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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	190444	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment	1			F*	Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00101DA-01 2006 DOM Still in the fab, warm idle
	190445	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment	1				Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00103CB-01 DOM: 2006
	190446	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment	1			F*	Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00101GB-01 DOM: 2007
	178308	Accretech	Accretech	Win-Win 50	Optical Inspection - Other in Optical Inspection Equipment	1			F*	Taichung, Taichung City
Accretech, Win-Win 50,Bright Field Inspection, 300mm: Manufactured in 2005; Status: Bagged and Skidded !!!MULTIPLE UNITS AVAILABLE!!! Please inquire
	203884	Agilent	Agilent	5977B	Spectrometers - Other in Spectrometers	1				Chengdu, Sichuan
Agilent, 5977B, GC MS, w/ MARKES TD 100: Agilent, 5977B, GC MS, w/ MARKES TD 100   This is a brand new tool (2018 vintage), unopened in original OEM packaging
	204491	Agilent	Agilent	7500cs-C	Spectrometers - Other in Spectrometers	1			F*N*	Taichung, Taichung City
Agilent, 7500cs-C, ICMPS, System: Agilent, 7500cs-C, ICMPS, System   Bagged & Skidded in Warehouse
	204492	Agilent	Agilent	7500cs-C	Spectrometers - Other in Spectrometers	1			N*	Taichung, Taichung City
Agilent, 7500cs-C, ICMPS, System: Agilent, 7500cs-C, ICMPS, System Bagged & Skidded in Warehouse
	204288	Agilent	Agilent	81110A	Spectrometers - Other in Spectrometers	1				Taichung, Taichung City
Agilent,81110A, Pulse Pattern Generator: Agilent,81110A, Pulse Pattern Generator
	204302	Ancosys	Ancosys	P13010 Ancolyzer	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
Ancosys, P13010 Ancolyzer, : Ancosys, P13010 Ancolyzer,  Cu Plating Bath Analyzer
	203072	Anton PAAR	Anton PAAR	MCR301	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Dresden, Saxony
Anton Paar, Viscometer, MCR301, : Anton Paar, Viscometer, MCR301,
	203103	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1				East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203104	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1				East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203105	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1				East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203106	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1				East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	203107	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1				East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
	180474	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8
	180514	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8   Tool ID: KA03
	200691	Applied Materials	Applied Materials	COMPLUS mp3	Optical Inspection - Other in Optical Inspection Equipment	1				Singapore
Applied Materials, Complus, Particle Measurement, 300mm: Applied Materials, Complus, Particle Measurement, 300mm Manufactured in 2007; Status: Bagged and Skidded
	178309	AMAT	AMAT	Complus	Optical Inspection - Other in Optical Inspection Equipment	1				Singapore
Applied Materials, Complus, Particle Measurement, 300mm: Manufactured in 2007; Status: Bagged and Skidded MULTIPLE UNITS AVAILALBE!!! Please inquire.   S/N : T2106
	195983	Applied Materials	Applied Materials	Elite MS MC	Scanning Electron Microscopes in Inspection Equipment	1				Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection: Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection iii Multiple Units Available.  Please inquire !!!
	203074	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes	1				Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.
	203075	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes	1				Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.
	204039	Applied Materials	Applied Materials	SEMVision G3	Scanning Electron Microscopes in Inspection Equipment	1				Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm: Applied Materials, SEMVision G3, DR-SEM, 300mm missing some of the PC's in the electronic rack Bagged & Skidded in Warehouse 2006 Vintage
	178310	AMAT	AMAT	Uvision 200	Optical Inspection - Other in Optical Inspection Equipment	1				Taichung, Taichung City
Applied Materials, Uvision 200, Bright Field Inspection, 300mm: Manufactured in 2005; Status: Bagged and Skidded
	204384	ASML	ASML	XT:1250D	Optical Inspection - Other in Optical Inspection Equipment	1			N*	Dresden, Saxony
ASML, 300mm, XT:1250D, : ASML, 300mm, XT:1250D,  S/N : m5125
	197858	ASML	ASML	TWINSCAN XT:850F	Optical Inspection - Other in Optical Inspection Equipment	1				Veldhoven, North Brabant
ASML, XT: 850F, 300mm, KrF, : ASML, TWINSCAN XT:850F, 300mm, KrF,  S/N: m7691 Laser model CYMER ELS-7610K (40W) MES machine type XT850F OIU/Reticle-/Waf.aux.port Right Configuration Power 400 Volt In warehouse stored.
	192588	Asymtek	Asymtek	S-800	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
ASYMTEK, S-800, Adhesive Dispense Tool, : NORDSON ASYMTEK, S-820B, Adhesive Dispense Tool,  S-820B Specification and Facility Requirements Motion System: Type: Brushless DC servo motors, closed-loop with encoder feedback Encoder Resolution: 10 micrometer Positional Accuracy: ±0.075 mm (0.003 in.), 3 sigma Placement Accuracy: ±0.100 mm (0.004 in.), 3 sigma X-Y Acceleration: 0.25 g peak with S-curve jerk control X-Y Velocity: 500 mm/s (20 in./s) Z-Axis Velocity: 500 mm/s (20 in./s) X-Y Repeatability: ±0.025 mm (0.001 in.) Z-Axis Repeatability: ±0.025 mm (0.001 in.) Dispense Area: Work Envelope: 350 x 350 mm (14 x 14 in.) Z-Travel: 75 mm Tool Payload: 3 kg Workpiece Payload: 2 kg Vision and Lighting: Vision: Vision system with Automatic Pattern Recognition Lighting: Programmable, on-axis, red/blue LED, 256 steps Computer: Computer: Windows-based PC User interface: Color LCD flat-panel display; ASCII keyboard & pointing device; Ethernet network port Software: User Environment: Fluidmove® Operating System: Windows® Dimensions: See dimensional drawings on next page. Facility Requirements: System Footprint: 866 mm wide X 1123 mm deep (34 x 44 in.) Display extends unit 610 mm (24 in.) Height including light beacon: 2045 mm Air Supply: 621 kPa (6.1 atm, 90 psi) 3 CFM @ 90 psi (28 liters/hr = 1 SCFM) (May be higher depending upon application) Power (Mains): 200/240 VAC, 8.5 Amps (max), 50/60 Hz, Single Phase Weight: 364 kg (800 lbs)
	176719	SELA	SELA	EM2	Sample Preparation - Other in Sample Preparation	1			F*	Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2: A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework. Tool is completed. Used within FE & BE failure analysis
	183772	Axcelis Technologies	Axcelis Technologies	Compact II	Clean Room Ovens in Heat Treating Equipment	1			F*	Dresden, SN
Axcelis Compact II, 300mm, H2 Reflow Furnace, : Axcelis Compact II, 300mm, H2 Reflow Furnace, C4 Processing. Tool ID: OVN222 Serial Number :  H08046
	198362	Barr Murphy Atomizers	Barr Murphy Atomizers		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	3			F*	Newark, Delaware
Barr Murphy Atomizers: Barr Murphy Atomizers - Qty. 3 available -
	196448	Biological Safety Cabinet, 6’, Class II, Type A2	Biological Safety Cabinet, 6’, Class II, Type A2		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Wilmington, Delaware
Biological Safety Cabinet, 6’, Class II, Type A2: Biological Safety Cabinet, 6’, Class II, Type A2 The Baker Company SterilGARD III Advance, Model SG603A S/N 83216 Condition is excellent Unit appears to be in good working order with no noted damage Certification report 1/17, shows cabinet passed the following measurements: Velocity Profile, Hepa Filter Leak Test, Airflow Patterns, Alarm Performance Test.  Uniform Average velocity- Passed = 53lfm.  Inflow velocity - Passed = 279 lfm.  Downflow Velocity - Passed.
	202879	Blue M	Blue M	DCC 206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded
	204174	Blue M	Blue M	DDC 206CY Oven	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded in Warehouse
	181816	Blue M	Blue M	DCC-1406CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Blue M Electric Oven, DCC-1406CY: Blue M Electric Oven,  DCC-1406CY Tool ID: OVEN-01 (PEA106)
	203139	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				East Fishkill, New York
Blue M Electric Oven, DCC-206-EV-ST350: Blue M Electric Oven, DCC-206-EV-ST350
	203140	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				East Fishkill, New York
Blue M Electric Oven, DCC-206-EV-ST350: Blue M Electric Oven, DCC-206-EV-ST350
	183762	Blue M	Blue M	DDC-206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Blue M Electric Oven, DCC-206CY, 200mm, oven: Blue M Electric Oven,  DCC-206CY, 200mm, oven Tool ID : OVEN-01 (PEA052)
	196206	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				East Fishkill, New York
Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake: Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake S/N :DCC-832 MULTIPLE UNITS AVAILABLE!!  Please inquire
	192687	Blue M	Blue M	LO-90-P	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
BLUEM, TPS, LO-90-P, Atmospheric Oven: BLUEM, TPS, LO-90-P, Oven Atmospheric oven capable of 260°C 120V 1500W
	178423	Branson	Branson	5210DTH	Ultrasonic Baths in Cleaning and Degreasing Equipment	1			F*	Taichung, Taichung City
Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm: Status: Bagged and Skidded
	192696	Brookfield	Brookfield	DV2THCBCO	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
Brookfield, DV2THCBCO, Viscometer: Brookfield, DV2THCBCO, Viscometer Viscometer measures fluid viscosity at given shear rates
	204380	Infineon	Infineon	Bruchless Motor bench	Test & Measurement - Other in Test & Measurement Equipment	1	lot		F*N*	Le Puy-Sainte-Réparade, Provence-Alpes-Côte d'Azur
Bruchless Motor bench: Bruchless Motor bench assembled in our Provence Design Center, like new (only tested once). For more informations please refer to the enclosed diagram and the motor description below.  Brushless motor PMSM ME0913 24 to 96V VDC 12kW (30kW max) This three-phase motor works with the Kelly controller (described below) • Output Power of 12 KW Continuous, 30 KW Peak (at 96 volts) • Designed for long life. No brush maintenance. The motor is 92% efficient at voltages between 24 to 96 VDC. Continuous current of 125 amps AC (180 Amps DC into the motor control). This is a 3-phase, Y-connected Permanent Magnet Synchronous Motor with an axial air gap and 3 Hall sensors at 120 degrees electrical timing. It has two stators with a rotor in the center. • This is a 4 pole motor (8 magnets). • The Phase to Phase winding resistance is 0.013 Ohms. • The maximum recommended rotor speed is 5000 RPM. • Voltages from 0 to 96 VDC input to the control. • Torque constant of 0.15 Nm per Amp • The Inductance Phase to Phase is 0.10 Milli-Henry with a 28 turns per phase. • Armature Inertia is 45 Kg Cm Squared. • Continuous current of 125 Amps AC (180 Amps DC into the motor control). • Peak current of 420 Amps AC for 1 minute (600 Amps DC into the motor control). • Weight of 35 pounds. • Peak Stall Torque of 90 Nm (66 ft). • This is an Open Frame, Fan Cooled motor. Timed for counter-clockwise rotation (can be changed to clockwise).   Kelly KBL72301,24-72V,300A,BLDC Controller/With Regen Kelly KBL programmable BLDC motor controller provides efficient, smooth and quiet controls for golf cart, go-cart, electric motorcycle, forklift, hybrid vehicle, electrical vehicle, electric boat, as well as industry motor speed or torque control. Motor speed controller uses high power MOSFET, PWM to achieve efficiency 99% in most cases. Powerful microprocessor brings in comprehensive and precise control to BLDC motor controllers. This programmable brushless motor controller also allows users to set parameters, conduct tests, and obtain diagnostic information quickly and easily. Features: • Intelligence with powerful microprocessor. Synchronous rectification, ultra low drop and fast PWM to achieve very high efficiency. • Electronic reversing. • Voltage monitoring on 3 motor phases, bus, and power supply.Voltage monitoring on voltage source 12V and 5V. • Current sense on all 3 motor phases.Current control loop. • Hardware over current protection.Hardware over voltage protection. • Support torque mode, speed mode, and balanced mode operation. • Configurable limit for motor current and battery current. • Low EMC.LED fault code. • Battery protection: current cutback, warning and shutdown at configurable high and low battery voltage. • Rugged aluminum housing for maximum heat dissipation and harsh environment.Rugged high current terminals, and rugged aviation connectors for small signal. • Thermal protection: current cut back, warning and shutdown on high temperature.Configurable 60 degree or 120 degree hall position sensors.
	204303	Bruker, AFM, 300mm, InSight,	Bruker, AFM, 300mm, InSight,		Other Items in Microscopes	1			F*	Malta, New York
Bruker, AFM, 300mm, InSight, : Bruker, AFM, 300mm, InSight,    In Fab.  Warm Idle
	204304	Bruker, D8 Discover, 300mm, X-Ray Metrology	Bruker, D8 Discover, 300mm, X-Ray Metrology		Other Items in Microscopes	1			F*	Dresden, Saxony
Bruker, D8 Discover, 300mm, X-Ray Metrology: Bruker, D8 Discover, 300mm, X-Ray Metrology   In Lab,  Cold idle
	199447	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes	1				East Fishkill, New York
Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology S/N 204500 2009  The tool is an automated High resolution X-ray diffractometer, clean room (class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300 mm wafer mapping capabilities. The D8 FABLINE consists of two stainless steal cabinets attached to each other. The first one is an X-ray analytical module composed of: radiation safe enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated optical set-ups, and all required supplies. The second is a handling module Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP insert for 200mm..
	195987	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes	1				Singapore
Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology
	199780	BTU Engineering	BTU Engineering	TCAS 181-7-72-E-36	Clean Room Ovens in Heat Treating Equipment	1			F*	Burlington, Vermont
BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace: BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace S/N: IBVT-1
	190126	C-Sun Hot Air Circulation Oven	C-Sun Hot Air Circulation Oven		Ovens - Other in Ovens	1			F*	Towanda, Pennsylvania
C-Sun Hot Air Circulation Oven: C-Sun Hot Air Circulation Oven Serial Number:  mEMSZN05 Products Name:  QHMO-7S Internal Dimension:   W 1200 mm x D 920 mm x H 960 mm External Dimension:   W 2260 mm x D 1728 mm x H 1955 mm Temperature Range:  RT+30°C to 550°C (oven tag says max 600°C) Power Source: AC 240V 3Ph 60 Hz Heater:  3.8W x 12 paces = 45.6 KW Materials:  Inside SUS310#, outside SS41# Steel with paint Intake: N2 flow capacity gauge *User’s manual is available
	151284	LEICA CAMBRIDGE LTD	LEICA CAMBRIDGE LTD	Cambridge S260	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Regensburg, BY
Cambridge S260 Scanning Electron Microscope: Cambridge S260 Accelerating voltage: High (4KV-30KV) ; Low (0.3KV-3KV) Stage movement: X,Y Z direction Tilt (-10 to 90 degrees) R (360 degrees) Resolution Capability: 5nm (Accelerating voltage=30KV, WD=3mm) LOCATION: Malacca SERIAL NUMBER(S): 260-74-02
	195984	Cameca	Cameca	LEXFAB300	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Dresden, Saxony
CAMECA, LEXFAB300, 300mm, Diffusion Measurement: CAMECA, LEXFAB300, 300mm, Diffusion Measurement
	204314	Check Point Technolo	Check Point Technolo	InfraScanTDM 300 TDE	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			F*	Malta, New York
CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson: CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson
	166465	Oxford Instruments	Oxford Instruments	CMI 950	Xray Fluorescence Spectrometers in Spectrometers	1			F*	Regensburg, BY
CMI 950 - Xray fluorescence spectrometer: X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc. Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag). System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
	155054	Hitachi	Hitachi	EPL-8541HK8R	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1		12,719.63	F*	Regensburg, BY
COLOR COPIER: EPL 8541 COLOR COPIER-EPL 8541 LOCATION: Malacca SERIAL NUMBER(S): 1N0058
	185296	Daitron	Daitron	EMTEC CVP-80	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Singapore
Daitron / EMTEC, CVP - 80, Edge Grinder, : Daitron / EMTEC, CVP - 80, Edge Grinder,
	203282	E.A. Fischione Instr	E.A. Fischione Instr	1030	Polishing & Grinding Sample Prep Equipment in Sample Preparation	1				East Fishkill, New York
E.A. Fischione Instruments Inc., 1030, NanoMill: E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep. Automated Sample Preparation System
	203280	E.A. Fischione Instr	E.A. Fischione Instr	1060	Polishing & Grinding Sample Prep Equipment in Sample Preparation	1				East Fishkill, New York
E.A. Fischione Instruments Inc., 1060, NanoMill: E.A. Fischione Instruments Inc., 1060, NanoMill   Ion MIll
	200230	E.A. Fischione Instr	E.A. Fischione Instr	2040	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			F*	East Fishkill, New York
E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder: E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder Still in Use S/N: 23492
	192502	ECI Technology	ECI Technology	QL-10EZ	Test & Measurement - Other in Test & Measurement Equipment	1			F*	Malta, New York
ECI TECHNOLOGY, QL-10EZ, Plating Bath CVS : ECI TECHNOLOGY, QL-10EZ, Plating Bath CVS  Cyclic Voltammetric Stripping tool used for plating bath analysis Specifications: • ECI's proprietary and patented analysis techniques • Inorganic component analysis using titration and spectroscopy • Analytical methods include CVS, CPVS, PT, Spectroscopy, pH • Analytical procedures include LAT, MLAT, DT, DCA, DPT, RDT, QC, RC Typical Applications Electroplating Organic additives and inorganic components in baths for Cu, Ni, Sn, Sn/Pb, Pd, Zn, Co/Ni Electro-less Metals, reducing agents, complexing agents, buffering agents, background ions in electro-less deposition for Co, Cu, Ni, Pd and related auxiliary solutions Features: • CVS and CVS Express techniques for the analysis of organic bath components • Potentiometric titration for the analysis of inorganic components • RDT analytical technique for Nickel • Analysis of breakdown products and contaminants • Best accuracy and reproducibility on the market • The largest applications library in the industry • Automatic syringe delivery system • New CVS II head offers greater rotation speed range for analyzing novel chemistries • New user-friendly software offers: - Greater flexibility - Embedded online help - “Get Me Expert”: Easily accessible, user-friendly factory support • Advanced reporting and data handling including statistics, trend analysis and history management • State of the art hardware and OS for faster operation and low power consumption • Communication - TCP/IP networking, LIMS
	202880	FEI	FEI	PHILIPS XL30S, SEM	Microscopes - Other in Optical Microscopes	1				Singapore
FEI PHILIPS XL30S, SEM: FEI PHILIPS XL30S, SEM   PHILIPS XL 30S FEG SEM & DX4I SYSTEM
	203116	FEI	FEI	CLM + Dual Beam	Microscopes - Other in Optical Microscopes	1				Malta, New York
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool: FEI, CLM + Dual Beam FIB, TEM Sample Prep tool In Lab.  Idle
	202148	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool   Cold Shutdown in the lab
	203115	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes	1				Malta, New York
FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   Connected Idle.
	195353	FEI	FEI	DA300	Microscopes - Other in Optical Microscopes	1				Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis: FEI, DA300, 300mm, FIB, Defect Analysis S/N : D253
	202895	FEI	FEI	DA300	Microscopes - Other in Optical Microscopes	1				Singapore
FEI, DA300, FIB, TEM Sample Preparation: FEI, DA300, FIB, TEM Sample Preparation   In RQA Lab.  Unhooked
	202147	FEI	FEI	Ex-Situ Plucker	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage
	203114	FEI	FEI	TEMLINK - KY02, 14771-003	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool
	199704	FEI	FEI	EXPIDA	Scanning Electron Microscopes in Inspection Equipment	1			F*	Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm : FEI, EXPIDA, Dual Beam FIB, 300mm  COLD.  Off Line
	203117	FEI	FEI	ExSolve 2 WTP EFEM	Microscopes - Other in Optical Microscopes	1				Malta, New York
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB: FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab.  Warm shutdown.
	202853	FEI	FEI	FIB 200	Microscopes - Other in Optical Microscopes	1				Singapore
FEI, FIB, 200, TEM Sample Preparation: FEI, FIB, 200, TEM Sample Preparation in QRA Lab
	203122	FEI	FEI	Helios 400	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Malta, New York
FEI, Helios 400, NanoLab Dual Beam FIB : FEI, Helios 400, NanoLab Dual Beam FIB
	203283	FEI	FEI	Helios 400	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				East Fishkill, New York
FEI, Helios 400, NanoLab Dual Beam FIB : FEI, Helios 400, NanoLab Dual Beam FIB
	202496	FEI	FEI	Helios 600 NanoLab	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Dresden, Saxony
FEI, Helios 600, NanoLab, Dual Beam FIB, : FEI, Helios 600 NanoLab, Dual Beam FIB   S/N : D404   Vintage : 2009
	202837	FEI	FEI	Strata FIB 205	Microscopes - Other in Optical Microscopes	1				Singapore
FEI, Strata FIB 205, TEM Sample Preparation: FEI, Strata FIB 205, TEM Sample Preparation
	203120	FEI	FEI	Technia G2 F20 TEM	Microscopes - Other in Optical Microscopes	1				Malta, New York
FEI, TEM Tecnai G2 F20, TEM,: FEI, TEM Tecnai G2 F20, TEM ,
	203121	FEI	FEI	Tecnai G2 F20	Microscopes - Other in Optical Microscopes	1				Malta, New York
FEI, TEM Tecnai G2 F20, TEM,: FEI, TEM Tecnai G2 F20, TEM,   On line, operational
	190524	Fisher Sci	Fisher Sci	FD400 Binder Oven	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
Fisher Scientific, FD400, Precision Binder, 200mm: Fisher Scientific, FD400, Precision Binder, 200mm
	194537	Fisher Sci	Fisher Sci	FD 720 Binder Precision Oven	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
FISHER Scientific, FD720, Oven, 200mm: FISHER Scientific, FD720, Oven, 200mm FISHER Scientific, FD720, Precision Oven, 200mm In the Fab
	194540	Fisher Sci	Fisher Sci	FED720	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm Precision Binder Oven S/N : 00-08042
	189084	Fisher Sci	Fisher Sci	FED 720	Clean Room Ovens in Heat Treating Equipment	1			F*	Singapore
FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm In the Fab
	179078	General Electric	General Electric	GE MS6001B DLN-1	Industrial Gas Turbines (<50MW) in Gas Plant Equipment	1			F*	Texas City, Texas
Gas Turbine: Turbine includes the following: Air Cooled Generator 336X482 GE Gas Turbine 296624 Air Filter Housing  GTG 51 Controls GTG 51 Spare parts Auxillaries: Lube Oil Skid, Starting Motor, Starting Motor Gearbox, Exciter and Exciter to Gen Gearbox.
	183208	GEMETEC	GEMETEC	Elymat III	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1			F*	East Fishkill, NY
GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool: GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length.  A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured.  The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode). In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers.  Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent.  Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material.  Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination.  Measuring at different laser intensities allows major contaminants such as iron to be identified.  This is known as Injection Level Spectroscopy (ILS). Measurement Precision -Diffusion length:  5% over 10 repeated measurements Measurement Accuracy -Diffusion length:  10% compared with similar techniques.
	178414	GEMETEC	GEMETEC	WSPS53	Spectrometers - Other in Spectrometers	1			F*	Taichung, Taichung City
GEMETEC, Gas Analyzer, 300mm: Status: Bagged and Skidded
	204292	GEMETEC	GEMETEC	WSPWS 2 M S	Spectrometers - Other in Spectrometers	1			F*	Dresden, Saxony
GeMeTec, WSPS 2 M S, 200mm: GeMeTec, WSPS 2 M S, 200mm   VPD Analysis Tool
	195858	GRETA Multifermentor System & Gas Sampling Valves	GRETA Multifermentor System & Gas Sampling Valves		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment	1				Wilmington, Delaware
GRETA Multifermentor System & Gas Sampling Valves : Belach Bioteknik GRETA Multifermentor System & Gas Sampling Valves 6 x 2L stainless steel, pressure rated, fed-batch, fermenters, thermally sterilizable in place, fermentation system, with monitored and controlled operational parameters Manufacturer: Belach Bioteknik Model: GRETA Serial #: BE0101 *This unit was purchased in 2015 and only in use for a year *used infrequently and in working condition when decomissioned
	202146	Hitachi	Hitachi	HF-2000	Microscopes - Other in Optical Microscopes	1				East Fishkill, New York
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging: Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM   1995 Vintage S/N : 6214-3 Un-hooked in lab.
	178296	Hitachi	Hitachi	Microanalysis System	Scanning Electron Microscopes in Inspection Equipment	1			F*	Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm: Status: Bagged and Skidded
	178294	Hitachi	Hitachi	AS5000	Scanning Electron Microscopes in Inspection Equipment	1			F*	Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm: Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server
	203281	Hitachi	Hitachi	S-5200	Scanning Electron Microscopes in Inspection Equipment	1				East Fishkill, New York
Hitachi, S-5200, SEM, Ultra High Resolution: Hitachi, S-5200, SEM, Ultra High Resolution
	192497	Hitachi	Hitachi	S-5500	Scanning Electron Microscopes in Inspection Equipment	1			F*	Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm: Hitachi, S-5500- Schanning Electron Microscope, 300mm
	195362	Hitachi	Hitachi	S-9380	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	Singapore
Hitachi, S-9380, CD SEM, 300mm: Hitachi, S-9380, CD SEM, 300mm Tool is Bagged & Skidded in Warehouse S/N : 2146-01
	197918	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*	Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm !!! Multiple Units Available!!!  Please Inquire
	204498	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes	1			N*	Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm   Bagged & Skidded in Warehouse
	204499	Hitachi	Hitachi	S9380II	Critical Dimension Scanning Electron Microscopes in Microscopes	1			F*N*	Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm: Hitachi, S-9380II, CD-SEM, 300mm
	178288	Hitachi	Hitachi	S-9380II	Critical Dimension Scanning Electron Microscopes in Microscopes	1				Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm: Manufactured in 2007; Status: Bagged and Skidded
	178299	Hitachi	Hitachi	Z-5700	Scanning Electron Microscopes in Inspection Equipment	1			F*	Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm: Status: Bagged and Skidded
	199446	HMI, EP3, 300mm, E-Beam Inspection System	HMI, EP3, 300mm, E-Beam Inspection System		Other Items in Microscopes	1				East Fishkill, New York
HMI, EP3, 300mm, E-Beam Inspection System: HMI, EP3, 300mm, E-Beam Inspection System
	204305	HMI, eP4 320, 300mm, ebeam Inspection	HMI, eP4 320, 300mm, ebeam Inspection		Other Items in Microscopes	1				Malta, New York
HMI, eP4 320, 300mm, ebeam Inspection: HMI, eP4 320, 300mm, ebeam Inspection   In the Fab.  Cold Idle
	199986	HMI, eScan 320, 300mm, ebeam Inspection	HMI, eScan 320, 300mm, ebeam Inspection		Other Items in Microscopes	1			F*	Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection: HMI, eScan 320, 300mm, ebeam Inspection
	202885	Horiba Ltd	Horiba Ltd	Ramen T-64	Interferometers in Optical Inspection Equipment	1				Singapore
Horiba, Ramen, T64000, Spectrosope: Horiba, Ramen, T64000, Spectrosope In QRA Lab. Vintage is 2011
	181188	HSEB	HSEB	Axiospect 300	Wafer Inspection Microscopes in Optical Microscopes	1				Dresden, Saxony
HSEB Axiospect 300, 300mm Wafer inspection microscope: HSEB Axiospect 300, 300mm Wafer inspection microscope Stereo Microscope Tool ID: OPI905 Serial Number: 41302020182 !!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Scientific and Laboratory Equipment: Accretech, Agilent, Ancosys, Anton PAAR, Applied Materials, Inc., ASML, Asymtek, Axcelis Technologies GmbH, Blue M, Branson, brimrose, Brookfield Engineering Labs, BTU Engineering, Cameca, Check Point Technologies, Daitron, Dr.-Ing. Werth GmBH, E.A. Fischione Instr, ECI Technology, Ergolux, FEI, Fisher Scientific, GEMETEC, General Electric, Hitachi, Horiba Ltd, HSEB, Infineon, JEOL, Keithley, Kinetic Systems, Inc., KLA-Tencor, Lasertech, LEICA CAMBRIDGE LTD, LINK ANALYTICAL LTD, Lyncee, MASS-PCB, McGraw Edison, Metron, NCB Network, Negevtech Ltd., Nova, NSC, NuAire Inc, Oxford Instruments, Park Systems Inc, Perkin Elmer, Physical Electronics, Prometrix, Quantum Focus Instruments, Rigaku, Rudolph Technologies, Inc., Scientek Technology Corp, SDI Diagnostics Inc, SELA, SOLVISION, Sopra, Suss MicroTec, Temptronics, Therma-Wave, Thermo-Fisher, VWR Scientific Products, Waters, Zeiss