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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	209845	200mm THIN WAFER Loader NSX	200mm THIN WAFER Loader NSX		Test & Measurement - Other in Test & Measurement Equipment 200mm THIN WAFER Loader NSX: 200mm THIN WAFER Loader NSX “NIDEC SANKYO Corporation” , Model: “SR8220-019”, SN. „FR00891253“	1		1,203.29		Dresden, Saxony
	206534	ABB Engineering	ABB Engineering	IRB120	Polishing & Grinding Sample Prep Equipment in Sample Preparation ABB, IRB120, Sample Polishing Robot. : ABB, IRB120, Sample Polishing Robot.	1			F*	Singapore
	190445	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00103CB-01 DOM: 2006	1				Dresden, Saxony
	190446	Accretech	Accretech	Win-Win 50 - A5000, Hurricane	Optical Inspection - Other in Optical Inspection Equipment Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm: Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm Serial Number: R00101GB-01 DOM: 2007	1			F*	Dresden, Saxony
	207367	Accretech	Accretech	Win-Win 50	Optical Inspection - Other in Optical Inspection Equipment Accretech, Win-Win 50,Bright Field Inspection, 300mm: Accretech, Win-Win 50,Bright Field Inspection, 300mm S/N : R00102CB-01 (WW#153) Bagged & Skidded in Warehouse.	1				Taichung, Taichung City
	207378	Accretech	Accretech	Win-Win 50	Optical Inspection - Other in Optical Inspection Equipment Accretech, Win-Win 50,Bright Field Inspection, 300mm: Accretech, Win-Win 50, TSK1600, Bright Field Inspection, 300mm Bagged & Skidded in Warehouse S/N : R00101LZ-01 (WW#152)	1				Taichung, Taichung City
	178308	Accretech	Accretech	Win-Win 50	Optical Inspection - Other in Optical Inspection Equipment Accretech, Win-Win 50,Bright Field Inspection, 300mm: Manufactured in 2005; Status: Bagged and Skidded !!!MULTIPLE UNITS AVAILABLE!!! Please inquire	1			F*	Taichung, Taichung City
	210076	ADE	ADE	EpiScan	Interferometers in Optical Inspection Equipment ADE, EpiScan, 200mm, Epi Thickness Measurement System : ADE, EpiScan, 200mm, Epi Thickness Measurement System  Not Working "Detector of spectrometer is dead"	1				Burlington, Vermont
	204491	Agilent	Agilent	7500cs-C	Spectrometers - Other in Spectrometers Agilent, 7500cs-C, ICMPS, System: Agilent, 7500cs-C, ICMPS, System   Bagged & Skidded in Warehouse	1				Singapore
	204288	Agilent	Agilent	81110A	Spectrometers - Other in Spectrometers Agilent,81110A, Pulse Pattern Generator: Agilent,81110A, Pulse Pattern Generator	1				Taichung, Taichung City
	204302	Ancosys	Ancosys	P13010 Ancolyzer	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Ancosys, P13010 Ancolyzer, : Ancosys, P13010 Ancolyzer,  Cu Plating Bath Analyzer	1				Malta, New York
	210024	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM	1				Burlington, Vermont
	213282	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM Installed.  Operational. Vintage : 2004 S/N : U-667	1				Singapore
	180474	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8	1				East Fishkill, New York
	180514	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8   Tool ID: KA03	1				East Fishkill, New York
	195983	Applied Materials	Applied Materials	Elite MS MC	Scanning Electron Microscopes in Inspection Equipment Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection: Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection iii Multiple Units Available.  Please inquire !!!	1				Dresden, Saxony
	203074	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection	Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection		Other Items in Microscopes Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection: Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection In fab.  Idle.	1				Dresden, Saxony
	201207	Applied Materials	Applied Materials	SemVision CX	Critical Dimension Scanning Electron Microscopes in Microscopes Applied Materials, SEMVision CX, 200mm,: Applied Materials, SEMVision CX, 200mm, S/N : W790	1				Burlington, Vermont
	178310	AMAT	AMAT	Uvision 200	Optical Inspection - Other in Optical Inspection Equipment Applied Materials, Uvision 200, Bright Field Inspection, 300mm: Manufactured in 2005; Status: Bagged and Skidded	1				Taichung, Taichung City
	204911	KLA-Tencor	KLA-Tencor	Uvision 5	Optical Inspection - Other in Optical Inspection Equipment Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle	1				Malta, New York
	205259	Applied Materials	Applied Materials	Uvision 5	Optical Inspection - Other in Optical Inspection Equipment Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm	1				Malta, New York
	183772	Axcelis Technologies	Axcelis Technologies	Compact II	Clean Room Ovens in Heat Treating Equipment Axcelis Compact II, 300mm, H2 Reflow Furnace, : Axcelis Compact II, 300mm, H2 Reflow Furnace, C4 Processing. Tool ID: OVN222 Serial Number :  H08046	1			F*	Dresden, SN
	202879	Blue M	Blue M	DCC 206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded	1				Singapore
	204174	Blue M	Blue M	DDC 206CY Oven	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC 206CY: Blue M Electric Oven, DCC 206CY   Bagged & Skidded in Warehouse	1				Singapore
	181816	Blue M	Blue M	DCC-1406CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC-1406CY: Blue M Electric Oven,  DCC-1406CY Tool ID: OVEN-01 (PEA106)	1				Singapore
	183762	Blue M	Blue M	DDC-206CY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Electric Oven, DCC-206CY, 200mm, oven: Blue M Electric Oven,  DCC-206CY, 200mm, oven Tool ID : OVEN-01 (PEA052)	1				Singapore
	196206	Blue M	Blue M	DCC-206-EV-ST350	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake: Blue M Oven, DCC-206-EV-ST350, 200mm, Resist Bake S/N :DCC-832 MULTIPLE UNITS AVAILABLE!!  Please inquire	1				East Fishkill, New York
	210050	Blue M	Blue M	RG-3010F-2	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment BlueM, Oven, RG-3010F-2, : BlueM, Oven, RG-3010F-2,  Disconnected in Storage Non-Operational - Known Electrical Faults/Issues	1				Burlington, Vermont
	210051	Blue M	Blue M	RG-3010F-2	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment BlueM, Oven, RG-3010F-2, : BlueM, Oven, RG-3010F-2,    In Storage - Known Electrical Faults/Issues	1				Burlington, Vermont
	178423	Branson	Branson	5210DTH	Ultrasonic Baths in Cleaning and Degreasing Equipment Branson/ICP, 5210DTH Ultrasonic Cleaner, 300mm: Status: Bagged and Skidded	1				Taichung, Taichung City
	204380	Infineon	Infineon	Bruchless Motor bench	Test & Measurement - Other in Test & Measurement Equipment Bruchless Motor bench: Bruchless Motor bench assembled in our Provence Design Center, like new (only tested once). For more informations please refer to the enclosed diagram and the motor description below.  Brushless motor PMSM ME0913 24 to 96V VDC 12kW (30kW max) This three-phase motor works with the Kelly controller (described below) • Output Power of 12 KW Continuous, 30 KW Peak (at 96 volts) • Designed for long life. No brush maintenance. The motor is 92% efficient at voltages between 24 to 96 VDC. Continuous current of 125 amps AC (180 Amps DC into the motor control). This is a 3-phase, Y-connected Permanent Magnet Synchronous Motor with an axial air gap and 3 Hall sensors at 120 degrees electrical timing. It has two stators with a rotor in the center. • This is a 4 pole motor (8 magnets). • The Phase to Phase winding resistance is 0.013 Ohms. • The maximum recommended rotor speed is 5000 RPM. • Voltages from 0 to 96 VDC input to the control. • Torque constant of 0.15 Nm per Amp • The Inductance Phase to Phase is 0.10 Milli-Henry with a 28 turns per phase. • Armature Inertia is 45 Kg Cm Squared. • Continuous current of 125 Amps AC (180 Amps DC into the motor control). • Peak current of 420 Amps AC for 1 minute (600 Amps DC into the motor control). • Weight of 35 pounds. • Peak Stall Torque of 90 Nm (66 ft). • This is an Open Frame, Fan Cooled motor. Timed for counter-clockwise rotation (can be changed to clockwise).   Kelly KBL72301,24-72V,300A,BLDC Controller/With Regen Kelly KBL programmable BLDC motor controller provides efficient, smooth and quiet controls for golf cart, go-cart, electric motorcycle, forklift, hybrid vehicle, electrical vehicle, electric boat, as well as industry motor speed or torque control. Motor speed controller uses high power MOSFET, PWM to achieve efficiency 99% in most cases. Powerful microprocessor brings in comprehensive and precise control to BLDC motor controllers. This programmable brushless motor controller also allows users to set parameters, conduct tests, and obtain diagnostic information quickly and easily. Features: • Intelligence with powerful microprocessor. Synchronous rectification, ultra low drop and fast PWM to achieve very high efficiency. • Electronic reversing. • Voltage monitoring on 3 motor phases, bus, and power supply.Voltage monitoring on voltage source 12V and 5V. • Current sense on all 3 motor phases.Current control loop. • Hardware over current protection.Hardware over voltage protection. • Support torque mode, speed mode, and balanced mode operation. • Configurable limit for motor current and battery current. • Low EMC.LED fault code. • Battery protection: current cutback, warning and shutdown at configurable high and low battery voltage. • Rugged aluminum housing for maximum heat dissipation and harsh environment.Rugged high current terminals, and rugged aviation connectors for small signal. • Thermal protection: current cut back, warning and shutdown on high temperature.Configurable 60 degree or 120 degree hall position sensors.	1	lot			Le Puy-Sainte-Réparade, Provence-Alpes-Côte d'Azur
	210272	Bruker	Bruker	Fabline D8	Xray Fluorescence Spectrometers in Spectrometers Bruker Fabline D8 : Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer   X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers Still in production. Ready for inspection.	1				Villach, Carinthia
	207935	Bruker, AFM, 300mm, InSight 3D-DR	Bruker, AFM, 300mm, InSight 3D-DR		Other Items in Microscopes Bruker, AFM, 300mm, InSight 3D-DR: Bruker, AFM, 300mm, InSight 3D-DR   DOM : 2017   S/N : 112	1				Burlington, Vermont
	204304	Bruker, D8 Discover, 300mm, X-Ray Metrology	Bruker, D8 Discover, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8 Discover, 300mm, X-Ray Metrology: Bruker, D8 Discover, 300mm, X-Ray Metrology   In Lab,  Cold idle	1				Dresden, Saxony
	199447	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology S/N 204500 2009  The tool is an automated High resolution X-ray diffractometer, clean room (class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300 mm wafer mapping capabilities. The D8 FABLINE consists of two stainless steal cabinets attached to each other. The first one is an X-ray analytical module composed of: radiation safe enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated optical set-ups, and all required supplies. The second is a handling module Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP [INVALID] for 200mm.. remarketing@surplusglobal.com	1				East Fishkill, New York
	209828	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Other Items in Microscopes Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology	1				Malta, New York
	220068	Bruker	Bruker	DUVX210	FT-IR Spectrometers in Spectrometers Bruker, DUVX210, 200mm, S/N 149, Surface profiler: Bruker, DUVX210, 200mm, S/N 149, Surface profiler	1			N*	Burlington, Vermont
	220067	Bruker	Bruker	UVX210	FT-IR Spectrometers in Spectrometers Bruker, UVX210, 200mm, S/N 135, Surface profiler: Bruker, UVX210, 200mm, S/N 135, Surface profiler   Note: Fractured tip mount on tool	1			N*	Burlington, Vermont
	199780	BTU Engineering	BTU Engineering	TCAS 181-7-72-E-36	Clean Room Ovens in Heat Treating Equipment BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace: BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace S/N: IBVT-1	1			F*	Burlington, Vermont
	219679	Cameca	Cameca	EX300 Shallow Probe	Interferometers in Optical Inspection Equipment CAMECA, EX300 Shallow Probe, 300mm, S/N 27: CAMECA, EX300 Shallow Probe, 300mm, S/N 27	1				East Fishkill, New York
	205918	Camtek	Camtek	X-ACT	Microscopes - Other in Optical Microscopes CAMTEK X-ACT System with EM3: CAMTEK X-ACT System with EM3   Idle.  Shut Down.	1				East Fishkill, New York
	204314	Check Point Technolo	Check Point Technolo	InfraScanTDM 300 TDE	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson: CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson  The system is comprised of the following: 1 InfraScan 300 TDE Laser Probing / Emission System Includes the following assemblies: * LSM 300 scanner with integrated emission camera port; * CCD camera for sample navigation with separate display; * 5-position motorized turret; * X, Y, Z motorized movement of LSM assembly; * PC with digitizer, Windows XP, Proscan 2000 Acquisition Software; * Moveable Operator Console, with  flat panel displays, Semi S8 compliant; * SLS-1000 1064 nm 300 mW * SLS-1000 1319 nm 350 mW * ASP-1000 3A Amplifier source package * Laser power adjustment, 0 to 100%, with incident power monitoring for all objectives; * Dark chamber with laser safety interlock, Class I (with service override), vibration isolation * User’s manual. Emission Camera Options InGaAs LN2 cooled 640 x 640 array 18 ?m pixels. LN2 Auto-fill system with two (2) 160 L Dewars InfraScan™ LTM 9Hz laser timing module. Includes the following: 9 GHz laser timing module Digital Oscilloscope 12.5 GHz Bandwidth Electronic Spectrum Analyzer APD and electronic amplifier High power/ high stability laser for timing stimulus Objective Options 5X NIR, Mitutoyo 378-822 20X IR Plan Apo, NA 0.5, Seiwa 50X IR Plan Apo, NA 0.6, Seiwa 100X NIR HR Mitutoyo 378-864-5 1X Macro Lens Specifications and Features: LSM 300/Optics- Optimized for high transmission at 1064nm and 1340nm. * T => 100mW at 1064nm 5X objective; T =>300mW at 1340nm 5X objective Image distortion <2%, 2X slow scan. Spot size 0.61?/NA of objective. * Scan rate 310 lines/sec to 2 sec/line. Field of view with 5X objective at 1X zoom: 3.2mm. Optical zoom range 1X to 8X (scanned field). * Image registration better than 2% for various wavelengths. * 5-position motorized turret, non-winding, Software settable crash protection limits for all objective lenses. Software controlled, par-centered and parfocal objectives. Built-in CCD camera for sample navigation with color monitor. External sync circuit. Computer and Inputs - PC with 3-channel digitizer input, one for LSM imaging and two for laser stimulation methods. Signal inputs are synchronized with LSM scan rate. Independent Gain and Offset control for input 1 and input 2. Scan rates adjustable from 310 lines/sec to 2048X slow to match response of DUT. 2-way communication with Knights CAD link. SLS 1000 RD – 300mW 1064 nm linearly polarized laser * Continuously adjustable Laser Power, from near 0% to full maximum. Real-time, incident laser power monitoring. Power limit feature to prevent overexposure of DUT. FC fiber optical coupler with 3 meter PM patchcord. ASP 1000 Amplifier-Source Package - Source Selections: Constant Current Programmable Range: 0.5nA – 1A; (3A optional) Minimum Program Step: .5nA Constant Voltage Programmable Range: 1uV – 10V (20V if protection diode removed) Minimum Program Step: 1uV Amplifier Selections: AC Voltage Amplifier Bias Current: .5nA - 1A; (3A optional) Maximum Input: 10V Input impedance: >4.7M Ohm Maximum Gain: 120 dB Detectability: 1 nV at full gain Bandwidth: 0.3 to 400K Hz High Pass Filter: .3, 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ, Low Pass Filter: 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ Output Offset Voltage: +/- 5V DC Current Amplifier (OBIC mode) Bias Voltage Range: 1uV - 10V Maximum Input: 20 mA Maximum Gain: 80 V/nA Detectability: 1 pA at full gain Bandwidth: DC to 400K Hz	1				Malta, New York
	208158	Chemical Safety Tech	Chemical Safety Tech	Dual Drum Waste Cabinet	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Chemical Safety Technology, Inc., Dual drum waste Cabinet: Chemical Safety Technology, Inc., Dual drum waste Cabinet	1				Malta, New York
	166465	Oxford Instruments	Oxford Instruments	CMI 950	Xray Fluorescence Spectrometers in Spectrometers CMI 950 - Xray fluorescence spectrometer: X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc. Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag). System is fully packed on pallette (241kg, 1mx0,9mx1,5m)	1			F*	Regensburg, BY
	210074	Dektak, V200SI, Surface Profilometer	Dektak, V200SI, Surface Profilometer		Other Items in Microscopes Dektak, V200SI, Surface Profilometer: Dektak, V200SI, Surface Profilometer Powered Down.  Installed	1				East Fishkill, New York
	210386	Denton	Denton	Infinity 18	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Denton Vacuum, Infinity 18, Sputter Coating System : Denton Vacuum, Infinity 18, Sputter Coating System  One Cathode.  Installed.  Idle. S/N : 40013	1				Burlington, Vermont
	195189	Drilling machine bernhard steinel	Drilling machine bernhard steinel		Mixed Lots of Lab and Other Technical Equipment in Laboratory and Scientific Equipment Drilling machine bernhard steinel: Already damaged loses function, was unable to repair. LOCATION: Wuxi	1		0.00		Regensburg, Bavaria
	203282	E.A. Fischione Instr	E.A. Fischione Instr	1030	Polishing & Grinding Sample Prep Equipment in Sample Preparation E.A. Fischione Instruments Inc., 1030, NanoMill: E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep. Automated Sample Preparation System	1				East Fishkill, New York
	200230	E.A. Fischione Instr	E.A. Fischione Instr	2040	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder: E.A. Fischione, 2040, TEM Dual-Axis Tomography Holder Still in Use S/N: 23492	1				East Fishkill, New York
	209075	Esco	Esco	EHWS 8C	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment ESCO Horizontal Work Station : ESCO Horizontal Work Station,     Bagged & Skidded in Warehouse	1				Singapore
	215848	Estion	Estion	E-RETICLE V 4M	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Estion, E-RETICLE V 4M, Electrostatic Charge Measurement: Estion, E-RETICLE V 4M, Electrostatic Charge Measurement Reticle Electrostatic Charge Measurement System Installed, Idle. Vintage :  2010	1				Burlington, Vermont
	211894	FEI	FEI	CLM 3D	Microscopes - Other in Optical Microscopes FEI, CLM + Dual Beam FIB, TEM Sample Prep tool: FEI, CLM + Dual Beam FIB, TEM Sample Prep tool Installed.  Idle.	1				East Fishkill, New York
	202148	FEI	FEI	CLM	Microscopes - Other in Optical Microscopes FEI, CLM, TEM Sample Prep tool: FEI, CLM, TEM Sample Prep tool   FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool   Cold Shutdown in the lab	1				East Fishkill, New York
	219851	FEI	FEI	EX SITU PLUCKER	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment FEI, EX SITU PLUCKER, 300mm, S/N 4471-03-06, Chip edit: FEI, EX SITU PLUCKER, 300mm, S/N 4471-03-06, Chip edit	1			N*	East Fishkill, New York
	202147	FEI	FEI	Ex-Situ Plucker	Microscopes - Other in Optical Microscopes FEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage	1				East Fishkill, New York
	203114	FEI	FEI	TEMLINK - KY02, 14771-003	Microscopes - Other in Optical Microscopes FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool	1				East Fishkill, New York
	211546	FEI	FEI	Meridian-IV	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment FEI, Meridian-IV, Fault localization and analysis: FEI, Meridian-IV, Fault localization and analysis	1				Singapore
	211893	FEI	FEI	TEMLINK 14771-003	Microscopes - Other in Optical Microscopes FEI, TEM Link, 14771-003, : FEI, TEM Link, 14771-003,  S/N : 4471-03-06	1				East Fishkill, New York
	190524	Fisher Sci	Fisher Sci	FD400 Binder Oven	Clean Room Ovens in Heat Treating Equipment Fisher Scientific, FD400, Precision Binder, 200mm: Fisher Scientific, FD400, Precision Binder, 200mm	1				Singapore
	194537	Fisher Sci	Fisher Sci	FD 720 Binder Precision Oven	Clean Room Ovens in Heat Treating Equipment FISHER Scientific, FD720, Oven, 200mm: FISHER Scientific, FD720, Oven, 200mm FISHER Scientific, FD720, Precision Oven, 200mm In the Fab	1				Singapore
	194540	Fisher Sci	Fisher Sci	FED720	Clean Room Ovens in Heat Treating Equipment FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm Precision Binder Oven S/N : 00-08042	1				Singapore
	189084	Fisher Sci	Fisher Sci	FED 720	Clean Room Ovens in Heat Treating Equipment FISHER Scientific, FED720, Oven, 200mm: FISHER Scientific, FED720, Oven, 200mm In the Fab	1				Singapore
	179078	General Electric	General Electric	GE MS6001B DLN-1	Industrial Gas Turbines (<50MW) in Gas Plant Equipment Gas Turbine: Turbine includes the following: Air Cooled Generator 336X482 GE Gas Turbine 296624 Air Filter Housing  GTG 51 Controls GTG 51 Spare parts Auxillaries: Lube Oil Skid, Starting Motor, Starting Motor Gearbox, Exciter and Exciter to Gen Gearbox.	1			F*	Texas City, Texas
	183208	GEMETEC	GEMETEC	Elymat III	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool: GeMeTec, Elymat III, 300mm, Electrolytical Metal Analysis Tool The ELYMAT-technique (ElectrolyticalMetal Analysis Tool) determines the lifetime of the minority carriers and diffusion length.  A laser beam scans across a silicon wafer immersed in an electrolytic cell (dilute HF) with an applied voltage and the resulting diffusion current is measured.  The extraction of the current takes place on the wafer backside (BPC-mode) or on the wafer front side (FPC-mode). In the case of lattice defects in the semiconductor bulk material (e.g., metal contamination), the diffusion current decreases due to partial recombination of the diffusing carriers.  Therefore, an approximate analytic determination of the diffusion length can be carried out basing on this so-called photocurrent.  Using both measurement modes, BPC and FPC, provides supplementary information on whether the contamination is present near the surface or whether it is distributed homogeneously throughout the wafer bulk material.  Furthermore, applying lasers with different penetration depths can in principle separate the influence of surface and bulk recombination.  Measuring at different laser intensities allows major contaminants such as iron to be identified.  This is known as Injection Level Spectroscopy (ILS). Measurement Precision -Diffusion length:  5% over 10 repeated measurements Measurement Accuracy -Diffusion length:  10% compared with similar techniques.	1			F*	East Fishkill, New York
	215016	Hologenix	Hologenix	MTX 2000/2/MIS SLIPBAY	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Halogenix, MTX 2000/2/MIS SLIPBAY, Slip Finder Inspection Tool: Halogenix, MTX 2000/2/MIS SLIPBAY, Slip Finder Inspection Tool Installed Vintage 2001 S/N : 252601	1			F*	East Fishkill, New York
	202146	Hitachi	Hitachi	HF-2000	Microscopes - Other in Optical Microscopes Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging: Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM   1995 Vintage S/N : 6214-3 Un-hooked in lab.	1				East Fishkill, New York
	178296	Hitachi	Hitachi	Microanalysis System	Scanning Electron Microscopes in Inspection Equipment Hitachi, Metrology, Microanalysis System 300mm: Status: Bagged and Skidded	1				Taichung, Taichung City
	178294	Hitachi	Hitachi	AS5000	Scanning Electron Microscopes in Inspection Equipment Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm: Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server	1			F*	Singapore
	219072	Hitachi	Hitachi	RS4000	Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0814-03	1				Singapore
	219057	Hitachi	Hitachi	RS4000	Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0819-03	1				Singapore
	219058	Hitachi	Hitachi	RS4000	Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0820-01	1				Singapore
	219056	Hitachi	Hitachi	RS4000	Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0821-02	1				Singapore
	219055	Hitachi	Hitachi	RS4000	Scanning Electron Microscopes in Inspection Equipment Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01: Hitachi, RS4000, 300mm, Defect SEM inspection, S/N 0822-01	1				Singapore
	210389	Hitachi	Hitachi	S-4500	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-4500, SEM: Hitachi, S-4500, SEM   Installed.  Idle S/N: 7953-02	1				Burlington, Vermont
	203281	Hitachi	Hitachi	S-5200	Scanning Electron Microscopes in Inspection Equipment Hitachi, S-5200, SEM, Ultra High Resolution: Hitachi, S-5200, SEM, Ultra High Resolution	1				East Fishkill, New York
	205450	Hitachi	Hitachi	S-9380	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380, CD SEM, 300mm: Hitachi, S-9380, CD SEM, 300mm Refurbished S/N: 89638	1				Seoul
	213283	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380, CD-SEM, 300mm: Hitachi, S-9380, CD-SEM, 300mm Installed Operational. S/N : U-664 Vintage : 2004	1				Singapore
	213284	Applied Materials	Applied Materials	NanoSEM 3D	Critical Dimension Scanning Electron Microscopes in Microscopes Hitachi, S-9380, CD-SEM, 300mm: Hitachi, S-9380, CD-SEM, 300mm Installed.  Operational. Vintage : 2004 S'N : U-666	1				Singapore
	178299	Hitachi	Hitachi	Z-5700	Scanning Electron Microscopes in Inspection Equipment Hitachi, Z-5700 Spectroscopy, 300mm: Status: Bagged and Skidded	1				Taichung, Taichung City
	199446	HMI, EP3, 300mm, E-Beam Inspection System	HMI, EP3, 300mm, E-Beam Inspection System		Other Items in Microscopes HMI, EP3, 300mm, E-Beam Inspection System: HMI, EP3, 300mm, E-Beam Inspection System	1				East Fishkill, New York
	204305	HMI, eP4 320, 300mm, ebeam Inspection	HMI, eP4 320, 300mm, ebeam Inspection		Other Items in Microscopes HMI, eP4 320, 300mm, ebeam Inspection: HMI, eP4 320, 300mm, ebeam Inspection   In the Fab.  Cold Idle	1				Malta, New York
	199986	HMI, eScan 320, 300mm, ebeam Inspection	HMI, eScan 320, 300mm, ebeam Inspection		Other Items in Microscopes HMI, eScan 320, 300mm, ebeam Inspection: HMI, eScan 320, 300mm, ebeam Inspection	1			F*	Malta, New York
	212703	HMI, eScan 500, 300mm, eBeam Inspection Tool	HMI, eScan 500, 300mm, eBeam Inspection Tool		Other Items in Microscopes HMI, eScan 500, 300mm, eBeam Inspection Tool: HMI, eScan 500, 300mm, eBeam Inspection Tool	1				Malta, New York
	218934	HMI, ESCAN 500, 300mm, S/N NE07130	HMI, ESCAN 500, 300mm, S/N NE07130		Other Items in Microscopes HMI, ESCAN 500, 300mm, S/N NE07130: HMI, ESCAN 500, 300mm, S/N NE07130, EBeam Inspection	1				Malta, New York
	181188	HSEB	HSEB	Axiospect 300	Wafer Inspection Microscopes in Optical Microscopes HSEB Axiospect 300, 300mm Wafer inspection microscope: HSEB Axiospect 300, 300mm Wafer inspection microscope Stereo Microscope Tool ID: OPI905 Serial Number: 41302020182 !!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!	1				Dresden, Saxony
	202816	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1				Malta, New York
	202817	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1				Malta, New York
	178300	JEOL	JEOL	7555	Scanning Electron Microscopes in Inspection Equipment JEOL, Defect Review, 200mm: Status: Bagged & Skidded in warehouse Parts tool.  Listed as major parts missing.	1				Singapore
	178302	JEOL	JEOL	JEM-2500SE	Scanning Electron Microscopes in Inspection Equipment JEOL, JEM-2500SE Microscopes, 300mm: Status: Bagged and Skidded	1				Taichung, Taichung City
	178303	JEOL	JEOL	JEM-2500SE	Scanning Electron Microscopes in Inspection Equipment JEOL, JEM-2500SE Microscopes, 300mm: Status: Bagged and Skidded	1				Taichung, Taichung City
	187765	JEOL	JEOL	JWS 7555S	Scanning Electron Microscopes in Inspection Equipment JEOL, JWS 7555S, Defect Review, 200mm: JEOL, JWS 7555S, Defect Review, 200mm	1				Singapore
	189689	JEOL	JEOL	JWS-7515	Scanning Electron Microscopes in Inspection Equipment JEOL, JWS-7515, 200mm, SEM: JEOL, JWS-7515, 200mm, SEM S/N: WS179028-108	1				Singapore
	203119	JEOL	JEOL	ARM200CF Super X	Scanning Electron Microscopes in Inspection Equipment JEOL, TEM, ARM200CF Super X, : JEOL, TEM, ARM200CF Super X, Atomic Resolution Electron Microscope	1				Malta, New York
	219300	Jordan Valley	Jordan Valley	JVX5200T	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment Jordan Valley, JVX5200T, 300mm, S/N 763: Jordan Valley, JVX5200T, 300mm, S/N 763, Layer Thickness, Density, and Roughness. Missing parts	1				Dresden, Saxony
	178270	KEITHLEY Insturments, 590 C-V Analyzer, 300mm	KEITHLEY Insturments, 590 C-V Analyzer, 300mm		Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment KEITHLEY Insturments, 590 C-V Analyzer, 300mm: Status: Bagged and Skidded	1				Taichung, Taichung City
	178415	Kinetic Systems	Kinetic Systems	9101-21-21	Vibration Isolation Tables in Tables Kinetic Systems, 9101-21-21, Vibration Cancellation, : Manufactured in 1994	1				Singapore
	219460	KLA-Tencor	KLA-Tencor	Archer AIM+	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment KLA, Archer Overlay AIM+, 300mm, S/N 3637: KLA, Archer Overlay AIM+, 300mm, S/N 3637	1				Singapore
	204277	KLA-Tencor	KLA-Tencor	3905	Optical Inspection - Other in Optical Inspection Equipment KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection : KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection  Power OFF.  Under N2 Purge.	1				Malta, New York
	204281	KLA-Tencor	KLA-Tencor	3905	Optical Inspection - Other in Optical Inspection Equipment KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection : KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection  Power Off.  Under N2 Purge.    remarketing@surplusglobal.com	1				Malta, New York
	215849	KLA-Tencor	KLA-Tencor	P2 Data Prep Station,	Scientific and Laboratory Equipment - Other in Pharmaceutical Laboratory and Scientific Equipment KLA-Tencor, DP2 Data Prep Station, IPRO Data Prep: KLA-Tencor, DP2 Data Prep Station, IPRO Data Prep Deinstalled Vintage : 2012	1				Burlington, Vermont
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Scientific and Laboratory Equipment: ABB Engineering, Accretech, ADE, Agilent, Ancosys, Applied Materials, Inc., Axcelis Technologies GmbH, Blue M, Branson, Bruker, BTU Engineering, Cameca, Camtek, Check Point Technologies, Chemical Safety Tech, Denton, E.A. Fischione Instr, Esco, Estion, FEI, Fisher Scientific, GEMETEC, General Electric, Halogenix, Hitachi, HSEB, Infineon, JEOL, Jordan Valley, Kinetic Systems, Inc., KLA-Tencor, Lasertech, Leica, Lyncee, Memmert Gmbh+Co, Metron, Micro Control Co., NCB Network, Negevtech Ltd., Nicolet, Nova, NSC, Olympus, Oxford Instruments, Prometrix, Quantum Focus Instruments, Revco, Rudolph Research, Rudolph Technologies, Inc., Scientek Technology Corp, SDI Diagnostics Inc, Semilab, Sopra, Temptronics, Terradyne, VWR Scientific Products, Waters, Zeiss