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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
203884
Agilent  

Agilent  

5977B  

List all items of this typeSpectrometers - Other

in Spectrometers

1   Chengdu, Sichuan
Agilent, 5977B, GC MS, w/ MARKES TD 100:

Agilent, 5977B, GC MS, w/ MARKES TD 100

 

This is a brand new tool (2018 vintage), unopened in original OEM packaging

204491
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F*N* Taichung, Taichung City
Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

 

Bagged & Skidded in Warehouse

204492
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

1   N* Taichung, Taichung City
Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

Bagged & Skidded in Warehouse

204288
Agilent  

Agilent  

81110A 

List all items of this typeSpectrometers - Other

in Spectrometers

1   Taichung, Taichung City
Agilent,81110A, Pulse Pattern Generator:

Agilent,81110A, Pulse Pattern Generator

163973
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1 77,801.11 F* Regensburg, Bavaria
AMAT COMPASS PRO 300mm:

Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL

163974
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

1 77,801.11 F* Regensburg, Bavaria
AMAT COMPASS PRO 300mm:

Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL

204578
Orbotech  

Orbotech  

Ultra Discovery VM 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1   N* Regensburg, Bavaria
AOI Orbotech Ultra Discovery VM:

Simple, Intelligent, Powerful

Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production.

Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time.

Benefits

  • High throughput and superior detection with minimal number of false calls
  • Especially designed for inspection of the finest lines down to 10μm
  • Quick set-up even for the most complicated jobs for higher productivity
  • Automation ready
  • Very high uptime
  • SIP TechnologyTM

    Push-to-Scan®:

    • A ‘no set-up’ process
    • Top AOI results with minimal effort or training
    • The easiest, user-friendly interface (GUI)
    • Full ‘Step and Repeat’ functions

    Visual Intelligence:

    Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want.

    Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects.

    Visual Intelligence:

    • Full panel understanding, context-based detection engine
    • Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed

       

 

180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* East Fishkill, NY
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

203103
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

203104
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

203105
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

203106
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

203107
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   East Fishkill, New York
Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
203074
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

203075
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

204039
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
Applied Materials, SEMVision G3, DR-SEM, 300mm:

Applied Materials, SEMVision G3, DR-SEM, 300mm

missing some of the PC's in the electronic rack

Bagged & Skidded in Warehouse

2006 Vintage

176719
SELA  

SELA  

EM2 

List all items of this typeSample Preparation - Other

in Sample Preparation

1   F* Regensburg, BY
Automated TEM and SEM sample preparation system - SELA EM2:

A dedicated, automated, timesaving, and user-friendly system that enables a total solution for TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of applications. Featuring cryo-cooled, dry saw process, the EM2 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible stub that allows rework.

Tool is completed.

Used within FE & BE failure analysis

204303
Bruker, AFM, 300mm, InSight,  
Bruker, AFM, 300mm, InSight,  

List all items of this typeOther Items

in Microscopes

1   F* Malta, New York
Bruker, AFM, 300mm, InSight, :

Bruker, AFM, 300mm, InSight, 

 

In Fab.  Warm Idle

204304
Bruker, D8 Discover, 300mm, X-Ray Metrology 
Bruker, D8 Discover, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
Bruker, D8 Discover, 300mm, X-Ray Metrology:

Bruker, D8 Discover, 300mm, X-Ray Metrology

 

In Lab,  Cold idle

195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   Singapore
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
insert for 200mm..
166465
Oxford Instruments  

Oxford Instruments  

CMI 950 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

1   F* Regensburg, BY
CMI 950 - Xray fluorescence spectrometer:
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).

System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
203282
E.A. Fischione Instr  

E.A. Fischione Instr  

1030 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   East Fishkill, New York
E.A. Fischione Instruments Inc., 1030, NanoMill:

E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep.

Automated Sample Preparation System

 

 

203280
E.A. Fischione Instr  

E.A. Fischione Instr  

1060 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   East Fishkill, New York
E.A. Fischione Instruments Inc., 1060, NanoMill:

E.A. Fischione Instruments Inc., 1060, NanoMill

 

Ion MIll

202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 

195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Taichung, Taichung City
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Dresden, Saxony
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

,

203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Malta, New York
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

178414
GEMETEC  

GEMETEC  

WSPS53 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F* Taichung, Taichung City
GEMETEC, Gas Analyzer, 300mm:
Status: Bagged and Skidded
204292
GEMETEC  

GEMETEC  

WSPWS 2 M S 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F* Dresden, Saxony
GeMeTec, WSPS 2 M S, 200mm:

GeMeTec, WSPS 2 M S, 200mm

 

VPD Analysis Tool

202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   East Fishkill, New York
Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   East Fishkill, New York
Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

 

192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Malta, New York
Hitachi, S-5500- Schanning Electron Microscope, 300mm:
Hitachi, S-5500- Schanning Electron Microscope, 300mm


195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Singapore
Hitachi, S-9380, CD SEM, 300mm:
Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:
Hitachi, S-9380II, CD-SEM, 300mm

!!! Multiple Units Available!!!  Please Inquire
204498
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   N* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse

204499
Hitachi  

Hitachi  

S9380II  

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   F*N* Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

178288
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

1   Taichung, Taichung City
Hitachi, S-9380II, CD-SEM, 300mm:

Manufactured in 2007; Status: Bagged and Skidded

178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Taichung, Taichung City
Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
199446
HMI, EP3, 300mm, E-Beam Inspection System 
HMI, EP3, 300mm, E-Beam Inspection System 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
HMI, EP3, 300mm, E-Beam Inspection System:

HMI, EP3, 300mm, E-Beam Inspection System

204305
HMI, eP4 320, 300mm, ebeam Inspection 
HMI, eP4 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

1   Malta, New York
HMI, eP4 320, 300mm, ebeam Inspection:

HMI, eP4 320, 300mm, ebeam Inspection

 

In the Fab.  Cold Idle

199986
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

1   F* Malta, New York
HMI, eScan 320, 300mm, ebeam Inspection:
HMI, eScan 320, 300mm, ebeam Inspection
181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB Axiospect 300, 300mm Wafer inspection microscope:

HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182


!!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!

204267
HSEB  

HSEB  

NMT 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB NMT300, 300mm Wafer inspection microscope:

HSEB NMT300, 300mm Wafer inspection microscope

199709
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm:
HSEB, Axiospect 300, Optical Microscope, 300mm
199710
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Dresden, Saxony
HSEB, Axiospect 300, Optical Microscope, 300mm:

HSEB, Axiospect 300, Optical Microscope, 300mm
Cold Offline

!!! Multiple Units Available !!! Please inquire.

202816
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Malta, New York
HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

202817
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Malta, New York
HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
203119
JEOL  

JEOL  

ARM200CF Super X 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Malta, New York
JEOL, TEM, ARM200CF Super X, :

JEOL, TEM, ARM200CF Super X,

Atomic Resolution Electron Microscope

178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Singapore
KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Taichung, Taichung City
KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
204285
Lyncee  

Lyncee  

Holographic Microscope 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F* Malta, New York
LYNCEE TEC, Holographic Microscope, :

LYNCEE TEC, Holographic Microscope, 

 

In Lab

192694
MASS-PCB  

MASS-PCB  

SV200WV 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

1   F* Malta, New York
MASS-PCB, SV200WV, Abrasive Planarizations System:
MASS-PCB, SV200WV, Abrasive Planarizations System

The grinding machine SV 200 WV serves to remove the excess plugging paste from
printed circuit boards and inner layers following the Via Hole Plugging process. That
allows getting a flat uniform surface of the copper surface.
The grinding disk is driven by a servo motor, the x-y movement is manual by
hand.

The basic frame is made up of a stable welded stainless steel rack. The outer jacket
is made up of canted stainless sheet metal sheets. All the sheets allow be opening
with ease by entering catch locks and removing for allowing access.
The grinding head is covered with a hood with aluminium glass profiles. The plant is
built up and designed such that all components are clearly arranged.

Cooling water is transported via pump to the grinding head. On the bottom of the
machine you can find the belt filter equipment, where the cooling water is filtered.

The inner- or outer-layer of the printed circuit board is fixed on the aluminium working
plate by vacuum.
The working area is protected by safety glass. The specific linear guides and the
adjustable grinding pressure result in an excellent grinding performance and prevent
the copper foil from possibly being ground through. The grinding head can be
lowered to the printed circuit board with an exactness of 0,22 μm (0,0056 mil).
One turn (100 digits) eaquals 22μm (0,56 mil).

Technical data:
Plant length: 1400 mm
Plant width: 1100 mm
Plant height: 1700 mm
Working height: 980 mm
Weight 1000 Kg
Adjustment precision 0,22 μm
Vacuum working surface: 610 x 915 mm (24 x 36”)
Servo controlled turning of the grinding disks: 1000, 2000, 3000 rpm
Printed circuit board spectrum:
Gauge from / to: 0,3 – 15 mm
Maximum printed circuit board size: 610 x 915 mm (24 x 36”)
Electric connection:
Connected load: 5 kW
Working voltage: 3 x 400/480V, 3P, N, PE, 50/60 Hz

Compressed air connection: 6 bar
Filter unit: 60 l Water

179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, SN
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
tool for micro probing of transistors at contact level
3 Probe heads,
MP1-system with semiauto stage/optics
Comes with : 
electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads
Upgrades Include:
semiautomatic stage, optics & probe head control, 4th probe head




204579
OGP Messtechnik GmbH  

OGP Messtechnik GmbH  

Smart Scope CNC 500 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

1   N* Regensburg, Bavaria
OGP Smart Scope CNC500:

CNC Measurement Tool

200226
Park Systems Inc  

Park Systems Inc  

XE-300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   F* East Fishkill, New York
Park Systems, XE-300, Atomic Force Microscope, 300mm:
Park Systems, XE-300, Atomic Force Microscope, 300mm

Installed, Running

2009 Vintage
192498
Perkin Elmer  

Perkin Elmer  

AANALYST 600 

List all items of this typeSpectrometers - Other

in Spectrometers

1   F* Malta, New York
Perkin Elmer, AANALYST 600, Atomic Absorption Spectrometer:
Perkin Elmer, AANALYST 600, Atomic Absorption Spectrometer
203071
Perkin Elmer  

Perkin Elmer  

Elan 9000 DRC ICP/MS 

List all items of this typeSpectrometers - Other

in Spectrometers

1   Dresden, Saxony
Perkin Elmer, Elan 9000 DRC II, ICPMS :

Perkin Elmer, Elan 9000 DRC II, ICPMS 

 

In the lab.  Disconnected

202856
Perkin Elmer  

Perkin Elmer  

Elan DRC II  

List all items of this typeSpectrometers - Other

in Spectrometers

1   Singapore
Perkin Elmer, Elan DRC II, ICPMS :

Perkin Elmer, Elan DRC II, ICPMS

 

In RQA Lab

204275
SELA, MC 600i, Microcleaver,SEM Sample Prep 
SELA, MC 600i, Microcleaver,SEM Sample Prep 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
SELA, MC 600i, Microcleaver,SEM Sample Prep:

SELA, MC 600i, Microcleaver,SEM Sample Prep

 

In the lab

203810
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

 

 

203811
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

203812
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
SEMVision G3, Applied Materials, 300mm, Defect Review System:

SEMVision G3, Applied Materials, 300mm, Defect Review System

178737
Sopra  

Sopra  

EP12 

List all items of this typeFT-IR Spectrometers

in Spectrometers

1   F* East Fishkill, NY
Sopra EP12, 300mm, optical porosity measurement :
Dielectric Porosity measurment system.
203138
Suss Microtec ABC 200, 200mm, Automated Bonding Tool 
Suss Microtec ABC 200, 200mm, Automated Bonding Tool 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Suss Microtec ABC 200, 200mm, Automated Bonding Tool:

Microtec ABC 200, 200mm, Automated Bonding Tool

Installed.  Powered OFF.

 

182307
Suss Microtec  

Suss Microtec  

 

List all items of this typeOther Items

in Microscopes

1   F* Fishkill, New York
Suss Microtec BA300-MIT, 300mm Automated Inspection Tool:
Suss Microtec 300mm Automated Inspection Tool, BA300-MIT

Automated inspection tool inspects glass plates 13" x 14" molds do determine filling

Tool ID: MIT01
203130
Suss Microtec PA300-MIT, 300mm Automated Inspection Tool 
Suss Microtec PA300-MIT, 300mm Automated Inspection Tool 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Suss Microtec PA300-MIT, 300mm Automated Inspection Tool:

Suss Microtec PA300-MIT, 300mm Automated Inspection Tool

203137
Suss Microtec XBC 300, 300mm, Automated Bonding Tool 
Suss Microtec XBC 300, 300mm, Automated Bonding Tool 

List all items of this typeOther Items

in Microscopes

1   East Fishkill, New York
Suss Microtec XBC 300, 300mm, Automated Bonding Tool:

Suss Microtec XBC 300, 300mm, Automated Bonding Tool

Installed.  Powered off.  Cold.

203820
Ergolux  

Ergolux  

Talos FX200 G2 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
Thermo-Fisher, Talos FX200 G2, TEM, :

Thermo-Fisher, Talos FX200 G2, TEM, 

202877
VEECO (Bruker Nano), D3100, AFM 
VEECO (Bruker Nano), D3100, AFM 

List all items of this typeOther Items

in Microscopes

1   Singapore
VEECO (Bruker Nano), D3100, AFM:

VEECO (Bruker Nano), D3100, AFM

191172
VEECO (Bruker Nano), X-1D, AFM, 300mm 
VEECO (Bruker Nano), X-1D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
VEECO (Bruker Nano), X-1D, AFM, 300mm:
VEECO (Bruker Nano), X-1D, AFM, 300mm

Warm idle, installed.

S/N: 122
191173
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Warm Idle

S/N: 146
191174
VEECO (Bruker Nano), X-3D, AFM, 300mm 
VEECO (Bruker Nano), X-3D, AFM, 300mm 

List all items of this typeOther Items

in Microscopes

1   F* Dresden, Saxony
VEECO (Bruker Nano), X-3D, AFM, 300mm:
VEECO (Bruker Nano), X-3D, AFM, 300mm

Unhooked Park Position 

S/N: 123
186714
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeMicroscopes - Other

in Optical Microscopes

1   Singapore
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
202857
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore
Zeiss, Axiotron II, 200mm Inspection Microscope:

Zeiss, Axiotron II, 200mm Inspection Microscope

 

185245
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
185288
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope
191631
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   F* Burlington, Vermont
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741567
195518
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

1   Singapore
Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Bagged & Skidded in warehouse.

S/N : 741361
202838
Zeiss  

Zeiss  

LEA 1530 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   Singapore
Zeiss, LEO1530, SEM, :

Zeiss, LEO1530, SEM, 

 

LEA1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE

 

Unhooked, in QRA Lab.

 

 

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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Metrology Equipment:
Agilent, Applied Materials, Inc., E.A. Fischione Instr, Ergolux, FEI, GEMETEC, Hitachi, HSEB, JEOL, KLA-Tencor, Lyncee, MASS-PCB, OGP Messtechnik GmbH, Orbotech, Oxford Instruments, Park Systems Inc, Perkin Elmer, SELA, Sopra, Suss MicroTec, Zeiss