Specialized Measurement Equipment

Specialized measurement equipment is essential for ensuring accuracy in complex measurement tasks across various industries. It supports precision and reliability in testing and inspection processes.

  1. DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Other Metrology Equipment

    DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Atomic Force Microscope AFMScanning Probe Microscope SPM

    Stage size: 300mm

    Accessories:

    • Stage Controller: NanoScope Model 5000C-1
    • Scanning Probe Microscope Controller: NanoScope IIIA
    • Vibration Isolation Table and Acoustic Enclosure

    Make: Digital Instruments

    Model: Nanoscope IIIA

    1 unit @ Best Price

    Scotia, NY US

    Item 106265

  2. SDI METRON / Semilab SDI-FAAST_230

    Other Metrology Equipment

    SDI METRON / Semilab SDI-FAAST_230

    Configuration: Mainframe

    Rack of Powersupply is defective – Powersupply is ok

    Function is ok – not in production but regular check

    Tool on cleanroom floor

    1 Palette of spares included:

    2x Motion Controller (Newport Modell MM3000)

    1x DSP Lock-IN Amplifier

    1x Roboter Controller (Pri ESC-212)

    1x Hot Chuck Temperatur Box (SDI)

    1x Controller Fe Activation Box (SDI)

    1x Roboter (Pri ATM-105-1-S)

    1x Voltmeter (PDM-40a)

    1x Voltmeter (PDM-60V)

    1x Function Generator (Wafetek model 29)

    1x Aligner (Brooks PRE-200)

    2x Power Supply (Bertan 2341-1)

    1x Box mit Anleitungen, div. Kleinteilen, Kabel

  3. Nanometrics ECV Pro UV Electrochemical CV Profiler

    Other Metrology Equipment

    Nanometrics ECV Pro UV Electrochemical CV Profiler

    Nanometrics ECVPro Carrier Concentration Profiler

    • For Si, SiC, II-VI, III-V & III-Nitrides 
    • Hamamatsu LC8 UV Light Source
    • ECVision In-Situ Camera System
    • Dual Frequency Measurement
    • Carrier Frequency: 0.3kHz to 50kHz
    • Depth Range: 0.05μm to 50μm
    • Depth Resolution: 1nm 
    • Dell PC, Windows 8 OS, ECV Pro SW Version 2.4.6.0

           Installation & Training Available

  6. KLA-Tencor DSW16E 300mm Calibration Wafer

    Other Metrology Equipment

    KLA-Tencor DSW16E 300mm Calibration Wafer

    KLA-Tencor DSW16E 300mm Calibration Wafer

    • Part Number 0210691-000 (Advanced Technology Development)
    • For Use on e-Beam Patterned Wafer Defect Inspection Tools  

Common Applications

aerospace component inspection

automotive parts quality assurance

precision engineering

machining process verification

research and development

tool calibration

Buying Guide

Specialized Measurement Equipment Buying Considerations

  • Consider the measurement range and precision requirements of your application.
  • Evaluate compatibility with existing systems and software for data integration.
  • Review the calibration and maintenance support available for each model.
  • Assess the portability and environmental tolerance needed for field versus lab settings.
  • Compare features and capabilities to ensure alignment with specific testing protocols and standards.

Frequently Asked Questions

What is specialized measurement equipment used for?
It is used for precise measurement tasks in various fields requiring high accuracy and reliability.
What types of industries use specialized measurement equipment?
Industries such as aerospace, automotive, and manufacturing utilize these tools for quality control and inspection.
How does specialized measurement equipment improve process accuracy?
It ensures that measurements are exact and consistent, reducing errors and improving product quality.
Can specialized measurement equipment be found in corporate surplus?
Yes, these tools are often available through surplus channels, offering cost-effective solutions for high-end equipment needs.