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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
209845
200mm THIN WAFER Loader NSX 
200mm THIN WAFER Loader NSX 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

200mm THIN WAFER Loader NSX:

200mm THIN WAFER Loader NSX

“NIDEC SANKYO Corporation” , Model: “SR8220-019”, SN. „FR00891253“

1 1,140.55 Dresden, Saxony
206534
ABB Engineering  

ABB Engineering  

IRB120 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

ABB, IRB120, Sample Polishing Robot. :

ABB, IRB120, Sample Polishing Robot. 

 

 

1   Singapore
190444
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101DA-01


2006 DOM

Still in the fab, warm idle
1   F* Dresden, Saxony
190445
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00103CB-01

DOM: 2006

1   Dresden, Saxony
190446
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101GB-01

DOM: 2007

1   F* Dresden, Saxony
178308
Accretech  

Accretech  

Win-Win 50 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Accretech, Win-Win 50,Bright Field Inspection, 300mm:

Manufactured in 2005; Status: Bagged and Skidded


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire

1   F* Taichung, Taichung City
207367
Accretech  

Accretech  

Win-Win 50  

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Accretech, Win-Win 50,Bright Field Inspection, 300mm:

Accretech, Win-Win 50,Bright Field Inspection, 300mm

S/N : R00102CB-01 (WW#153)

Bagged & Skidded in Warehouse.

1   Taichung, Taichung City
207378
Accretech  

Accretech  

Win-Win 50  

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Accretech, Win-Win 50,Bright Field Inspection, 300mm:

Accretech, Win-Win 50, TSK1600, Bright Field Inspection, 300mm

Bagged & Skidded in Warehouse

S/N : R00101LZ-01 (WW#152)

1   Taichung, Taichung City
210076
ADE  

ADE  

EpiScan 

List all items of this typeInterferometers

in Optical Inspection Equipment

ADE, EpiScan, 200mm, Epi Thickness Measurement System :

ADE, EpiScan, 200mm, Epi Thickness Measurement System 

Not Working "Detector of spectrometer is dead" 

1   Burlington, Vermont
204492
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

Bagged & Skidded in Warehouse

1   Singapore
204288
Agilent  

Agilent  

81110A 

List all items of this typeSpectrometers - Other

in Spectrometers

Agilent,81110A, Pulse Pattern Generator:

Agilent,81110A, Pulse Pattern Generator

1   Taichung, Taichung City
204302
Ancosys  

Ancosys  

P13010 Ancolyzer 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Ancosys, P13010 Ancolyzer, :

Ancosys, P13010 Ancolyzer, 

Cu Plating Bath Analyzer

1   Malta, New York
210024
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

remarketing@surplusglobal.com

1   Burlington, Vermont
213282
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

Installed.  Operational.

Vintage : 2004

S/N : U-667

remarketing@surplusglobal.com

1   Singapore
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:

Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!

1   Dresden, Saxony
203074
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

1   Dresden, Saxony
201207
Applied Materials  

Applied Materials  

SemVision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials, SEMVision CX, 200mm,:

Applied Materials, SEMVision CX, 200mm,

S/N : W790

remarketing@surplusglobal.com

1   Burlington, Vermont
178310
AMAT  

AMAT  

Uvision 200 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Applied Materials, Uvision 200, Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
1   Taichung, Taichung City
204911
KLA-Tencor  

KLA-Tencor  

Uvision 5 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Applied Materials, Uvision5, Bright Field Inspection, 300mm:

Applied Materials, Uvision5, Bright Field Inspection, 300mm

In the fab, Idle

remarketing@surplusglobal.com

1   Malta, New York
205259
Applied Materials  

Applied Materials  

Uvision 5 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

Applied Materials, Uvision5, Bright Field Inspection, 300mm:

Applied Materials, Uvision5, Bright Field Inspection, 300mm

 

remarketing@surplusglobal.com

1   Malta, New York
192588
Asymtek  

Asymtek  

S-800 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

ASYMTEK, S-800, Adhesive Dispense Tool, :
NORDSON ASYMTEK, S-820B, Adhesive Dispense Tool, 


S-820B Specification and Facility Requirements
Motion System:
Type: Brushless DC servo motors, closed-loop with encoder feedback
Encoder Resolution: 10 micrometer
Positional Accuracy: ±0.075 mm (0.003 in.), 3 sigma
Placement Accuracy: ±0.100 mm (0.004 in.), 3 sigma
X-Y Acceleration: 0.25 g peak with S-curve jerk control
X-Y Velocity: 500 mm/s (20 in./s)
Z-Axis Velocity: 500 mm/s (20 in./s)
X-Y Repeatability: ±0.025 mm (0.001 in.)
Z-Axis Repeatability: ±0.025 mm (0.001 in.)
Dispense Area:
Work Envelope: 350 x 350 mm (14 x 14 in.)
Z-Travel: 75 mm
Tool Payload: 3 kg
Workpiece Payload: 2 kg
Vision and Lighting:
Vision: Vision system with Automatic Pattern Recognition
Lighting: Programmable, on-axis, red/blue LED, 256 steps
Computer:
Computer: Windows-based PC
User interface: Color LCD flat-panel display; ASCII keyboard & pointing device; Ethernet network port
Software:
User Environment: Fluidmove®
Operating System: Windows®
Dimensions:
See dimensional drawings on next page.
Facility Requirements:
System Footprint: 866 mm wide X 1123 mm deep (34 x 44 in.)
Display extends unit 610 mm (24 in.)
Height including light beacon: 2045 mm

Air Supply: 621 kPa (6.1 atm, 90 psi) 3 CFM @ 90 psi (28 liters/hr = 1 SCFM)

(May be higher depending upon application)

Power (Mains): 200/240 VAC, 8.5 Amps (max), 50/60 Hz, Single Phase
Weight: 364 kg (800 lbs)

1   Malta, New York
183772
Axcelis Technologies  

Axcelis Technologies  

Compact II  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

Axcelis Compact II, 300mm, H2 Reflow Furnace, :
Axcelis Compact II, 300mm, H2 Reflow Furnace,

C4 Processing.

Tool ID: OVN222

Serial Number :  H08046
1   F* Dresden, SN
202879
Blue M  

Blue M  

DCC 206CY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Blue M Electric Oven, DCC 206CY:

Blue M Electric Oven, DCC 206CY

 

Bagged & Skidded

1   Singapore
204174
Blue M  

Blue M  

DDC 206CY Oven 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Blue M Electric Oven, DCC 206CY:

Blue M Electric Oven, DCC 206CY

 

Bagged & Skidded in Warehouse

1   Singapore
181816
Blue M  

Blue M  

DCC-1406CY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Blue M Electric Oven, DCC-1406CY:

Blue M Electric Oven,  DCC-1406CY
Tool ID: OVEN-01 (PEA106)

1   Singapore
183762
Blue M  

Blue M  

DDC-206CY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Blue M Electric Oven, DCC-206CY, 200mm, oven:

Blue M Electric Oven,  DCC-206CY, 200mm, oven

Tool ID : OVEN-01 (PEA052)

1   Singapore
196206
Blue M  

Blue M  

DCC-206-EV-ST350 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake:

Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake

S/N :DCC-832

MULTIPLE UNITS AVAILABLE!!  Please inquire

1   East Fishkill, New York
210050
Blue M  

Blue M  

RG-3010F-2 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

BlueM, Oven, RG-3010F-2, :

BlueM, Oven, RG-3010F-2, 

Disconnected in Storage

Non-Operational - Known Electrical Faults/Issues

1   Burlington, Vermont
210051
Blue M  

Blue M  

RG-3010F-2 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

BlueM, Oven, RG-3010F-2, :

BlueM, Oven, RG-3010F-2, 

 

In Storage - Known Electrical Faults/Issues

1   Burlington, Vermont
178423
Branson  

Branson  

5210DTH 

List all items of this typeUltrasonic Baths

in Cleaning and Degreasing Equipment

Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm:

Status: Bagged and Skidded

1   Taichung, Taichung City
204380
Infineon  

Infineon  

Bruchless Motor bench 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

Bruchless Motor bench:

Bruchless Motor bench assembled in our Provence Design Center, like new (only tested once).

For more informations please refer to the enclosed diagram and the motor description below. 

Brushless motor PMSM ME0913 24 to 96V VDC 12kW (30kW max)

This three-phase motor works with the Kelly controller (described below)

• Output Power of 12 KW Continuous, 30 KW Peak (at 96 volts)

• Designed for long life. No brush maintenance. The motor is 92% efficient at voltages between 24 to 96 VDC. Continuous current of 125 amps AC (180 Amps DC into the motor control). This is a 3-phase, Y-connected Permanent Magnet Synchronous Motor with an axial air gap and 3 Hall sensors at 120 degrees electrical timing. It has two stators with a rotor in the center.

• This is a 4 pole motor (8 magnets).

• The Phase to Phase winding resistance is 0.013 Ohms.

• The maximum recommended rotor speed is 5000 RPM.

• Voltages from 0 to 96 VDC input to the control.

• Torque constant of 0.15 Nm per Amp

• The Inductance Phase to Phase is 0.10 Milli-Henry with a 28 turns per phase.

• Armature Inertia is 45 Kg Cm Squared.

• Continuous current of 125 Amps AC (180 Amps DC into the motor control).

• Peak current of 420 Amps AC for 1 minute (600 Amps DC into the motor control).

• Weight of 35 pounds.

• Peak Stall Torque of 90 Nm (66 ft).

• This is an Open Frame, Fan Cooled motor. Timed for counter-clockwise rotation (can be changed to clockwise).

 

Kelly KBL72301,24-72V,300A,BLDC Controller/With Regen

Kelly KBL programmable BLDC motor controller provides efficient, smooth and quiet controls for golf cart, go-cart, electric motorcycle, forklift, hybrid vehicle, electrical vehicle, electric boat, as well as industry motor speed or torque control.

Motor speed controller uses high power MOSFET, PWM to achieve efficiency 99% in most cases. Powerful microprocessor brings in comprehensive and precise control to BLDC motor controllers. This programmable brushless motor controller also allows users to set parameters, conduct tests, and obtain diagnostic information quickly and easily.

Features:

• Intelligence with powerful microprocessor. Synchronous rectification, ultra low drop and fast PWM to achieve very high efficiency.

• Electronic reversing.

• Voltage monitoring on 3 motor phases, bus, and power supply.Voltage monitoring on voltage source 12V and 5V.

• Current sense on all 3 motor phases.Current control loop.

• Hardware over current protection.Hardware over voltage protection.

• Support torque mode, speed mode, and balanced mode operation.

• Configurable limit for motor current and battery current.

• Low EMC.LED fault code.

• Battery protection: current cutback, warning and shutdown at configurable high and low battery voltage.

• Rugged aluminum housing for maximum heat dissipation and harsh environment.Rugged high current terminals, and rugged aviation connectors for small signal.

• Thermal protection: current cut back, warning and shutdown on high temperature.Configurable 60 degree or 120 degree hall position sensors.

1 lot   Le Puy-Sainte-Réparade, Provence-Alpes-Côte d'Azur
210272
Bruker  

Bruker  

Fabline D8 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

Bruker Fabline D8 :

Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer

 

X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers

Still in production. Ready for inspection.

1   F* Villach, Carinthia
207935
Bruker, AFM, 300mm, InSight 3D-DR 
Bruker, AFM, 300mm, InSight 3D-DR 

List all items of this typeOther Items

in Microscopes

Bruker, AFM, 300mm, InSight 3D-DR:

Bruker, AFM, 300mm, InSight 3D-DR

 

DOM : 2017

 

S/N : 112

 

remarketing@surplusglobal.com

1   Burlington, Vermont
204304
Bruker, D8 Discover, 300mm, X-Ray Metrology 
Bruker, D8 Discover, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8 Discover, 300mm, X-Ray Metrology:

Bruker, D8 Discover, 300mm, X-Ray Metrology

 

In Lab,  Cold idle

remarketing@surplusglobal.com

1   Dresden, Saxony
209828
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8FABLINE, 300mm, X-Ray Metrology:

Bruker, D8FABLINE, 300mm, X-Ray Metrology

remarketing@surplusglobal.com

1   Malta, New York
199780
BTU Engineering  

BTU Engineering  

TCAS 181-7-72-E-36 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace:

BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace

S/N: IBVT-1

1   F* Burlington, Vermont
195984
Cameca  

Cameca  

LEXFAB300 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

CAMECA, LEXFAB300, 300mm, Diffusion Measurement:
CAMECA, LEXFAB300, 300mm, Diffusion Measurement
1   Dresden, Saxony
205918
Camtek  

Camtek  

X-ACT 

List all items of this typeMicroscopes - Other

in Optical Microscopes

CAMTEK X-ACT System with EM3:

CAMTEK X-ACT System with EM3

 

Idle.  Shut Down.

1   East Fishkill, New York
204314
Check Point Technolo  

Check Point Technolo  

InfraScanTDM 300 TDE 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson:

CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson

 The system is comprised of the following:
1 InfraScan 300 TDE Laser Probing / Emission System
Includes the following assemblies:
* LSM 300 scanner with integrated emission camera port;
* CCD camera for sample navigation with separate display;
* 5-position motorized turret;
* X, Y, Z motorized movement of LSM assembly;
* PC with digitizer, Windows XP, Proscan 2000 Acquisition Software;
* Moveable Operator Console, with  flat panel displays, Semi S8 compliant;
* SLS-1000 1064 nm 300 mW
* SLS-1000 1319 nm 350 mW
* ASP-1000 3A Amplifier source package
* Laser power adjustment, 0 to 100%, with incident power monitoring for all objectives;
* Dark chamber with laser safety interlock, Class I (with service override), vibration isolation
* User’s manual.
Emission Camera Options
InGaAs
LN2 cooled 640 x 640 array 18 ?m pixels.
LN2 Auto-fill system with two (2) 160 L Dewars
InfraScan™ LTM 9Hz laser timing module. Includes the following:
9 GHz laser timing module
Digital Oscilloscope 12.5 GHz Bandwidth
Electronic Spectrum Analyzer
APD and electronic amplifier
High power/ high stability laser for timing stimulus
Objective Options
5X NIR, Mitutoyo 378-822
20X IR Plan Apo, NA 0.5, Seiwa
50X IR Plan Apo, NA 0.6, Seiwa
100X NIR HR Mitutoyo 378-864-5
1X Macro Lens

Specifications and Features:
LSM 300/Optics-
Optimized for high transmission at 1064nm and 1340nm.
* T => 100mW at 1064nm 5X objective; T =>300mW at 1340nm 5X objective
Image distortion <2%, 2X slow scan.
Spot size 0.61?/NA of objective.
* Scan rate 310 lines/sec to 2 sec/line.
Field of view with 5X objective at 1X zoom: 3.2mm.
Optical zoom range 1X to 8X (scanned field).
* Image registration better than 2% for various wavelengths.
* 5-position motorized turret, non-winding,
Software settable crash protection limits for all objective lenses.
Software controlled, par-centered and parfocal objectives.
Built-in CCD camera for sample navigation with color monitor.
External sync circuit.
Computer and Inputs -
PC with 3-channel digitizer input, one for LSM imaging and two for laser stimulation methods.
Signal inputs are synchronized with LSM scan rate.
Independent Gain and Offset control for input 1 and input 2.
Scan rates adjustable from 310 lines/sec to 2048X slow to match response of DUT.
2-way communication with Knights CAD link.
SLS 1000 RD –
300mW 1064 nm linearly polarized laser
* Continuously adjustable Laser Power, from near 0% to full maximum.
Real-time, incident laser power monitoring.
Power limit feature to prevent overexposure of DUT.
FC fiber optical coupler with 3 meter PM patchcord.
ASP 1000 Amplifier-Source Package -
Source Selections:
Constant Current
Programmable Range: 0.5nA – 1A; (3A optional)
Minimum Program Step: .5nA
Constant Voltage
Programmable Range: 1uV – 10V (20V if protection diode removed)
Minimum Program Step: 1uV
Amplifier Selections:
AC Voltage Amplifier
Bias Current: .5nA - 1A; (3A optional)
Maximum Input: 10V
Input impedance: >4.7M Ohm
Maximum Gain: 120 dB
Detectability: 1 nV at full gain
Bandwidth: 0.3 to 400K Hz
High Pass Filter: .3, 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ,
Low Pass Filter: 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ
Output Offset Voltage: +/- 5V
DC Current Amplifier (OBIC mode)
Bias Voltage Range: 1uV - 10V
Maximum Input: 20 mA

Maximum Gain: 80 V/nA
Detectability: 1 pA at full gain
Bandwidth: DC to 400K Hz

1   Malta, New York
208158
Chemical Safety Tech  

Chemical Safety Tech  

Dual Drum Waste Cabinet 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Chemical Safety Technology, Inc., Dual drum waste Cabinet:

Chemical Safety Technology, Inc., Dual drum waste Cabinet

1   Malta, New York
166465
Oxford Instruments  

Oxford Instruments  

CMI 950 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

CMI 950 - Xray fluorescence spectrometer:
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).

System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
1   F* Regensburg, BY
210074
Dektak, V200SI, Surface Profilometer 
Dektak, V200SI, Surface Profilometer 

List all items of this typeOther Items

in Microscopes

Dektak, V200SI, Surface Profilometer:

Dektak, V200SI, Surface Profilometer

Powered Down.  Installed

1   East Fishkill, New York
210386
Denton  

Denton  

Infinity 18 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Denton Vacuum, Infinity 18, Sputter Coating System :

Denton Vacuum, Infinity 18, Sputter Coating System

 One Cathode.

 Installed.  Idle.

S/N : 40013

1   Burlington, Vermont
195189
Drilling machine bernhard steinel 
Drilling machine bernhard steinel 

List all items of this typeMixed Lots of Lab and Other Technical Equipment

in Laboratory and Scientific Equipment

Drilling machine bernhard steinel:

Already damaged loses function, was unable to repair.
LOCATION: Wuxi

1 0.00 Regensburg, Bavaria
203282
E.A. Fischione Instr  

E.A. Fischione Instr  

1030 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

E.A. Fischione Instruments Inc., 1030, NanoMill:

E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep.

Automated Sample Preparation System

 

 

1   F* East Fishkill, New York
203280
E.A. Fischione Instr  

E.A. Fischione Instr  

1060 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

E.A. Fischione Instruments Inc., 1060, NanoMill:

E.A. Fischione Instruments Inc., 1060, NanoMill

 

Ion MIll

1   East Fishkill, New York
200230
E.A. Fischione Instr  

E.A. Fischione Instr  

2040 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder:
E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder

Still in Use

S/N: 23492
1   East Fishkill, New York
209075
Esco  

Esco  

EHWS 8C 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

ESCO Horizontal Work Station :

ESCO Horizontal Work Station,  

 

Bagged & Skidded in Warehouse

1   Singapore
215848
Estion  

Estion  

E-RETICLE V 4M 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Estion, E-RETICLE V 4M, Electrostatic Charge Measurement:

Estion, E-RETICLE V 4M, Electrostatic Charge Measurement

Reticle Electrostatic Charge Measurement System

Installed, Idle.

Vintage :  2010

1   Burlington, Vermont
207928
Etec Systems  

Etec Systems  

MEBES 4500 

List all items of this typeInterferometers

in Optical Inspection Equipment

Etec Systems, MEBES 4500, Mask Lithography System :

Etec Systems, MEBES 4500, Mask Lithography System 

 

DOM : 1996

S/N : A04 / A45 / 72

1   F* Burlington, Vermont
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

1   Singapore
206667
FEI  

FEI  

835 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

FEI, 835, Full Wafer Dual Beam FIB, 200mm :

FEI, 835, Full Wafer Dual Beam FIB, 200mm

Cold idle in Lab.

 

1999 Vintage

S/N : 994701

1   F* Burlington, Vermont
211894
FEI  

FEI  

CLM 3D 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Installed.  Idle.

1   East Fishkill, New York
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

1   East Fishkill, New York
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, DA300, 300mm, FIB, Defect Analysis:

FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


1   Taichung, Taichung City
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1   East Fishkill, New York
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

1   East Fishkill, New York
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

1   Singapore
211546
FEI  

FEI  

Meridian-IV 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

FEI, Meridian-IV, Fault localization and analysis:

FEI, Meridian-IV, Fault localization and analysis

1   Singapore
210391
FEI  

FEI  

Micrion 2500 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Micrion 2500, FIB:

FEI, Micrion 2500, FIB

Installed.  Idle.

S/N : M2051

1   Burlington, Vermont
210388
FEI  

FEI  

Micrion 2500 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Micrion 2500, FIB:

FEI, Micrion 2500, FIB

 

Installed.  Idle.

 

S/N : M2051

1   Burlington, Vermont
210390
FEI  

FEI  

Micrion 9000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Micrion 9000, FIB:

FEI, Micrion 9000, FIB

Installed.  Idle

S/N : M9023

1   Burlington, Vermont
202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

 

remarketing@surplusglobal.com

1   Singapore
211893
FEI  

FEI  

TEMLINK 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Link, 14771-003, :

FEI, TEM Link, 14771-003, 

S/N : 4471-03-06

1   F* East Fishkill, New York
205917
FEI  

FEI  

V600 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, V600, 4022 262 70111, Single Beam FIB, :

FEI, V600, 4022 262 70111, Single Beam FIB, 

 S/N: D3019

In Lab.  Idle

2007 Vintage.

Maintenance was done by FEI

GIS - 

Tungsten Hexacarbonyl
Iodine
Magnesium Sulfate 7-Hydrate
Xeon Difluoride GIS injector removed for tool decon!
 
 
 
1   East Fishkill, New York
190524
Fisher Sci  

Fisher Sci  

FD400 Binder Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

Fisher Scientific, FD400, Precision Binder, 200mm:

Fisher Scientific, FD400, Precision Binder, 200mm

1   Singapore
194537
Fisher Sci  

Fisher Sci  

FD 720 Binder Precision Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

FISHER Scientific, FD720, Oven, 200mm:

FISHER Scientific, FD720, Oven, 200mm

FISHER Scientific, FD720, Precision Oven, 200mm

In the Fab
1   Singapore
194540
Fisher Sci  

Fisher Sci  

FED720  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

FISHER Scientific, FED720, Oven, 200mm:

FISHER Scientific, FED720, Oven, 200mm

Precision Binder Oven

S/N : 00-08042

1   Singapore
189084
Fisher Sci  

Fisher Sci  

FED 720 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

FISHER Scientific, FED720, Oven, 200mm:

FISHER Scientific, FED720, Oven, 200mm

In the Fab

1   Singapore
209917
Frontier Semi  

Frontier Semi  

128L-C2C 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

FSM 128L-C2C, Film Stress Measurement, 300mm:

FSM 128L-C@C, Film Stress Measurement, 300mm

1   Singapore
179078
General Electric  

General Electric  

GE MS6001B DLN-1 

List all items of this typeIndustrial Gas Turbines (<50MW)

in Gas Plant Equipment

Gas Turbine:

Turbine includes the following:
Air Cooled Generator 336X482
GE Gas Turbine 296624

Air Filter Housing 
GTG 51 Controls
GTG 51 Spare parts
Auxillaries: Lube Oil Skid, Starting Motor, Starting Motor Gearbox,
Exciter and Exciter to Gen Gearbox.

1   Texas City, Texas
183208
GEMETEC  

GEMETEC  

Elymat III 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool:
GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool

The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length.  A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured.  The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode).

In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers.  Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent.  Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material.  Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination.  Measuring at different laser intensities allows major contaminants such as iron to be identified.  This is known as Injection Level Spectroscopy (ILS).

Measurement Precision -Diffusion length:  5% over 10 repeated measurements

Measurement Accuracy -Diffusion length:  10% compared with similar techniques.

1   F* East Fishkill, NY
178414
GEMETEC  

GEMETEC  

WSPS53 

List all items of this typeSpectrometers - Other

in Spectrometers

GEMETEC, Gas Analyzer, 300mm:

Status: Bagged and Skidded

1   Taichung, Taichung City
215016
Hologenix  

Hologenix  

MTX 2000/2/MIS SLIPBAY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Halogenix, MTX 2000/2/MIS SLIPBAY, Slip Finder Inspection Tool:

Halogenix, MTX 2000/2/MIS SLIPBAY, Slip Finder Inspection Tool

Installed

Vintage 2001

S/N : 252601

1   East Fishkill, New York
202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

1   East Fishkill, New York
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, Metrology, Microanalysis System 300mm:

Status: Bagged and Skidded

1   Taichung, Taichung City
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




1   F* Singapore
210393
Hitachi  

Hitachi  

S-4700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-4700, SEM:

Hitachi, S-4700, SEM

 

TYPE II System

Installed. Idle.

S/N : 9327-05

1   Burlington, Vermont
203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

remarketing@surplusglobal.com

 

 

1   East Fishkill, New York
210257
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380, CD-SEM, 300mm:

Hitachi, S-9380, CD-SEM, 300mm

Installed. Operational.

S/N : 2189-01

 AVAILABLE 5/2021 

Tool owner confirms Model is S-9380

remarketing@surplusglobal.com

1   Singapore
210258
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380, CD-SEM, 300mm:

Hitachi, S-9380, CD-SEM, 300mm

 

Installed. Operational

S/N : 2180-04

 

AVAILABLE 5/2021

 

Tool owner confirms Model is S-9380

remarketing@surplusglobal.com

1   Singapore
213283
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380, CD-SEM, 300mm:

Hitachi, S-9380, CD-SEM, 300mm

Installed Operational.

S/N : U-664

Vintage : 2004 

remarketing@surplusglobal.com

1   Singapore
213284
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380, CD-SEM, 300mm:

Hitachi, S-9380, CD-SEM, 300mm

Installed.  Operational.

Vintage : 2004

S'N : U-666

remarketing@surplusglobal.com

 

1   Singapore
201534
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

S/N : 2160-02

Completely Refurbished

remarketing@surplusglobal.com

1   Taichung, Taichung City
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, Z-5700 Spectroscopy, 300mm:

Status: Bagged and Skidded

1   Taichung, Taichung City
204305
HMI, eP4 320, 300mm, ebeam Inspection 
HMI, eP4 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

HMI, eP4 320, 300mm, ebeam Inspection:

HMI, eP4 320, 300mm, ebeam Inspection

 

In the Fab.  Cold Idle

remarketing@surplusglobal.com

1   Malta, New York
199986
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

HMI, eScan 320, 300mm, ebeam Inspection:

HMI, eScan 320, 300mm, ebeam Inspection

 

remarketing@surplusglobal.com

1   F* Malta, New York
212703
HMI, eScan 500, 300mm, eBeam Inspection Tool 
HMI, eScan 500, 300mm, eBeam Inspection Tool 

List all items of this typeOther Items

in Microscopes

HMI, eScan 500, 300mm, eBeam Inspection Tool:

HMI, eScan 500, 300mm, eBeam Inspection Tool

 

remarketing@surplusglobal.com

1   Malta, New York
181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB Axiospect 300, 300mm Wafer inspection microscope:

HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182


!!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!

1   Dresden, Saxony
201829
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB Axiospect 300, 300mm Wafer inspection microscope:

HSEB Axiospect 300, 300mm Wafer inspection microscope

 

S/N : 41302020168

1   Dresden, Saxony
202816
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

1   Malta, New York
202817
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

1   Malta, New York
189512
Integrated Flame Scanner and Temperature Analyzer 
Integrated Flame Scanner and Temperature Analyzer 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

Integrated Flame Scanner and Temperature Analyzer:

Integrated Flame Scanner and Temperature Analyzer TYPE 105F1-1
This item is generally used for combustion systems in steel mills.

Fireye Paragon type 105F1-1 flame scanners are used to detect emissions from fossil fuel flames. These can be gaseous fuel, light petroleum distillates, diesel fuels, heavy fuel oils and a variety of coals. They are suited for application to multiple burner furnaces in utilities and pulp and paper plants, industrial application such as petrochemical, refinery and chemical production, through to industrial boilers. Flame temperature measurement can be used to monitor and report on many applications including specialized burners used in applications such as Low NOx, Incineration and sulfur recovery

2   Newark, Delaware
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, Defect Review, 200mm:

Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

1   Taichung, Taichung City
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JEM-2500SE Microscopes, 300mm:

Status: Bagged and Skidded

1   Taichung, Taichung City
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
1   Taichung, Taichung City
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JWS 7555S, Defect Review, 200mm:

JEOL, JWS 7555S, Defect Review, 200mm

1   Singapore
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JWS-7515, 200mm, SEM:

JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108

1   Singapore
203119
JEOL  

JEOL  

ARM200CF Super X 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, TEM, ARM200CF Super X, :

JEOL, TEM, ARM200CF Super X,

Atomic Resolution Electron Microscope

remarketing@surplusglobal.com

1   Malta, New York
178270
KEITHLEY Insturments, 590 C-V Analyzer, 300mm 
KEITHLEY Insturments, 590 C-V Analyzer, 300mm 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

KEITHLEY Insturments, 590 C-V Analyzer, 300mm:
Status: Bagged and Skidded
1   Taichung, Taichung City
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NOTE:
   photo available
   reference document attached
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  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

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