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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   251076 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes 1   Singapore 254250 AMAT   AMAT   UVision 6  Wafer Inspection Microscopes in Optical Microscopes 1   Malta, New York 252611 Applied Materials   Applied Materials   Verity1 SEM  Scanning Electron Microscopes in Inspection Equipment AMAT Verity1 SEM, 300mm, s/n: U-757: Applied VeritySEM 1   Singapore 248208 Applied Materials   Applied Materials   G3 Lite  Scanning Electron Microscopes in Inspection Equipment AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041 1   Singapore 251081 HMI   HMI   ESCAN380  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 253752 HSEB   HSEB   MMT 300  Wafer Inspection Microscopes in Optical Microscopes 1   Dresden, Saxony 253234 HSEB   HSEB   MMT300 V2  Wafer Inspection Microscopes in Optical Microscopes 1   Dresden, Saxony 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1   Malta, New York 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Optical Microscopes HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1   Malta, New York 251079 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251077 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 255041 KLA Tencor   KLA Tencor   2367  Automatic Wafer Inspection Tools in Microscope Inspection Tools KLA 2367 "Escape" Bright Field Inspection Tool: BrightField Inspektionstool 25 cassette HW 200mm GEM/SECS and HSMS Model Enable .12 , .62, .39 Picels ORS Upgrade done    Tool currently full installed at cleanroom (estimated time depending on areaneed) 1   Regensburg, Bavaria 254255 KLA-Tencor   KLA-Tencor   2835  Wafer Inspection Microscopes in Optical Microscopes KLA 2835, 300mm, s/n: 1340334: Brightfield Inspection 1   Malta, New York 251078 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251080 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 251617 KLA-Tencor   KLA-Tencor   AITXUV  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 257174 KLA-Tencor   KLA-Tencor   RS100C  Wafer Inspection Microscopes in Optical Microscopes 1   N* Singapore 255109 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 252339 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 252340 KLA-Tencor   KLA-Tencor   SPECTRACD-XT  Wafer Inspection Microscopes in Optical Microscopes 1   Singapore 255557 KLA Tencor   KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   Regensburg, Bavaria 255558 KLA Tencor   KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   Regensburg, Bavaria 255559 KLA Tencor   KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   Regensburg, Bavaria 253040 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9145: KLA-Tencor AIT II w/ ADC. Defect Inspection 1   Burlington, Vermont 253033 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor AIT II, 200mm, s/n: 9234: AIT II w/ ADC. Defect Inspection Tool 1   Burlington, Vermont 254149 KLA-Tencor   KLA-Tencor   OP3260I  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor OP3260I, 200mm, s/n: 6678: Film thickness measurement 1   Singapore 254147 KLA-Tencor   KLA-Tencor   UV1280SE  Wafer Inspection Microscopes in Optical Microscopes KLA Tencor UV1280SE, 200mm, s/n: 991098: Film thickness measurement tool 1   Singapore 253038 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9152: AIT II w/ ADC. Defect Inspection 1   Burlington, Vermont 253037 KLA-Tencor   KLA-Tencor   AIT II  Wafer Inspection Microscopes in Optical Microscopes KLA-Tencor AIT II, 200mm, s/n: 9262: AIT II w/ ADC. Defect Inspection Tool 1   Burlington, Vermont 253039 KLA-Tencor   KLA-Tencor   AIT  Wafer Inspection Microscopes in Optical Microscopes 1   Burlington, Vermont 254084 KLA-Tencor   KLA-Tencor   EDR 5200  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254087 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254086 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 254085 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Inspection Equipment 1   Singapore 256664 Olympus   Olympus     Wafer Inspection Microscopes in Optical Microscopes Low power optical scope: Location is at Infineon Penang. 2   N* George Town, Penang 241510 NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  Other Items in Microscopes NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 1   Malta, New York 254369 Park System NX-Hivac, 300mm, s/n: 40788  Park System NX-Hivac, 300mm, s/n: 40788  Other Items in Microscopes 1   Santa Clara, California 253031 Rudolph Technologies   Rudolph Technologies   S3000-S  Wafer Inspection Microscopes in Optical Microscopes 1   Malta, New York 256550 Trinocular Stereo Zoom Microscope  Trinocular Stereo Zoom Microscope  Microscopes - Other in Optical Microscopes Trinocular Stereo Zoom Microscope: Penang Trinocular Stereo Zoom Microscope Brand : Radiant Instruments Asset Number:   ZNPG-102904-0 1   N* George Town, Penang

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Inspection Tools: AMAT, Applied Materials, Inc., HMI, HSEB, KLA Tencor, KLA-Tencor, Olympus, Rudolph Technologies, Inc.