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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
190444
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101DA-01


2006 DOM

Still in the fab, warm idle
190445
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00103CB-01

DOM: 2006

190446
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101GB-01

DOM: 2007

178308
Accretech  

Accretech  

Win-Win 50 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Taichung, Taichung City
Accretech, Win-Win 50,Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
203884
Agilent  

Agilent  

5977B  

List all items of this typeSpectrometers - Other

in Spectrometers

1   Chengdu, Sichuan
Agilent, 5977B, GC MS, w/ MARKES TD 100:

Agilent, 5977B, GC MS, w/ MARKES TD 100

 

This is a brand new tool (2018 vintage), unopened in original OEM packaging

204491
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F*N* Taichung, Taichung City
Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

 

Bagged & Skidded in Warehouse

204492
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

1   N* Taichung, Taichung City
Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

Bagged & Skidded in Warehouse

204288
Agilent  

Agilent  

81110A 

List all items of this typeSpectrometers - Other

in Spectrometers

1   Taichung, Taichung City
Agilent,81110A, Pulse Pattern Generator:

Agilent,81110A, Pulse Pattern Generator

204302
Ancosys  

Ancosys  

P13010 Ancolyzer 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Malta, New York
Ancosys, P13010 Ancolyzer, :

Ancosys, P13010 Ancolyzer, 

Cu Plating Bath Analyzer

203072
Anton PAAR  

Anton PAAR  

MCR301  

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Dresden, Saxony
Anton Paar, Viscometer, MCR301, :

Anton Paar, Viscometer, MCR301, 

203103
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

203104
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

203105
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

203106
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

203107
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

200691
Applied Materials  

Applied Materials  

COMPLUS mp3 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore
Applied Materials, Complus, Particle Measurement, 300mm:

Applied Materials, Complus, Particle Measurement, 300mm

Manufactured in 2007; Status: Bagged and Skidded
178309
AMAT  

AMAT  

Complus 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore
Applied Materials, Complus, Particle Measurement, 300mm:

Manufactured in 2007; Status: Bagged and Skidded

MULTIPLE UNITS AVAILALBE!!! Please inquire.

 

S/N : T2106

195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
203074
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

203075
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

204039
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm:

Applied Materials, SEMVision G3, DR-SEM, 300mm

missing some of the PC's in the electronic rack

Bagged & Skidded in Warehouse

2006 Vintage

178310
AMAT  

AMAT  

Uvision 200 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Applied Materials, Uvision 200, Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
204384
ASML  

ASML  

XT:1250D 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   N* Dresden, Saxony
ASML, 300mm, XT:1250D, :

ASML, 300mm, XT:1250D, 

S/N : m5125

197858
ASML  

ASML  

TWINSCAN XT:850F 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Veldhoven, North Brabant
ASML, XT: 850F, 300mm, KrF, :

ASML, TWINSCAN XT:850F, 300mm, KrF, 

S/N: m7691

Laser model CYMER ELS-7610K (40W)
MES machine type XT850F
OIU/Reticle-/Waf.aux.port Right Configuration
Power 400 Volt

In warehouse stored.

192588
Asymtek  

Asymtek  

S-800 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Malta, New York
ASYMTEK, S-800, Adhesive Dispense Tool, :
NORDSON ASYMTEK, S-820B, Adhesive Dispense Tool, 


S-820B Specification and Facility Requirements
Motion System:
Type: Brushless DC servo motors, closed-loop with encoder feedback
Encoder Resolution: 10 micrometer
Positional Accuracy: ±0.075 mm (0.003 in.), 3 sigma
Placement Accuracy: ±0.100 mm (0.004 in.), 3 sigma
X-Y Acceleration: 0.25 g peak with S-curve jerk control
X-Y Velocity: 500 mm/s (20 in./s)
Z-Axis Velocity: 500 mm/s (20 in./s)
X-Y Repeatability: ±0.025 mm (0.001 in.)
Z-Axis Repeatability: ±0.025 mm (0.001 in.)
Dispense Area:
Work Envelope: 350 x 350 mm (14 x 14 in.)
Z-Travel: 75 mm
Tool Payload: 3 kg
Workpiece Payload: 2 kg
Vision and Lighting:
Vision: Vision system with Automatic Pattern Recognition
Lighting: Programmable, on-axis, red/blue LED, 256 steps
Computer:
Computer: Windows-based PC
User interface: Color LCD flat-panel display; ASCII keyboard & pointing device; Ethernet network port
Software:
User Environment: Fluidmove®
Operating System: Windows®
Dimensions:
See dimensional drawings on next page.
Facility Requirements:
System Footprint: 866 mm wide X 1123 mm deep (34 x 44 in.)
Display extends unit 610 mm (24 in.)
Height including light beacon: 2045 mm

Air Supply: 621 kPa (6.1 atm, 90 psi) 3 CFM @ 90 psi (28 liters/hr = 1 SCFM)

(May be higher depending upon application)

Power (Mains): 200/240 VAC, 8.5 Amps (max), 50/60 Hz, Single Phase
Weight: 364 kg (800 lbs)

176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

183772
Axcelis Technologies  

Axcelis Technologies  

Compact II  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Dresden, SN
Axcelis Compact II, 300mm, H2 Reflow Furnace, :
Axcelis Compact II, 300mm, H2 Reflow Furnace,

C4 Processing.

Tool ID: OVN222

Serial Number :  H08046
198362
Barr Murphy Atomizers 
Barr Murphy Atomizers 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

3   F* Newark, Delaware
Barr Murphy Atomizers:

Barr Murphy Atomizers
- Qty. 3 available
-

196448
Biological Safety Cabinet, 6’, Class II, Type A2 
Biological Safety Cabinet, 6’, Class II, Type A2 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Wilmington, Delaware
Biological Safety Cabinet, 6’, Class II, Type A2:

Biological Safety Cabinet, 6’, Class II, Type A2

The Baker Company

SterilGARD III Advance,
Model SG603A

S/N 83216

Condition is excellent
Unit appears to be in good working order with no noted damage

Certification report 1/17, shows cabinet passed the following measurements: Velocity Profile, Hepa Filter Leak Test, Airflow Patterns, Alarm Performance Test.  Uniform Average velocity- Passed = 53lfm.  Inflow velocity - Passed = 279 lfm.  Downflow Velocity - Passed.

 

 

 

 

 

202879
Blue M  

Blue M  

DCC 206CY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Singapore
Blue M Electric Oven, DCC 206CY:

Blue M Electric Oven, DCC 206CY

 

Bagged & Skidded

204174
Blue M  

Blue M  

DDC 206CY Oven 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Singapore
Blue M Electric Oven, DCC 206CY:

Blue M Electric Oven, DCC 206CY

 

Bagged & Skidded in Warehouse

181816
Blue M  

Blue M  

DCC-1406CY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Singapore
Blue M Electric Oven, DCC-1406CY:
Blue M Electric Oven,  DCC-1406CY
Tool ID: OVEN-01 (PEA106)
203139
Blue M  

Blue M  

DCC-206-EV-ST350 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   East Fishkill, New York
Blue M Electric Oven, DCC-206-EV-ST350:

Blue M Electric Oven, DCC-206-EV-ST350

203140
Blue M  

Blue M  

DCC-206-EV-ST350 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   East Fishkill, New York
Blue M Electric Oven, DCC-206-EV-ST350:

Blue M Electric Oven, DCC-206-EV-ST350

183762
Blue M  

Blue M  

DDC-206CY 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Singapore
Blue M Electric Oven, DCC-206CY, 200mm, oven:
Blue M Electric Oven,  DCC-206CY, 200mm, oven

Tool ID : OVEN-01 (PEA052)
196206
Blue M  

Blue M  

DCC-206-EV-ST350 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   East Fishkill, New York
Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake:

Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake

S/N :DCC-832

MULTIPLE UNITS AVAILABLE!!  Please inquire

192687
Blue M  

Blue M  

LO-90-P 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Malta, New York
BLUEM, TPS, LO-90-P, Atmospheric Oven:
BLUEM, TPS, LO-90-P, Oven

Atmospheric oven capable of 260°C 120V 1500W
178423
Branson  

Branson  

5210DTH 

List all items of this typeUltrasonic Baths

in Cleaning and Degreasing Equipment

1   F* Taichung, Taichung City
Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm:
Status: Bagged and Skidded
192696
Brookfield  

Brookfield  

DV2THCBCO 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Malta, New York
Brookfield, DV2THCBCO, Viscometer:
Brookfield, DV2THCBCO, Viscometer

Viscometer measures fluid viscosity at given shear rates
204380
Infineon  

Infineon  

Bruchless Motor bench 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

1 lot   F*N* Le Puy-Sainte-Réparade, Provence-Alpes-Côte d'Azur
Bruchless Motor bench:

Bruchless Motor bench assembled in our Provence Design Center, like new (only tested once).

For more informations please refer to the enclosed diagram and the motor description below. 

Brushless motor PMSM ME0913 24 to 96V VDC 12kW (30kW max)

This three-phase motor works with the Kelly controller (described below)

• Output Power of 12 KW Continuous, 30 KW Peak (at 96 volts)

• Designed for long life. No brush maintenance. The motor is 92% efficient at voltages between 24 to 96 VDC. Continuous current of 125 amps AC (180 Amps DC into the motor control). This is a 3-phase, Y-connected Permanent Magnet Synchronous Motor with an axial air gap and 3 Hall sensors at 120 degrees electrical timing. It has two stators with a rotor in the center.

• This is a 4 pole motor (8 magnets).

• The Phase to Phase winding resistance is 0.013 Ohms.

• The maximum recommended rotor speed is 5000 RPM.

• Voltages from 0 to 96 VDC input to the control.

• Torque constant of 0.15 Nm per Amp

• The Inductance Phase to Phase is 0.10 Milli-Henry with a 28 turns per phase.

• Armature Inertia is 45 Kg Cm Squared.

• Continuous current of 125 Amps AC (180 Amps DC into the motor control).

• Peak current of 420 Amps AC for 1 minute (600 Amps DC into the motor control).

• Weight of 35 pounds.

• Peak Stall Torque of 90 Nm (66 ft).

• This is an Open Frame, Fan Cooled motor. Timed for counter-clockwise rotation (can be changed to clockwise).

 

Kelly KBL72301,24-72V,300A,BLDC Controller/With Regen

Kelly KBL programmable BLDC motor controller provides efficient, smooth and quiet controls for golf cart, go-cart, electric motorcycle, forklift, hybrid vehicle, electrical vehicle, electric boat, as well as industry motor speed or torque control.

Motor speed controller uses high power MOSFET, PWM to achieve efficiency 99% in most cases. Powerful microprocessor brings in comprehensive and precise control to BLDC motor controllers. This programmable brushless motor controller also allows users to set parameters, conduct tests, and obtain diagnostic information quickly and easily.

Features:

• Intelligence with powerful microprocessor. Synchronous rectification, ultra low drop and fast PWM to achieve very high efficiency.

• Electronic reversing.

• Voltage monitoring on 3 motor phases, bus, and power supply.Voltage monitoring on voltage source 12V and 5V.

• Current sense on all 3 motor phases.Current control loop.

• Hardware over current protection.Hardware over voltage protection.

• Support torque mode, speed mode, and balanced mode operation.

• Configurable limit for motor current and battery current.

• Low EMC.LED fault code.

• Battery protection: current cutback, warning and shutdown at configurable high and low battery voltage.

• Rugged aluminum housing for maximum heat dissipation and harsh environment.Rugged high current terminals, and rugged aviation connectors for small signal.

• Thermal protection: current cut back, warning and shutdown on high temperature.Configurable 60 degree or 120 degree hall position sensors.

204303
Bruker, AFM, 300mm, InSight,  
Bruker, AFM, 300mm, InSight,  

List all items of this typeOther Items

in Microscopes

1   F* Malta, New York
Bruker, AFM, 300mm, InSight, :

Bruker, AFM, 300mm, InSight, 

 

In Fab.  Warm Idle

204304
Bruker, D8 Discover, 300mm, X-Ray Metrology 
Bruker, D8 Discover, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
Bruker, D8 Discover, 300mm, X-Ray Metrology:

Bruker, D8 Discover, 300mm, X-Ray Metrology

 

In Lab,  Cold idle

199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
insert for 200mm..
195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   Singapore
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


199780
BTU Engineering  

BTU Engineering  

TCAS 181-7-72-E-36 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Burlington, Vermont
BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace:

BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace

S/N: IBVT-1

190126
C-Sun Hot Air Circulation Oven 
C-Sun Hot Air Circulation Oven 

List all items of this typeOvens - Other

in Ovens

1   F* Towanda, Pennsylvania
C-Sun Hot Air Circulation Oven:

C-Sun Hot Air Circulation Oven

Serial Number:  mEMSZN05

Products Name:  QHMO-7S

Internal Dimension:   W 1200 mm x D 920 mm x H 960 mm

External Dimension:   W 2260 mm x D 1728 mm x H 1955 mm

Temperature Range:  RT+30°C to 550°C (oven tag says max 600°C)

Power Source: AC 240V 3Ph 60 Hz

Heater:  3.8W x 12 paces = 45.6 KW

Materials:  Inside SUS310#, outside SS41# Steel with paint

Intake: N2 flow capacity gauge

*User’s manual is available

151284
LEICA CAMBRIDGE LTD  

LEICA CAMBRIDGE LTD  

Cambridge S260 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Regensburg, BY
Cambridge S260 Scanning Electron Microscope:
Cambridge S260

Accelerating voltage: High (4KV-30KV) ; Low (0.3KV-3KV) Stage movement: X,Y Z direction Tilt (-10 to 90 degrees) R (360 degrees) Resolution Capability: 5nm (Accelerating voltage=30KV, WD=3mm)
LOCATION: Malacca
SERIAL NUMBER(S): 260-74-02
195984
Cameca  

Cameca  

LEXFAB300 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Dresden, Saxony
CAMECA, LEXFAB300, 300mm, Diffusion Measurement:
CAMECA, LEXFAB300, 300mm, Diffusion Measurement
204314
Check Point Technolo  

Check Point Technolo  

InfraScanTDM 300 TDE 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   F* Malta, New York
CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson:

CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson

 

166465
Oxford Instruments  

Oxford Instruments  

CMI 950 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1   F* Regensburg, BY
CMI 950 - Xray fluorescence spectrometer:
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).

System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
155054
Hitachi  

Hitachi  

EPL-8541HK8R 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1 12,719.63 F* Regensburg, BY
COLOR COPIER:
EPL 8541

COLOR COPIER-EPL 8541
LOCATION: Malacca
SERIAL NUMBER(S): 1N0058
185296
Daitron  

Daitron  

EMTEC CVP-80 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Singapore
Daitron / EMTEC, CVP - 80, Edge Grinder, :
Daitron / EMTEC, CVP - 80, Edge Grinder,
203282
E.A. Fischione Instr  

E.A. Fischione Instr  

1030 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   East Fishkill, New York
E.A. Fischione Instruments Inc., 1030, NanoMill:

E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep.

Automated Sample Preparation System

 

 

203280
E.A. Fischione Instr  

E.A. Fischione Instr  

1060 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   East Fishkill, New York
E.A. Fischione Instruments Inc., 1060, NanoMill:

E.A. Fischione Instruments Inc., 1060, NanoMill

 

Ion MIll

200230
E.A. Fischione Instr  

E.A. Fischione Instr  

2040 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   F* East Fishkill, New York
E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder:
E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder

Still in Use

S/N: 23492
192502
ECI Technology  

ECI Technology  

QL-10EZ 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

1   F* Malta, New York
ECI TECHNOLOGY, QL-10EZ, Plating Bath CVS :
ECI TECHNOLOGY, QL-10EZ, Plating Bath CVS 

Cyclic Voltammetric Stripping tool used for plating bath analysis

Specifications:
• ECI's proprietary and patented analysis techniques
• Inorganic component analysis using titration and spectroscopy
• Analytical methods include CVS, CPVS, PT, Spectroscopy, pH
• Analytical procedures include LAT, MLAT, DT, DCA, DPT, RDT, QC, RC

Typical Applications
Electroplating
Organic additives and inorganic components in baths for Cu, Ni, Sn,
Sn/Pb, Pd, Zn, Co/Ni
Electro-less
Metals, reducing agents, complexing agents, buffering
agents, background ions in electro-less deposition for Co,
Cu, Ni, Pd and related auxiliary solutions

Features:
• CVS and CVS Express techniques for the analysis of organic bath components
• Potentiometric titration for the analysis of inorganic components
• RDT analytical technique for Nickel
• Analysis of breakdown products and contaminants
• Best accuracy and reproducibility on the market
• The largest applications library in the industry
• Automatic syringe delivery system
• New CVS II head offers greater rotation speed range for analyzing novel
chemistries
• New user-friendly software offers:
- Greater flexibility
- Embedded online help
- “Get Me Expert”: Easily accessible, user-friendly factory support
• Advanced reporting and data handling including statistics, trend analysis and
history management
• State of the art hardware and OS for faster operation and low power consumption
• Communication - TCP/IP networking, LIMS

202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 

195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

203122
FEI  

FEI  

Helios 400 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Malta, New York
FEI, Helios 400, NanoLab Dual Beam FIB :

FEI, Helios 400, NanoLab Dual Beam FIB 

203283
FEI  

FEI  

Helios 400 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   East Fishkill, New York
FEI, Helios 400, NanoLab Dual Beam FIB :

FEI, Helios 400, NanoLab Dual Beam FIB 

 

202496
FEI  

FEI  

Helios 600 NanoLab 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Dresden, Saxony
FEI, Helios 600, NanoLab, Dual Beam FIB, :

FEI, Helios 600 NanoLab, Dual Beam FIB

 

S/N : D404

 

Vintage : 2009 

 

 

202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

,

203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

190524
Fisher Sci  

Fisher Sci  

FD400 Binder Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
Fisher Scientific, FD400, Precision Binder, 200mm:
Fisher Scientific, FD400, Precision Binder, 200mm
194537
Fisher Sci  

Fisher Sci  

FD 720 Binder Precision Oven 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
FISHER Scientific, FD720, Oven, 200mm:

FISHER Scientific, FD720, Oven, 200mm

FISHER Scientific, FD720, Precision Oven, 200mm

In the Fab
194540
Fisher Sci  

Fisher Sci  

FED720  

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
FISHER Scientific, FED720, Oven, 200mm:

FISHER Scientific, FED720, Oven, 200mm

Precision Binder Oven

S/N : 00-08042

189084
Fisher Sci  

Fisher Sci  

FED 720 

List all items of this typeClean Room Ovens

in Heat Treating Equipment

1   F* Singapore
FISHER Scientific, FED720, Oven, 200mm:
FISHER Scientific, FED720, Oven, 200mm

In the Fab
179078
General Electric  

General Electric  

GE MS6001B DLN-1 

List all items of this typeIndustrial Gas Turbines (<50MW)

in Gas Plant Equipment

1   F* Texas City, Texas
Gas Turbine:

Turbine includes the following:
Air Cooled Generator 336X482
GE Gas Turbine 296624

Air Filter Housing 
GTG 51 Controls
GTG 51 Spare parts
Auxillaries: Lube Oil Skid, Starting Motor, Starting Motor Gearbox,
Exciter and Exciter to Gen Gearbox.

183208
GEMETEC  

GEMETEC  

Elymat III 

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   F* East Fishkill, NY
GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool:
GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool

The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length.  A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured.  The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode).

In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers.  Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent.  Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material.  Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination.  Measuring at different laser intensities allows major contaminants such as iron to be identified.  This is known as Injection Level Spectroscopy (ILS).

Measurement Precision -Diffusion length:  5% over 10 repeated measurements

Measurement Accuracy -Diffusion length:  10% compared with similar techniques.

178414
GEMETEC  

GEMETEC  

WSPS53 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F* Taichung, Taichung City
GEMETEC, Gas Analyzer, 300mm:
Status: Bagged and Skidded
204292
GEMETEC  

GEMETEC  

WSPWS 2 M S 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F* Dresden, Saxony
GeMeTec, WSPS 2 M S, 200mm:

GeMeTec, WSPS 2 M S, 200mm

 

VPD Analysis Tool

195858
GRETA Multifermentor System & Gas Sampling Valves  
GRETA Multifermentor System & Gas Sampling Valves  

List all items of this typeScientific and Laboratory Equipment - Other

in Pharmaceutical Laboratory and Scientific Equipment

1   Wilmington, Delaware
GRETA Multifermentor System & Gas Sampling Valves :

Belach Bioteknik GRETA Multifermentor System & Gas Sampling Valves
6 x 2L stainless steel, pressure rated, fed-batch, fermenters, thermally sterilizable in place, fermentation system, with monitored and controlled operational parameters

  • Manufacturer: Belach Bioteknik
  • Model: GRETA
  • Serial #: BE0101

*This unit was purchased in 2015 and only in use for a year
*used infrequently and in working condition when decomissioned

202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

 

192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
204498
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   N* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse

204499
Hitachi  

Hitachi  

S9380II  

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F*N* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

178288
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Manufactured in 2007; Status: Bagged and Skidded

178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
199446
HMI, EP3, 300mm, E-Beam Inspection System 
HMI, EP3, 300mm, E-Beam Inspection System 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
HMI, EP3, 300mm, E-Beam Inspection System:

HMI, EP3, 300mm, E-Beam Inspection System

204305
HMI, eP4 320, 300mm, ebeam Inspection 
HMI, eP4 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

1   Malta, New York
HMI, eP4 320, 300mm, ebeam Inspection:

HMI, eP4 320, 300mm, ebeam Inspection

 

In the Fab.  Cold Idle

199986
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

1   F* Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection:
HMI, eScan 320, 300mm, ebeam Inspection
202885
Horiba Ltd  

Horiba Ltd  

Ramen T-64 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Singapore
Horiba, Ramen, T64000, Spectrosope:

Horiba, Ramen, T64000, Spectrosope

In QRA Lab.

Vintage is 2011

181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB Axiospect 300, 300mm Wafer inspection microscope:

HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182


!!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!

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NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Scientific and Laboratory Equipment:
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