Manufacturer: KLA-Tencor
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KLA-Tencor ASET-F5x Thin Film Measurement System
KLA-TENCOR ASET-F5x Thin Film Measurement System
- Serial Number 0202802R
- Manufactured in June, 2002
- Inspection Modes Include:
- Dual Beam Spectrometry
- Spectroscopic Ellipsometry
- Film Stress Analysis
- SUMMIT™ Application Software Version 3.21.16
- FTML Version 3.46.06
- Model 300DFF1P Wafer Loading Platform
- Dual Loadports for 300mm Wafers
- Three Axis Wafer Handling Robot
- GEM / SECS Communication
- Inquire for Additional Details
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KLA-TENCOR HRP-240 High Resolution Profiler
KLA-TENCOR HRP-240 High Resolution Profiler
- Cassette to Cassette Wafer Handling for up to 200mm Wafers
- Previously Configured for SMIF Wafer Handling
- Please Inquire for Additional Details
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Tencor Surfscan 4500
TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool
- Cassette to Cassette Handling of 3” – 6” Wafers
- New HeNe 2mW Laser, 632.8 nm Wavelength
- New HeNe Laser Power Supply
- 2 µ Particle Size Sensitivity
- Automatic Calibration
- Flatscreen Monitor
- System Calibrated & Demonstrated
- Calibration Standard Wafer Included
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KLA-TENCOR Archer 200 AIM Overlay Metrology Tool
KLA-TENCOR Archer 200 AIM Overlay Metrology Tool
- ETAL Stage
- Yaskawa Robot with NXC100 Controller
- IDE Maxon 1000 Floatation Controller
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KLA-Tencor 740-212542-000 Insert Assy with Lamps
KLA-Tencor 740-212542-000 Insert Assy with Lamps Insert Assy with Lamps -
Other Wafer Production Equipment
KLA-Tencor 3" Wafer Locator Rings for Flexus 2320
3" Wafer Locator Rings for Flexus 2320 -
KLA-TENCOR Puma 9130 Darkfield Inspection Tool
KLA-TENCOR Puma 9130 Darkfield Inspection Tool
- Parts Tool
- Please Inquire for Additional Details
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KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool
KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool
- For 200mm or 300mm Wafers
- 2ea Cameras
- Please Inquire for Additional Details
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KLA-TENCOR Aleris 8350 Film Metrology Tool
KLA-TENCOR Aleris 8350 Advanced Film Metrology Tool
- Dual 300 mm Loadports
- Analysis of 190nm-800nm Wavelengths
- White Light Reflectometer
- Broadband Spectroscopic Ellipsometer
- Single Wave Ellipsometer
- Stress Measurement
- iDesorber
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KLA-Tencor UV-1050 Thin Film Measurement Tool
KLA-Tencor UV-1050 Thin Film Measurement Tool
- Cassette to Cassette Wafer Handling
- Wafer sizes: 100mm, 150mm & 200mm
- Broadband UV Optics
- Dual Beam Spectrophotometry
- Applications: Polysilicon, UV Reflectivity & Simultaneous Oxide and TiN Thickness for CMP
- System Control PC with Windows NT OS
- Summit Application Software
- GEM / SECS Communication
- System Installation at Destination Available
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