Ellipsometers
GAERTNER ELLIPSOMETER
Ellipsometer
Upgraded in 2004 by Gaertner
Ellipsometers
Ellipsometers are used to measure the thickness and refractive index of transparent thin films. They enhance performance by providing precise optical characterization in research and industrial applications.
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Ellipsometers
RUDOLPH RESEARCH ELLIPSOMETER 150MM
Ellipsometer
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Ellipsometers
RUDOLPH RESEARCH ELLIPSOMETER 150MM
Ellipsometer
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Ellipsometers
J.A. Woollam M-2000 Spectroscopic Ellipsometer
J.A. Woollam M-2000 Spectroscopic Ellipsometer
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Ellipsometers
J.A. Woollam VB-200 Spectroscopic Ellipsometer
J.A. Woollam VB-200 Spectroscopic Ellipsometer
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Ellipsometers
Plasmos SD-2004 Multi-Wavelength Ellipsometer
Plasmos SD-2004 Multi-Wavelength Ellipsometer -
Ellipsometers
KLA-TENCOR Spectra fx SWE Kit
KLA-TENCOR Spectra fx Single Wave Ellipsometer Kit
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Ellipsometers
Nanometrics 8300XSE Film Thickness Analyzer
Nanometrics 8300XSE Film Thickness Analyzer
- J.A. Woollam M-44 Spectroscopic Ellipsometer
- J.A. Woollam EC-270 Ellipsometer Controller
- J.A. Woollam LPS-420 Xenon Light Source
- Manual Loading of up to 300mm Wafers
- Yaskawa ERCR-NS01-B004 Motion Controller
- Please Inquire for Additional Details
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Ellipsometers
Plasmos SD2000 Automatic Ellipsometer
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Ellipsometers
Sagax Isoscope 125
Ellipsometer
Common Applications
semiconductor fabrication
nanotechnology research
optical coatings
biofilm analysis
chemical industry
material science
Frequently Asked Questions
What is an ellipsometer used for?
An ellipsometer is used for measuring the thickness and refractive index of thin films.
How does ellipsometry work?
Ellipsometry works by analyzing the change in polarization as light reflects from a film surface.
What industries use ellipsometers?
Industries such as semiconductor manufacturing, optics, and materials science use ellipsometers.
Can ellipsometers measure multi-layer films?
Yes, ellipsometers can analyze multiple film layers by interpreting polarization changes at each interface.