rolls: Lot of 1” dead shaft lightweight Aluminum idler rolls with breakaway torque 15 units of 3” x 44” face 2 units of 4” x 44” face Pallet containing all idler rolls – 48”x48”x18” – Weight ~600 lbs
	189512	Integrated Flame Scanner and Temperature Analyzer	Integrated Flame Scanner and Temperature Analyzer		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	2				Newark, Delaware
Integrated Flame Scanner and Temperature Analyzer: Integrated Flame Scanner and Temperature Analyzer TYPE 105F1-1 This item is generally used for combustion systems in steel mills. Fireye Paragon type 105F1-1 flame scanners are used to detect emissions from fossil fuel flames. These can be gaseous fuel, light petroleum distillates, diesel fuels, heavy fuel oils and a variety of coals. They are suited for application to multiple burner furnaces in utilities and pulp and paper plants, industrial application such as petrochemical, refinery and chemical production, through to industrial boilers. Flame temperature measurement can be used to monitor and report on many applications including specialized burners used in applications such as Low NOx, Incineration and sulfur recovery
	187800	JEOL Vacuum Desicator EMDSC-U10A	JEOL Vacuum Desicator EMDSC-U10A		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Wilmington, Delaware
JEOL Vacuum Desicator EMDSC-U10A: JEOL Vacuum Desicator EMDSC-U10A Dimensions: ~7’ x 4’ x 5’ tall Unit is in working condition
	178300	JEOL	JEOL	7555	Scanning Electron Microscopes in Inspection Equipment	1				Taichung, Taichung City
JEOL, Defect Review, 200mm: Status: Bagged & Skidded in warehouse Parts tool.  Listed as major parts missing.
	178302	JEOL	JEOL	JEM-2500SE	Scanning Electron Microscopes in Inspection Equipment	1				Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm: Status: Bagged and Skidded
	178303	JEOL	JEOL	JEM-2500SE	Scanning Electron Microscopes in Inspection Equipment	1				Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm: Status: Bagged and Skidded
	187765	JEOL	JEOL	JWS 7555S	Scanning Electron Microscopes in Inspection Equipment	1			F*	Singapore
JEOL, JWS 7555S, Defect Review, 200mm: JEOL, JWS 7555S, Defect Review, 200mm
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Scientific and Laboratory Equipment: Accretech, Anton PAAR, Applied Materials Inc., Applied Materials, Inc., ASML, Asymtek, Axcelis Technologies GmbH, Balzers, Blue M, Branson, brimrose, Brookfield Engineering Labs, BTU, Cameca, Daitron, DCS Systems, Dr.-Ing. Werth GmBH, E.A. Fischione Instr, ECI Technology, FEI, Fisher Scientific, GEMETEC, General Electric, Hitachi, Horiba Ltd, HSEB, JEOL, Keithley, Kinetic Systems, Inc., KLA-Tencor, Lasertech, LEICA CAMBRIDGE LTD, LINK ANALYTICAL LTD, MASS-PCB, McGraw Edison, Metron, NCB Network, Negevtech Ltd., NSC, Oxford Instruments, Park Systems Inc, Perkin Elmer, Prometrix, Rigaku, Rudolph Technologies, Inc., Scientek Technology Corp, SDI Diagnostics Inc, SELA, SOLVISION, Sopra, Suss MicroTec, Temptronics, Unitherm, Waters, Zeiss