Profilometer

Profilometer

Atomic Force Microscope (AFM)An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.

MES Veeco AP150 8"

Missing parts: Robot, PreAligner, Robotcontroller; no consumables availableProcessINSPECTIONProcedure

STEPHEIGHT

MET Veeco AFM Vx210 8"

Diffusion Pump

Water and Liquid N2 Trap ASA 150