 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
251076
|
Applied Materials
|
Applied Materials |
NanoSEM 3D |
in Microscopes
|
1
|
|
|
 |
Singapore |
|
 |
254250
|
AMAT
|
AMAT |
UVision 6 |
in Optical Microscopes
|
1
|
|
|
 |
Malta, New York |
|
 |
252611
|
Applied Materials
|
Applied Materials |
Verity1 SEM |
in Inspection Equipment
AMAT Verity1 SEM, 300mm, s/n: U-757:Applied VeritySEM
|
1
|
|
|
 |
Singapore |
|
 |
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Inspection Equipment
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
|
 |
Singapore |
|
 |
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Optical Inspection Equipment
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
|
 |
Malta, New York |
|
 |
256627
|
Camtek
|
Camtek |
Falcon 630 |
in Optical Inspection Equipment
Camtek Falcon 630 Wafer AOI:Location at Infineon Penang.
|
1
|
|
|
N* |
George Town, Penang |
|
 |
256632
|
Exclusive Master
|
Exclusive Master |
DRIR 2000 |
in Optical Inspection Equipment
DRIR 2000:Die level inspection on tape & reel. Location at Infineon Penang.
|
1
|
|
|
N* |
George Town, Penang |
|
 |
251081
|
HMI
|
HMI |
ESCAN380 |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
253752
|
HSEB
|
HSEB |
MMT 300 |
in Optical Microscopes
|
1
|
|
|
 |
Dresden, Saxony |
|
 |
253234
|
HSEB
|
HSEB |
MMT300 V2 |
in Optical Microscopes
|
1
|
|
|
 |
Dresden, Saxony |
|
 |
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
|
 |
Malta, New York |
|
 |
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Optical Microscopes
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
|
 |
Malta, New York |
|
 |
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
254255
|
KLA-Tencor
|
KLA-Tencor |
2835 |
in Optical Microscopes
KLA 2835, 300mm, s/n: 1340334:Brightfield Inspection
|
1
|
|
|
 |
Malta, New York |
|
 |
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
257174
|
KLA-Tencor
|
KLA-Tencor |
RS100C |
in Optical Microscopes
|
1
|
|
|
N* |
Singapore |
|
 |
255109
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
 |
Singapore |
|
 |
252339
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
 |
Singapore |
|
 |
252340
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Optical Microscopes
|
1
|
|
|
 |
Singapore |
|
 |
253040
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA Tencor AIT II, 200mm, s/n: 9145:KLA-Tencor AIT II w/ ADC. Defect Inspection
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
253033
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA Tencor AIT II, 200mm, s/n: 9234:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254149
|
KLA-Tencor
|
KLA-Tencor |
OP3260I |
in Optical Microscopes
KLA Tencor OP3260I, 200mm, s/n: 6678:Film thickness measurement
|
1
|
|
|
 |
Singapore |
|
 |
254147
|
KLA-Tencor
|
KLA-Tencor |
UV1280SE |
in Optical Microscopes
KLA Tencor UV1280SE, 200mm, s/n: 991098:Film thickness measurement tool
|
1
|
|
|
 |
Singapore |
|
 |
253038
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA-Tencor AIT II, 200mm, s/n: 9152:AIT II w/ ADC. Defect Inspection
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
253037
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Optical Microscopes
KLA-Tencor AIT II, 200mm, s/n: 9262:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
253039
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Optical Microscopes
|
1
|
|
|
 |
Burlington, Vermont |
|
 |
254084
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
254087
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
254086
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
254085
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Inspection Equipment
|
1
|
|
|
 |
Singapore |
|
 |
256664
|
Olympus
|
Olympus |
|
in Optical Microscopes
Low power optical scope:Location is at Infineon Penang.
|
2
|
|
|
N* |
George Town, Penang |
|
 |
207180
|
Nanofocus µsprint 3d inspection system with Baumann Handler
|
Nanofocus µsprint 3d inspection system with Baumann Handler |
in Optical Inspection Equipment
|
1
|
|
|
 |
Regensburg, Bavaria |
|
 |
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
|
 |
Malta, New York |
|
 |
257115
|
Nova
|
Nova |
3090next |
in Optical Inspection Equipment
|
1
|
|
|
 |
Dresden, Saxony |
|
 |
257116
|
Nova
|
Nova |
3090next |
in Optical Inspection Equipment
|
1
|
|
|
 |
Dresden, Saxony |
|
 |
257117
|
Nova
|
Nova |
3090next |
in Optical Inspection Equipment
|
1
|
|
|
 |
Dresden, Saxony |
|
 |
252607
|
Nova
|
Nova |
T500 |
in Optical Inspection Equipment
|
1
|
|
|
 |
East Fishkill, New York |
|
 |
254369
|
Park System NX-Hivac, 300mm, s/n: 40788
|
Park System NX-Hivac, 300mm, s/n: 40788 |
in Microscopes
|
1
|
|
|
 |
Santa Clara, California |
|
 |
253031
|
Rudolph Technologies
|
Rudolph Technologies |
S3000-S |
in Optical Microscopes
|
1
|
|
|
 |
Malta, New York |
|
 |
256631
|
Exclusive Master
|
Exclusive Master |
TTI 1000 |
in Optical Inspection Equipment
Tape Tray Inspection System:Die level inspection on tape & reel and waffle plate. Location at Infineon Penang.
|
1
|
|
|
N* |
George Town, Penang |
|
 |
256550
|
Trinocular Stereo Zoom Microscope
|
Trinocular Stereo Zoom Microscope |
in Optical Microscopes
Trinocular Stereo Zoom Microscope:Penang Trinocular Stereo Zoom Microscope Brand : Radiant Instruments Asset Number: ZNPG-102904-0
|
1
|
|
|
N* |
George Town, Penang |
|