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Metrology Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
206534
ABB Engineering  

ABB Engineering  

IRB120 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

ABB, IRB120, Sample Polishing Robot. :

ABB, IRB120, Sample Polishing Robot. 

 

 

1   N* Singapore
204491
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

 

Bagged & Skidded in Warehouse

1   Singapore
204492
Agilent  

Agilent  

7500cs-C 

List all items of this typeSpectrometers - Other

in Spectrometers

Agilent, 7500cs-C, ICMPS, System:

Agilent, 7500cs-C, ICMPS, System

Bagged & Skidded in Warehouse

1   Singapore
204288
Agilent  

Agilent  

81110A 

List all items of this typeSpectrometers - Other

in Spectrometers

Agilent,81110A, Pulse Pattern Generator:

Agilent,81110A, Pulse Pattern Generator

1   Taichung, Taichung City
163973
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

AMAT COMPASS PRO 300mm:

Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL

1 77,801.11 F* Regensburg, Bavaria
163974
Applied Materials  

Applied Materials  

Compass Pro 300 

List all items of this typePatterned Wafer Inspection

in Surface Inspection

AMAT COMPASS PRO 300mm:

Darkfield Defect Inspection,
2x 300mm Load Ports Asyst SMIF-300FL

1 77,801.11 F* Regensburg, Bavaria
204578
Orbotech  

Orbotech  

Ultra Discovery VM 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

AOI Orbotech Ultra Discovery VM:

Simple, Intelligent, Powerful

Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production.

Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time.

Benefits

  • High throughput and superior detection with minimal number of false calls
  • Especially designed for inspection of the finest lines down to 10μm
  • Quick set-up even for the most complicated jobs for higher productivity
  • Automation ready
  • Very high uptime
  • SIP TechnologyTM

    Push-to-Scan®:

    • A ‘no set-up’ process
    • Top AOI results with minimal effort or training
    • The easiest, user-friendly interface (GUI)
    • Full ‘Step and Repeat’ functions

    Visual Intelligence:

    Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want.

    Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects.

    Visual Intelligence:

    • Full panel understanding, context-based detection engine
    • Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed

       

 

1   F* Regensburg, Bavaria
203103
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

1   East Fishkill, New York
203104
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

1   East Fishkill, New York
203105
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

 

1   East Fishkill, New York
203106
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

1   East Fishkill, New York
203107
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

1   East Fishkill, New York
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

1   F* East Fishkill, NY
180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

1   F* East Fishkill, NY
195983
Applied Materials  

Applied Materials  

Elite MS MC 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection:
Applied Materials, ELITE M5 MC, 300mm, e-Beam Inspection

iii Multiple Units Available.  Please inquire !!!
1   Dresden, Saxony
203074
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

1   Dresden, Saxony
203075
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 
Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection 

List all items of this typeOther Items

in Microscopes

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection:

Applied Materials, ELITE M5 MC, 300mm, eBeam Inspection

In fab.  Idle.

1   Dresden, Saxony
204039
Applied Materials  

Applied Materials  

SEMVision G3 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Applied Materials, SEMVision G3, DR-SEM, 300mm:

Applied Materials, SEMVision G3, DR-SEM, 300mm

missing some of the PC's in the electronic rack

Bagged & Skidded in Warehouse

2006 Vintage

1   Taichung, Taichung City
206308
Applied Materials  

Applied Materials  

Verity 4i 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials, Verity 4i, CD SEM, 300mm :

Applied Materials, Verity 4i, CD SEM,

Idle.  In Fab

 

1   N* Malta, New York
206309
Applied Materials  

Applied Materials  

Verity 4i 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Applied Materials, Verity 4i, CD SEM, 300mm:

Applied Materials, Verity 4i, CD SEM,

Idle.  In Fab

 

1   F*N* Malta, New York
204303
Bruker, AFM, 300mm, InSight,  
Bruker, AFM, 300mm, InSight,  

List all items of this typeOther Items

in Microscopes

Bruker, AFM, 300mm, InSight, :

Bruker, AFM, 300mm, InSight, 

 

In Fab.  Warm Idle

1   Malta, New York
204304
Bruker, D8 Discover, 300mm, X-Ray Metrology 
Bruker, D8 Discover, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8 Discover, 300mm, X-Ray Metrology:

Bruker, D8 Discover, 300mm, X-Ray Metrology

 

In Lab,  Cold idle

1   F* Dresden, Saxony
199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
insert for 200mm..
1   East Fishkill, New York
195987
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeOther Items

in Microscopes

Bruker, D8FABLINE, 300mm, X-Ray Metrology:
Bruker, D8FABLINE, 300mm, X-Ray Metrology


1   Singapore
206150
Cameca  

Cameca  

WF 

List all items of this typeMass Spectrometers

in Pharmaceutical Laboratory and Scientific Equipment

Cameca, WF, SIMS, :

Cameca, WF, SIMS, 

 

In Lab.  Cold Idle.

1   East Fishkill, New York
205918
Camtek  

Camtek  

X-ACT 

List all items of this typeMicroscopes - Other

in Optical Microscopes

CAMTEK X-ACT System with EM3:

CAMTEK X-ACT System with EM3

 

Idle.  Shut Down.

1   East Fishkill, New York
166465
Oxford Instruments  

Oxford Instruments  

CMI 950 

List all items of this typeXray Fluorescence Spectrometers

in Spectrometers

CMI 950 - Xray fluorescence spectrometer:
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.
Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).

System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
1   F* Regensburg, BY
203282
E.A. Fischione Instr  

E.A. Fischione Instr  

1030 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

E.A. Fischione Instruments Inc., 1030, NanoMill:

E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep.

Automated Sample Preparation System

 

 

1   East Fishkill, New York
203280
E.A. Fischione Instr  

E.A. Fischione Instr  

1060 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

E.A. Fischione Instruments Inc., 1060, NanoMill:

E.A. Fischione Instruments Inc., 1060, NanoMill

 

Ion MIll

1   East Fishkill, New York
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

1   Singapore
203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

1   Malta, New York
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

1   East Fishkill, New York
203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected, power off.

Minor repairs needed to start-up.

 

1   Malta, New York
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


1   Taichung, Taichung City
202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

1   Singapore
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1   East Fishkill, New York
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

1   East Fishkill, New York
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

FEI, EXPIDA, Dual Beam FIB, 300mm :

FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


remarketing@surplusglobal.com

1   F* Dresden, Saxony
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

remarketing@surplusglobal.com

1   Malta, New York
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

1   Singapore
202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

 

remarketing@surplusglobal.com

1   Singapore
203118
FEI  

FEI  

TEM LINK 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Link:

FEI, TEM Link

1   F* Malta, New York
203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

remarketing@surplusglobal.com

1   Malta, New York
203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

remarketing@surplusglobal.com

1   Malta, New York
205917
FEI  

FEI  

V600 

List all items of this typeMicroscopes - Other

in Optical Microscopes

FEI, V600, 4022 262 70111, Single Beam FIB, :

FEI, V600, 4022 262 70111, Single Beam FIB, 

 

In Lab.  Idle

1   East Fishkill, New York
178414
GEMETEC  

GEMETEC  

WSPS53 

List all items of this typeSpectrometers - Other

in Spectrometers

GEMETEC, Gas Analyzer, 300mm:
Status: Bagged and Skidded
1   F* Taichung, Taichung City
204292
GEMETEC  

GEMETEC  

WSPWS 2 M S 

List all items of this typeSpectrometers - Other

in Spectrometers

GeMeTec, WSPS 2 M S, 200mm:

GeMeTec, WSPS 2 M S, 200mm

 

VPD Analysis Tool

1   Dresden, Saxony
202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

1   East Fishkill, New York
178296
Hitachi  

Hitachi  

Microanalysis System 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, Metrology, Microanalysis System 300mm:
Status: Bagged and Skidded
1   F* Taichung, Taichung City
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




1   F* Singapore
205920
Hitachi  

Hitachi  

S-4800 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-4500, SEM, Failure Analysis SEM:

Hitachi, S-4500, SEM, Failure Analysis SEM

In Lab.  Cold idle.

1   East Fishkill, New York
205915
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-5200 SEM, :

Hitachi, S-5200 SEM, 

 

In the lab.  Idle.

1   East Fishkill, New York
205916
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-5200 SEM, :

Hitachi, S-5200 SEM, 

 

In the lab.  Idle.

1   East Fishkill, New York
203281
Hitachi  

Hitachi  

S-5200 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-5200, SEM, Ultra High Resolution:

Hitachi, S-5200, SEM, Ultra High Resolution

 

 

1   East Fishkill, New York
206535
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-5500- Scanning Electron Microscope, 300mm:

Hitachi, S-5500- Scanning Electron Microscope, 300mm

 

Unhooked.  In the lab.

1   N* Singapore
192497
Hitachi  

Hitachi  

S-5500 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, S-5500- Schanning Electron Microscope, 300mm:

Hitachi, S-5500- Schanning Electron Microscope, 300mm


remarketing@surplusglobal.com

1   F* Malta, New York
178287
Hitachi  

Hitachi  

S-7800 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-7800 CD-SEM, 200mm:

Manufactured in 2008

1   Singapore
195362
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380, CD SEM, 300mm:

Hitachi, S-9380, CD SEM, 300mm

Tool is Bagged & Skidded in Warehouse

S/N : 2146-01

remarketing@surplusglobal.com

1   F* Singapore
205450
Hitachi  

Hitachi  

S-9380 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380, CD SEM, 300mm:

Hitachi, S-9380, CD SEM, 300mm

Refurbished

S/N: 89638

sales@surplusglobal.com

 

1   F* Seoul
204498
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse

remarketing@surplusglobal.com

1   Taichung, Taichung City
204499
Hitachi  

Hitachi  

S9380II  

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

remarketing@surplusglobal.com

1   Taichung, Taichung City
205382
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

Bagged & Skidded in Warehouse

remarketing@surplusglobal.com

1   F* Taichung, Taichung City
205383
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

remarketing@surplusglobal.com

 

 

1   Singapore
205384
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

remarketing@surplusglobal.com

1   Singapore
205385
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse

remarketing@surplusglobal.com

1   Taichung, Taichung City
205386
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse.

remarketing@surplusglobal.com

1   Taichung, Taichung City
205387
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse

remarketing@surplusglobal.com

1   Taichung, Taichung City
205388
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

 

Bagged & Skidded in Warehouse

remarketing@surplusglobal.com

1   Taichung, Taichung City
197918
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

remarketing@surplusglobal.com

1   Taichung, Taichung City
201534
Hitachi  

Hitachi  

S-9380 II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Hitachi, S-9380II, CD-SEM, 300mm

S/N : 2160-02

Completely Refurbished

remarketing@surplusglobal.com

1   Taichung, Taichung City
178288
Hitachi  

Hitachi  

S-9380II 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes

Hitachi, S-9380II, CD-SEM, 300mm:

Manufactured in 2007; Status: Bagged and Skidded

 

remarketing@surplusglobal.com

1   Taichung, Taichung City
178299
Hitachi  

Hitachi  

Z-5700 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

Hitachi, Z-5700 Spectroscopy, 300mm:
Status: Bagged and Skidded
1   F* Taichung, Taichung City
199446
HMI, EP3, 300mm, E-Beam Inspection System 
HMI, EP3, 300mm, E-Beam Inspection System 

List all items of this typeOther Items

in Microscopes

HMI, EP3, 300mm, E-Beam Inspection System:

HMI, EP3, 300mm, E-Beam Inspection System

1   East Fishkill, New York
204305
HMI, eP4 320, 300mm, ebeam Inspection 
HMI, eP4 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

HMI, eP4 320, 300mm, ebeam Inspection:

HMI, eP4 320, 300mm, ebeam Inspection

 

In the Fab.  Cold Idle

1   Malta, New York
199986
HMI, eScan 320, 300mm, ebeam Inspection 
HMI, eScan 320, 300mm, ebeam Inspection 

List all items of this typeOther Items

in Microscopes

HMI, eScan 320, 300mm, ebeam Inspection:

HMI, eScan 320, 300mm, ebeam Inspection

 

remarketing@surplusglobal.com

1   F* Malta, New York
181188
HSEB  

HSEB  

Axiospect 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB Axiospect 300, 300mm Wafer inspection microscope:

HSEB Axiospect 300, 300mm Wafer inspection microscope
Stereo Microscope
Tool ID: OPI905
Serial Number: 41302020182


!!! MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE !!!

1   Dresden, Saxony
204267
HSEB  

HSEB  

NMT 300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB NMT300, 300mm Wafer inspection microscope:

HSEB NMT300, 300mm Wafer inspection microscope

1   Dresden, Saxony
199709
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB, Axiospect 300, Optical Microscope, 300mm:
HSEB, Axiospect 300, Optical Microscope, 300mm
1   F* Dresden, Saxony
199710
HSEB  

HSEB  

Axiospect300 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB, Axiospect 300, Optical Microscope, 300mm:

HSEB, Axiospect 300, Optical Microscope, 300mm
Cold Offline

!!! Multiple Units Available !!! Please inquire.

1   Dresden, Saxony
202816
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

1   Malta, New York
202817
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

1   Malta, New York
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, Defect Review, 200mm:
Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

1   Taichung, Taichung City
178302
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
1   Taichung, Taichung City
178303
JEOL  

JEOL  

JEM-2500SE 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JEM-2500SE Microscopes, 300mm:
Status: Bagged and Skidded
1   Taichung, Taichung City
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JWS 7555S, Defect Review, 200mm:
JEOL, JWS 7555S, Defect Review, 200mm
1   F* Singapore
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, JWS-7515, 200mm, SEM:
JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108
1   F* Singapore
203119
JEOL  

JEOL  

ARM200CF Super X 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

JEOL, TEM, ARM200CF Super X, :

JEOL, TEM, ARM200CF Super X,

Atomic Resolution Electron Microscope

remarketing@surplusglobal.com

1   Malta, New York
178326
KLA-Tencor  

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Optical Microscopes

KLA-Tencor, CRS1010 Defect Review, 200mm:
Manufactured in 1997; Status: Bagged and Skidded
1   F* Singapore
178304
KLA-Tencor  

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

1   F* Singapore
178305
KLA-Tencor  

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Inspection Equipment

KLA-Tencor, ES32, E-beam Inspection, 300mm:
Manufactured in 2007; Status: Bagged and Skidded


!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
1   Taichung, Taichung City
204285
Lyncee  

Lyncee  

Holographic Microscope 

List all items of this typeMicroscopes - Other

in Optical Microscopes

LYNCEE TEC, Holographic Microscope, :

LYNCEE TEC, Holographic Microscope, 

 

In Lab

1   F* Malta, New York
192694
MASS-PCB  

MASS-PCB  

SV200WV 

List all items of this typePolishing & Grinding Sample Prep Equipment

in Sample Preparation

MASS-PCB, SV200WV, Abrasive Planarizations System:
MASS-PCB, SV200WV, Abrasive Planarizations System

The grinding machine SV 200 WV serves to remove the excess plugging paste from
printed circuit boards and inner layers following the Via Hole Plugging process. That
allows getting a flat uniform surface of the copper surface.
The grinding disk is driven by a servo motor, the x-y movement is manual by
hand.

The basic frame is made up of a stable welded stainless steel rack. The outer jacket
is made up of canted stainless sheet metal sheets. All the sheets allow be opening
with ease by entering catch locks and removing for allowing access.
The grinding head is covered with a hood with aluminium glass profiles. The plant is
built up and designed such that all components are clearly arranged.

Cooling water is transported via pump to the grinding head. On the bottom of the
machine you can find the belt filter equipment, where the cooling water is filtered.

The inner- or outer-layer of the printed circuit board is fixed on the aluminium working
plate by vacuum.
The working area is protected by safety glass. The specific linear guides and the
adjustable grinding pressure result in an excellent grinding performance and prevent
the copper foil from possibly being ground through. The grinding head can be
lowered to the printed circuit board with an exactness of 0,22 μm (0,0056 mil).
One turn (100 digits) eaquals 22μm (0,56 mil).

Technical data:
Plant length: 1400 mm
Plant width: 1100 mm
Plant height: 1700 mm
Working height: 980 mm
Weight 1000 Kg
Adjustment precision 0,22 μm
Vacuum working surface: 610 x 915 mm (24 x 36”)
Servo controlled turning of the grinding disks: 1000, 2000, 3000 rpm
Printed circuit board spectrum:
Gauge from / to: 0,3 – 15 mm
Maximum printed circuit board size: 610 x 915 mm (24 x 36”)
Electric connection:
Connected load: 5 kW
Working voltage: 3 x 400/480V, 3P, N, PE, 50/60 Hz

Compressed air connection: 6 bar
Filter unit: 60 l Water

1   F* Malta, New York
205912
Matrix Corp  

Matrix Corp  

Matrix X3 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Matrix X3 X-Ray System:

high speed X-Ray system 

1   N* Regensburg, Bavaria
179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 

List all items of this typeOther Items

in Microscopes

MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
tool for micro probing of transistors at contact level
3 Probe heads,
MP1-system with semiauto stage/optics
Comes with : 
electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads
Upgrades Include:
semiautomatic stage, optics & probe head control, 4th probe head




1   F* Dresden, SN
204579
OGP Messtechnik GmbH  

OGP Messtechnik GmbH  

Smart Scope CNC 500 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

OGP Smart Scope CNC500:

CNC Measurement Tool

1   Regensburg, Bavaria
205919
Olympus  

Olympus  

PMG3 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Olympus Metallurgical Microscope, PMG3, :

Olympus Metallurgical Microscope, PMG3,

 

Idle.

1   East Fishkill, New York
200226
Park Systems Inc  

Park Systems Inc  

XE-300 

List all items of this typeMicroscopes - Other

in Optical Microscopes

Park Systems, XE-300, Atomic Force Microscope, 300mm:
Park Systems, XE-300, Atomic Force Microscope, 300mm

Installed, Running

2009 Vintage
1   F* East Fishkill, New York
192498
Perkin Elmer  

Perkin Elmer  

AANALYST 600 

List all items of this typeSpectrometers - Other

in Spectrometers

Perkin Elmer, AANALYST 600, Atomic Absorption Spectrometer:
Perkin Elmer, AANALYST 600, Atomic Absorption Spectrometer
1   F* Malta, New York
203071
Perkin Elmer  

Perkin Elmer  

Elan 9000 DRC ICP/MS 

List all items of this typeSpectrometers - Other

in Spectrometers

Perkin Elmer, Elan 9000 DRC II, ICPMS :

Perkin Elmer, Elan 9000 DRC II, ICPMS 

 

In the lab.  Disconnected

1   Dresden, Saxony
205776
KLA  

KLA  

INS 3000 

List all items of this typeMetrology Equipment - Other

in Metrology Equipment

Review Leica Microscope :

Equipment with automated Wafer Handler, KLAF File License

2 Tools

- Manufacturing year 1999: OEM Serialnumber: 1216

- Manufacturing year 2002: OEM Serialnumber: 2225

2   N* Regensburg, Bavaria
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Metrology Equipment:
ABB Engineering, Agilent, Applied Materials, Inc., Cameca, Camtek, E.A. Fischione Instr, FEI, GEMETEC, Hitachi, HSEB, JEOL, KLA, KLA-Tencor, Lyncee, MASS-PCB, Matrix Corp, OGP Messtechnik GmbH, Olympus, Orbotech, Oxford Instruments, Park Systems Inc, Perkin Elmer, Sigatta, Sopra, Suss MicroTec, Zeiss