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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
190444
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101DA-01


2006 DOM

Still in the fab, warm idle
190445
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00103CB-01

DOM: 2006

190446
Accretech  

Accretech  

Win-Win 50 - A5000, Hurricane 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Dresden, Saxony
Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm:

Accretech, Win-Win 50, A5000, Bright Field Inspection, 300mm

Serial Number: R00101GB-01

DOM: 2007

178308
Accretech  

Accretech  

Win-Win 50 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Taichung, Taichung City
Accretech, Win-Win 50,Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

178309
AMAT  

AMAT  

Complus 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore,
Applied Materials, Complus, Particle Measurement, 300mm:
Manufactured in 2007; Status: Bagged and Skidded

MULTIPLE UNITS AVAILALBE!!! Please inquire.
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
189511
Applied Materials  

Applied Materials  

Semvision CX 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Burlington, Vermont
Applied Materials, SEMVision CX, 200mm, :
Applied Materials, SEMVision CX, 200mm,

Serial Number is W854.
178310
AMAT  

AMAT  

Uvision 200 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Applied Materials, Uvision 200, Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
196827
ASML  

ASML  

AT 850 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   East Fishkill, New York
ASML AT-850, 300mm, KrF 248nm Scanner:

 

ASML AT-850D, 300mm, KrF 248nm Scanner, 

S/N : m5946

Known Tool Issues:
Currently power off with Lens gas flowing, tool had issue with illumination rack that will require replacement.  The tool currently has all of the parts present, but they have not necessarily been calibrated or setup with the tool being off.  Laser has 104.5 Billion pulses on it.  Components were good when shutdown.
The Beam steering hardware in not functional, and the ACC needs an heat exchanger installed

 

Tool ID: GB03

197858
ASML  

ASML  

TWINSCAN XT:850F 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Veldhoven, North Brabant
ASML, XT: 850F, 300mm, KrF, :
ASML, TWINSCAN XT:850F, 300mm, KrF, 

S/N: m7691

Laser model CYMER ELS-7610K (40W)
MES machine type XT850F
OIU/Reticle-/Waf.aux.port Right Configuration
Power 400 Volt

In warehouse stored.

176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   Singapore,
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


178410
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Ecomet-3000 Polisher, 300mm:
Status: Bagged and Skidded
178407
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, Ecomet-3000 300mm:
Status: Bagged and Skidded
178409
Buehler  

Buehler  

Ecomet-3000 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Taichung, Taichung City
Buehler, Polisher, 300mm:
Status: Bagged and Skidded
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


191547
FSM  

FSM  

FSM 128 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Singapore,
FSM, 128, Film Stress Measurement Tool, 200mm:
FSM, Frontier Semiconductor Measurement, 128, Film Stress Measurement Tool, 200mm

S/N: 60920-207
178293
Hitachi  

Hitachi  

4500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore,
Hitachi, 4500 SEM, 200mm:
Manufactured in 1990
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




191493
Hitachi  

Hitachi  

S-5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Burlington, Vermont
Hitachi, S-5000, SEM, 200mm:
Hitachi, S-5000, SEM, 200mm

Running.
Power ON, Under Vacuum.

S/N: 0500-02-03

DOM 1995
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-7800 CD-SEM, 200mm:
Manufactured in 2008
195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore,
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
180206
KLA-Tencor  

KLA-Tencor  

AIT XUV 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Taichung, Taichung City
KLA Tencor AIT XUV Laser Scanning Wafer Inspection 300mm:
KLA Tencor AIT XUV Laser Scanning Wafer Inspection 300mm

185268
KLA-Tencor  

KLA-Tencor  

UV 1050 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Singapore,
KLA Tencor UV 1050, 200mm, Thin Film Thickness Measurement:

KLA Tencor UV 1050, 200mm, Thin Film Thickness Measurement
TOOL ID: FLMTK-03

!!!MULTIPLE UNITS AVAILALBE!!! PLEASE INQUIRE


Tool is in warehouse in Vapor Barrier Bag on Skids.

178315
KLA-Tencor  

KLA-Tencor  

2132 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore,
KLA-Tencor, 2132 Bright Field Inspection, 200mm:
Manufactured in 1996; Status: Bagged and Skidded
178314
KLA-Tencor  

KLA-Tencor  

2132 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore,
KLA-Tencor, Bright Field Inspection, 200mm:
Manufactured in 1995; Status: Bagged and Skidded
178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Singapore,
KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore,
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
188890
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891
KLA-Tencor  

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* East Fishkill, NY
KLA-TENCOR, eS810, e-beam inspection, 300mm:
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

178327
KLA-Tencor  

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
KLA-Tencor, INS3300 , Microscopes, 300mm:
Manufactured in 2005; Status: Bagged and Skidded
198216
KLA-Tencor  

KLA-Tencor  

Optiprobe 2600 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Singapore,
KLA-Tencor, Metrology, Optiprobe 2600, 200mm:

KLA-Tencor, Metrology, Optiprobe 2600, 200mm

S/N: 6085

1994 Vintage

195493
KLA-Tencor  

KLA-Tencor  

SCD 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Malta, New York
KLA-Tencor, SCD, 300mm:
KLA-Tencor, SCD, 300mm
195494
KLA-Tencor  

KLA-Tencor  

SCD 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Malta, New York
KLA-Tencor, SCD, 300mm:
KLA-Tencor, SCD, 300mm

In the fab.

S/N: 36110810064


195363
KLA-Tencor  

KLA-Tencor  

SL515 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Taichung, Taichung City
KLA-Tencor, SL515, StarLight 515, Mask Inspection, 300mm:
KLA-Tencor, SL515, StarLight 515, Mask Inspection, 300mm

S/N : 5036

Known  Parts Missing:

qty. 1 FRU,MODULE BEAM STAB,5XX
qty. 1 FRU,MODULE DIFFUSER,5XX


178321
KLA-Tencor  

KLA-Tencor  

Wafersight 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   F* Taichung, Taichung City
KLA-Tencor, Wafersight , 300mm:
Manufactured in 2006; Status: Bagged and Skidded
183758
Lasertech  

Lasertech  

Reticle Inspection Tool 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Singapore,
Lasertech, Reticle Inspection System, 200mm, Lithography:
Lasertech, Reticle Inspection System, 200mm, Lithography

Tool ID: LRIS-01
194720
Leica  

Leica  

INS-3300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Taichung, Taichung City
Leica, INS-3300, 300mm, Inspection Microscope:
Leica, INS-3300, 300mm, Inspection Microscope
192694
MASS-PCB  

MASS-PCB  

SV200WV 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Malta, New York
MASS-PCB, SV200WV, Abrasive Planarizations System:
MASS-PCB, SV200WV, Abrasive Planarizations System

The grinding machine SV 200 WV serves to remove the excess plugging paste from
printed circuit boards and inner layers following the Via Hole Plugging process. That
allows getting a flat uniform surface of the copper surface.
The grinding disk is driven by a servo motor, the x-y movement is manual by
hand.

The basic frame is made up of a stable welded stainless steel rack. The outer jacket
is made up of canted stainless sheet metal sheets. All the sheets allow be opening
with ease by entering catch locks and removing for allowing access.
The grinding head is covered with a hood with aluminium glass profiles. The plant is
built up and designed such that all components are clearly arranged.

Cooling water is transported via pump to the grinding head. On the bottom of the
machine you can find the belt filter equipment, where the cooling water is filtered.

The inner- or outer-layer of the printed circuit board is fixed on the aluminium working
plate by vacuum.
The working area is protected by safety glass. The specific linear guides and the
adjustable grinding pressure result in an excellent grinding performance and prevent
the copper foil from possibly being ground through. The grinding head can be
lowered to the printed circuit board with an exactness of 0,22 μm (0,0056 mil).
One turn (100 digits) eaquals 22μm (0,56 mil).

Technical data:
Plant length: 1400 mm
Plant width: 1100 mm
Plant height: 1700 mm
Working height: 980 mm
Weight 1000 Kg
Adjustment precision 0,22 μm
Vacuum working surface: 610 x 915 mm (24 x 36”)
Servo controlled turning of the grinding disks: 1000, 2000, 3000 rpm
Printed circuit board spectrum:
Gauge from / to: 0,3 – 15 mm
Maximum printed circuit board size: 610 x 915 mm (24 x 36”)
Electric connection:
Connected load: 5 kW
Working voltage: 3 x 400/480V, 3P, N, PE, 50/60 Hz

Compressed air connection: 6 bar
Filter unit: 60 l Water

179749
MULTIPROBE APF II, Atomic Force Probe, 300mm  
MULTIPROBE APF II, Atomic Force Probe, 300mm  

List all items of this typeOther Items

in Microscopes

1   Dresden, SN
MULTIPROBE APF II, Atomic Force Probe, 300mm :
Multiprobe APF II, Atomic Force Probe
S/N: 012-062-012-022-014-048
5 Probe Heads,
3060 MPIII AFP Core 05/06/09 - 1ea
3020 MPII Head Group04/27/09  - 5ea
2715 MPIII Digital Control and Power Box04/27/09 - 1ea
218 AEK Enclosure Group04/27/09 - 1ea
1790 Scanning Capacitance04/27/09 - 1ea
3015 SemiAuto,Smpl/Optc04/27/09 - 1ea



179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, SN
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
tool for micro probing of transistors at contact level
3 Probe heads,
MP1-system with semiauto stage/optics
Comes with : 
electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads
Upgrades Include:
semiautomatic stage, optics & probe head control, 4th probe head




178322
Negevtech Ltd.  

Negevtech Ltd.  

NT3100 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Negevtech, NT3100 , Bright Field Inspection, 300mm:
Manufactured in 2005; Status: Bagged and Skidded


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
178713
Rudolph Technologies  

Rudolph Technologies  

S300 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Rudolph Macro Defect S300 inspection system, 300mm:
Rudolph Macro Defect S300 inspection system


!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
195351
Rudolph Technologies  

Rudolph Technologies  

AXI-930 B20 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Rudolph, AXI-930 B20, Macro Defect Inspection, 300mm:

Rudolph, AXI-930 B20,  Macro Defect Inspection, 300mm

S/N : AXI-1037

178323
Rudolph Technologies  

Rudolph Technologies  

Macro Defect WV320 YVS SERVER 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Rudolph, Macro Defect WV320 YVS SERVER Macro Defect, 300mm:
Status: Bagged and Skidded
195977
Rudolph Technologies  

Rudolph Technologies  

WaferView 320 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Dresden, Saxony
Rudolph, WaferView 320 Macro Defect, 300mm:
Rudolph, WaferView 320 Macro Defect, 300mm

Status: Bagged and Skidded


Multiple Units Available.   Please inquire!
178324
Rudolph Technologies  

Rudolph Technologies  

WV320 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Rudolph, WV320 Macro Defect, 300mm:
Manufactured in 2005; Status: Bagged and Skidded

Tool ID AP-PMD-01

!!!MULTIPLE UNITS AVAILABLE!!! Please inquire
180919
Rudolph Technologies  

Rudolph Technologies  

Waferview 320 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Taichung, Taichung City
Rudolph, WV320 Macro Defect, 300mm:
Manufactured in 2005; Status: Bagged and Skidded

TOOL ID:  AP-PMD-03
S/N: 2-05-W32-1473-BK-08

Multiple Units Available.   Please inquire!
178325
Semicaps  

Semicaps  

SOM 3000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F* Taichung, Taichung City
Semicaps, SOM 3000 Scanning Optical Microscope, 300mm:
Status: Bagged and Skidded
195978
SOLVISION  

SOLVISION  

PRECIS 3D 

List all items of this typeOptical Inspection - Other

in Optical Inspection Equipment

1   Dresden, Saxony
SOLVISION, PRECIS 3D, 300mm Defect Inspection:
SOLVISION, PRECIS 3D, 300mm Defect Inspection

!!! Multiple Units Available.  Please inquire !!!
182307
Suss Microtec  

Suss Microtec  

 

List all items of this typeOther Items

in Microscopes

1   F* Fishkill, New York
Suss Microtec BA300-MIT, 300mm Automated Inspection Tool:
Suss Microtec 300mm Automated Inspection Tool, BA300-MIT

Automated inspection tool inspects glass plates 13" x 14" molds do determine filling

Tool ID: MIT01
195994
Therma-Wave  

Therma-Wave  

OP-2600 

List all items of this typeInterferometers

in Optical Inspection Equipment

1   Singapore,
Thermawave, OP 2600, 200mm:
Thermawave, OptiProbe 2600, 200mm, Film Thickness Measurement

S/N: 6167

On Line - In the Fab
191172
VEECO (Bruker Nano), X-1D, AFM, 300mm 
VEECO (Bruker Nano), X-1D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
VEECO (Bruker Nano), X-1D, AFM, 300mm:
VEECO (Bruker Nano), X-1D, AFM, 300mm

Warm idle, installed.

S/N: 122
191173
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Warm Idle

S/N: 146
191174
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Unhooked Park Position 

S/N: 123
186714
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
195518
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Bagged & Skidded in warehouse.

S/N : 741361
185245
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
185288
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore,
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
191630
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741472
191631
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741567


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Inspection Equipment:
Accretech, Applied Materials, Inc., ASML, Buehler, FEI, FSM, Hitachi, JEOL, KLA-Tencor, Lasertech, Leica, MASS-PCB, Negevtech Ltd., Rudolph Technologies, Inc., SELA, Semicaps, SOLVISION, Suss MicroTec, Therma-Wave, Zeiss