Manufacturer: KLA-Tencor

  1. KLA-Tencor ASET-F5x Thin Film Measurement System

    Other Film Thickness Testers

    KLA-Tencor ASET-F5x Thin Film Measurement System

    KLA-TENCOR ASET-F5x Thin Film Measurement System

    • Serial Number 0202802R
    • Manufactured in June, 2002
    • Inspection Modes Include:
      • Dual Beam Spectrometry
      • Spectroscopic Ellipsometry
      • Film Stress Analysis
      • SUMMIT™ Application Software Version 3.21.16
      • FTML Version 3.46.06
      • Model 300DFF1P Wafer Loading Platform
        • Dual Loadports for 300mm Wafers
        • Three Axis Wafer Handling Robot
        • GEM / SECS Communication
        • Inquire for Additional Details
  2. KLA-TENCOR HRP-240 High Resolution Profiler

    Profilometers

    KLA-TENCOR HRP-240 High Resolution Profiler

    KLA-TENCOR HRP-240 High Resolution Profiler

    • Cassette to Cassette Wafer Handling for up to 200mm Wafers
    • Previously Configured for SMIF Wafer Handling
    • Please Inquire for Additional Details
  3. Tencor Surfscan 4500

    Unpatterned Wafer Inspection

    Tencor Surfscan 4500

    TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool

    • Cassette to Cassette Handling of 3” – 6” Wafers
    • New HeNe 2mW Laser, 632.8 nm Wavelength
    • New HeNe Laser Power Supply
    • 2 µ Particle Size Sensitivity
    • Automatic Calibration
    • Flatscreen Monitor
    • System Calibrated & Demonstrated
    • Calibration Standard Wafer Included
  4. KLA-TENCOR Archer 200 AIM Overlay Metrology Tool

    Overlay Registration

    KLA-TENCOR Archer 200 AIM Overlay Metrology Tool

    KLA-TENCOR Archer 200 AIM Overlay Metrology Tool

    • ETAL Stage
    • Yaskawa Robot with NXC100 Controller
    • IDE Maxon 1000 Floatation Controller
  5. KLA-Tencor 740-212542-000 Insert Assy with Lamps

    Other Lamps

    KLA-Tencor 740-212542-000 Insert Assy with Lamps

    KLA-Tencor 740-212542-000 Insert Assy with Lamps Insert Assy with Lamps
  6. KLA-TENCOR Aleris 8350 Film Metrology Tool

    Other Film Thickness Testers

    KLA-TENCOR Aleris 8350 Film Metrology Tool

    KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool

    • Dual 300 mm Loadports
    • Analysis of 190nm-800nm Wavelengths
    • White Light Reflectometer
    • Broadband Spectroscopic Ellipsometer
    • Single Wave Ellipsometer
    • Stress Measurement
    • iDesorber 
  7. KLA-Tencor UV-1050 Thin Film Measurement Tool

    Other Film Thickness Testers

    KLA-Tencor UV-1050 Thin Film Measurement Tool

    KLA-Tencor UV-1050 Thin Film Measurement Tool

    • Cassette to Cassette Wafer Handling
    • Wafer sizes: 100mm, 150mm & 200mm
    • Broadband UV Optics
    • Dual Beam Spectrophotometry
    • Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
    • System Control PC with Windows NT OS
    • Summit Application Software
    • GEM / SECS Communication
    • System Installation at Destination Available